Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2815 2897
This examiner grants 81% of resolved cases
Mohammed Shamsuzzaman has resolved 924 cases in Art Unit 2815. The examiner maintains an allowance rate of 81.1 percent. This figure provides a baseline for applicants to understand the probability of a grant in Tech Center 2800. The data shows an interview lift of 54.9 percent. This lift represents the difference in allowance rates between cases with and without interviews. Practitioners should consider this 54.9 percent lift when deciding whether to engage in direct communication.
The median days to allowance for this examiner is 899. This duration represents the timeline for reaching a final resolution for the 924 resolved cases. Applicants in Art Unit 2815 can use this 899-day metric to plan their prosecution schedules. The 81.1 percent allowance rate indicates the frequency of grants for this profile. With an interview lift of 54.9 percent, the role of the interview is a documented factor in the examiner's history. These metrics provide a view of the prosecution environment for this profile in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18782661 | SEMICONDUCTOR DEVICE INCLUDING GATE-CUT STRUCTURE FORMED AT EARLY STEP OF MANUFACTURING PROCESS | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18679714 | SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18640576 | SEMICONDUCTOR PACKAGE COMPRISING DAM AND MULTI-LAYERED UNDER-FILL LAYER | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18544560 | INTEGRATED CIRCUIT DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18307082 | SEMICONDUCTOR DEVICE WITH RIGID-FLEX SUB-ASSEMBLY AND METHOD THEREFOR | Final Rejection | NXP USA, INC. |
| 18659933 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., LTD. |
| 18658369 | METHOD FOR TRANSFERRING LIGHT-EMITTING ELEMENT AND METHOD FOR MANUFACTURING LIGHT-EMITTING DEVICE | Non-Final OA | NICHIA CORPORATION |
| 18181598 | FABRICATION OF NANORIBBON-BASED TRANSISTORS USING PATTERNED FOUNDATION | Non-Final OA | Intel Corporation |
| 18580029 | DISPLAY DEVICE, DISPLAY MODULE, ELECTRONIC DEVICE, AND METHOD FOR MANUFACTURING DISPLAY DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18127020 | STAGE APPARATUS, CHARGED PARTICLE BEAM APPARATUS, AND OPTICAL INSPECTION APPARATUS | Final Rejection | Hitachi High-Tech Corporation |
| 18026217 | DIAGNOSTIC DEVICE, SEMICONDUCTOR MANUFACTURING EQUIPMENT SYSTEM, SEMICONDUCTOR EQUIPMENT MANUFACTURING SYSTEM, AND DIAGNOSTIC METHOD | Final Rejection | Hitachi High-Tech Corporation |
| 18478226 | SEMICONDUCTOR PACKAGE WITH AN INSULATION LAYER | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18624320 | HEAT SINK FASTENED ON THE SUBSTRATE OF A PACKAGE OF INTEGRATED CIRCUITS | Final Rejection | STMicroelectronics International N.V. |
| 18409915 | METHODS FOR SELECTIVE METAL CAP FORMATION | Non-Final OA | Taiwan Semiconductor Manufacturing Company, LTD. |
| 17879529 | SPACER STRUCTURES IN SEMICONDUCTOR DEVICES | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18616773 | SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE | Non-Final OA | ROHM CO., LTD. |
| 18630689 | HIGH REFRACTIVE INDEX STRUCTURED COATING FOR EFFICIENT LIGHT EXTRACTION FROM LEDS AND PCLEDS | Non-Final OA | Lumileds LLC |
| 18697972 | WAVELENGTH CONVERSION SHEET-USE FILM, WAVELENGTH CONVERSION SHEET, BACKLIGHT, AND DISPLAY DEVICE | Non-Final OA | DAI NIPPON PRINTING CO., LTD. |
| 18415288 | ONE-TIME PROGRAMMABLE BITCELL WITH A FUSE FIELD-EFFECT TRANSISTOR | Final Rejection | Synopsys, Inc. |
| 18543468 | LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | TIANJIN SANAN OPTOELECTRONICS CO., LTD. |
| 18634972 | CAPACITOR AND ELECTRONIC DEVICE | Non-Final OA | Industrial Technology Research Institute |
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