22 pending office actions • 1 client • 20 examiners • 11 art units • 0 of 22 (0%) have an AI response strategy ready • 20 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 11 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 11 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §103 only | 13 (59%) |
| §102 only | 6 (27%) |
| No statute on record | 3 (14%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| TAT, BINH C | 2 | 87.3% | +14.2% |
| ALAWDI, ANWER AHMED | 2 | 80.0% | +25.0% |
| ASFAW, MESFIN T | 1 | 82.8% | +14.1% |
| CODRINGTON, SHANE WRENSFORD | 1 | 100.0% | +0.0% |
| HARTMAN JR, RONALD D | 1 | 89.7% | +4.5% |
| PERSAUD, DEORAM | 1 | 76.8% | +11.8% |
| WASAFF, JOHN S. | 1 | 33.4% | +44.4% |
| WALKE, AMANDA C | 1 | 88.5% | +8.6% |
| HARPER, ELIYAH STONE | 1 | 73.4% | +11.4% |
| SALEH, ZAID MUHAMMAD | 1 | 66.7% | +47.2% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 6 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 17924626 | SYSTEMS, PRODUCTS, AND METHODS FOR GENERATING PATTERNING DEVICES AND PATTERNS THEREFOR | ALAWDI, ANWER AHMED | 53d overdue |
| 17780287 | METHOD AND SYSTEM FOR ENHANCING TARGET FEATURES OF A PATTERN IMAGED ONTO A SUBSTRATE | ALAWDI, ANWER AHMED | 3d overdue |
| 19008794 | APPARATUS AND METHOD FOR PROCESS-WINDOW CHARACTERIZATION | ASFAW, MESFIN T | — |
| 18857065 | SYSTEMS, METHODS, AND SOFTWARE FOR MULTILAYER METROLOGY | CODRINGTON, SHANE WRENSFORD | — |
| 18578299 | METHOD FOR GENERATING MASK PATTERN | WALKE, AMANDA C | — |
| 18091716 | METHOD FOR DETERMINING AN ETCH PROFILE OF A LAYER OF A WAFER FOR A SIMULATION SYSTEM | TAT, BINH C | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 17924626 | SYSTEMS, PRODUCTS, AND METHODS FOR GENERATING PATTERNING DEVICES AND PATTERNS THEREFOR | ALAWDI, ANWER AHMED | 53d overdue |
| 18712671 | SURROUNDING PATTERN AND PROCESS AWARE METROLOGY | PERSAUD, DEORAM | 38d overdue |
| 17780287 | METHOD AND SYSTEM FOR ENHANCING TARGET FEATURES OF A PATTERN IMAGED ONTO A SUBSTRATE | ALAWDI, ANWER AHMED | 3d overdue |
| 18276018 | A MACHINE LEARNING MODEL USING TARGET PATTERN AND REFERENCE LAYER PATTERN TO DETERMINE OPTICAL PROXIMITY CORRECTION FOR MASK | SALEH, ZAID MUHAMMAD | 14d |
| 19008794 | APPARATUS AND METHOD FOR PROCESS-WINDOW CHARACTERIZATION | ASFAW, MESFIN T | — |
| 18684558 | METHOD FOR CONVERTING METROLOGY DATA | WASAFF, JOHN S. | — |
| 18565759 | METHOD FOR GENERATING ASSIST FEATURES USING MACHINE LEARNING MODEL | HARPER, ELIYAH STONE | — |
| 18278881 | METHOD OF PATTERN SELECTION FOR A SEMICONDUCTOR MANUFACTURING RELATED PROCESS | TAT, BINH C | — |
| Client (Assignee) | Pending OAs |
|---|---|
| ASML | 22 |
| Art Unit | Apps |
|---|---|
| 2851 | 4 |
| 2882 | 2 |
| 2668 | 1 |
| 2674 | 1 |
| 2665 | 1 |
| 2116 | 1 |
| 2128 | 1 |
| 2188 | 1 |
| 2681 | 1 |
| 2683 | 1 |
| App # | Title | Client | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|---|
| 19008794 | APPARATUS AND METHOD FOR PROCESS-WINDOW CHARACTERIZATION | ASML Netherlands B.V. | ASFAW, MESFIN T | §102 | Non-Final OA | — | Pending | Jan 03, 2025 | |
| 18857065 | SYSTEMS, METHODS, AND SOFTWARE FOR MULTILAYER METROLOGY | ASML Netherlands B.V. | CODRINGTON, SHANE WRENSFORD | §103 | Non-Final OA | — | Pending | Oct 15, 2024 | |
| 18713127 | THERMAL CONTROL SYSTEMS, MODELS, AND MANUFACTURING PROCESSES IN LITHOGRAPHY | ASML Netherlands B.V. | HARTMAN JR, RONALD D | — | Non-Final OA | — | Pending | May 23, 2024 | |
