Prosecution Insights
Last updated: October 01, 2026

Examiner: ARROYO, TERESA M

Tech Center 2800 • Art Units: 2826 2829 2893 2899

This examiner grants 72% of resolved cases

Analysis

Teresa M. Arroyo is an examiner in Tech Center 2800 and Art Unit 2826, with 501 resolved cases. She maintains an allowance rate of 72.1 percent. This 72.1 percent rate indicates a generally positive outlook for applicants in this technology area. With 501 resolved cases, the data provides a stable and reliable expectation for