| 18712671 | SURROUNDING PATTERN AND PROCESS AWARE METROLOGY | ASML Netherlands B.V. | PERSAUD, DEORAM | 2882 | §102 | Non-Final OA | 38d overdue | Pending | May 22, 2024 |
| 18684558 | METHOD FOR CONVERTING METROLOGY DATA | ASML Netherlands B.V. | WASAFF, JOHN S. | §103 | Non-Final OA | — | Pending | Feb 16, 2024 | |
| 18578299 | METHOD FOR GENERATING MASK PATTERN | ASML Netherlands B.V. | WALKE, AMANDA C | §103 | Non-Final OA | — | Pending | Jan 10, 2024 | |
| 18565759 | METHOD FOR GENERATING ASSIST FEATURES USING MACHINE LEARNING MODEL | ASML Netherlands B.V. | HARPER, ELIYAH STONE | — | Non-Final OA | — | Pending | Nov 30, 2023 | |
| 18278881 | METHOD OF PATTERN SELECTION FOR A SEMICONDUCTOR MANUFACTURING RELATED PROCESS | ASML Netherlands B.V. | TAT, BINH C | — | Non-Final OA | — | Pending | Aug 25, 2023 | |
| 18276018 | A MACHINE LEARNING MODEL USING TARGET PATTERN AND REFERENCE LAYER PATTERN TO DETERMINE OPTICAL PROXIMITY CORRECTION FOR MASK | ASML Netherlands B.V. | SALEH, ZAID MUHAMMAD | 2668 | §102 | Non-Final OA | 14d | Pending | Aug 04, 2023 |
| 18265431 | FEATURE EXTRACTION METHOD FOR EXTRACTING FEATURE VECTORS FOR IDENTIFYING PATTERN OBJECTS | ASML Netherlands B.V. | LIEW, ALEX KOK SOON | 2674 | §103 | Non-Final OA | 93d overdue | Pending | Jun 05, 2023 |
| 18031865 | METHOD FOR GENERATING MASK PATTERN | ASML Netherlands B.V. | LEE, ERIC D | 2851 | §102 | Non-Final OA | 36d overdue | Pending | Apr 13, 2023 |
| 18015313 | APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAINING MACHINE LEARNING MODELS | ASML Netherlands B.V. | LU, ZHIYU | 2665 | §103 | Final Rejection | 84d | Pending | Jan 09, 2023 |
| 18091716 | METHOD FOR DETERMINING AN ETCH PROFILE OF A LAYER OF A WAFER FOR A SIMULATION SYSTEM | ASML Netherlands B.V. | TAT, BINH C | 2851 | §102 | Non-Final OA | — | Pending | Dec 30, 2022 |
| 17924626 | SYSTEMS, PRODUCTS, AND METHODS FOR GENERATING PATTERNING DEVICES AND PATTERNS THEREFOR | ASML Netherlands B.V. | ALAWDI, ANWER AHMED | 2851 | §103 | Final Rejection | 53d overdue | Pending | Nov 10, 2022 |
| 17896892 | MATCHING PUPIL DETERMINATION | ASML Netherlands B.V. | RIDDLE, CHRISTINA A | 2882 | §103 | Non-Final OA | — | Pending | Aug 26, 2022 |
| 17780287 | METHOD AND SYSTEM FOR ENHANCING TARGET FEATURES OF A PATTERN IMAGED ONTO A SUBSTRATE | ASML Netherlands B.V. | ALAWDI, ANWER AHMED | 2851 | §103 | Final Rejection | 3d overdue | Pending | May 26, 2022 |
| 17763698 | PROCESS MONITORING AND TUNING USING PREDICTION MODELS | ASML Netherlands B.V. | PAN, YUHUI R | 2116 | §103 | Final Rejection | 15d overdue | Pending | Mar 25, 2022 |
| 17638472 | SEMICONDUCTOR DEVICE GEOMETRY METHOD AND SYSTEM | ASML Netherlands B.V. | COLE, BRANDON S | 2128 | §103 | Non-Final OA | 30d overdue | Pending | Feb 25, 2022 |
| 17632632 | METHOD AND APPARATUS FOR PHOTOLITHOGRAPHIC IMAGING | ASML Netherlands B.V. | WHITE, JAY MICHAEL | 2188 | §102 | Final Rejection | 86d overdue | Pending | Feb 03, 2022 |
| 17631557 | METHOD FOR TRAINING MACHINE LEARNING MODEL FOR IMPROVING PATTERNING PROCESS | ASML Netherlands B.V. | CRUZ, IRIANA | 2681 | §103 | Final Rejection | — | Pending | Jan 31, 2022 |
| 17471363 | MACHINE-LEARNING BASED DEFECT IDENTIFICATION | ASML Netherlands B.V. | DULANEY, BENJAMIN O | 2683 | §103 | Non-Final OA | 70d | Pending | Sep 10, 2021 |
| 17431226 | GAUGE SELECTION FOR MODEL CALIBRATION | ASML Netherlands B.V. | MIRABITO, MICHAEL PAUL | 2187 | §103 | Final Rejection | — | Pending | Aug 16, 2021 |
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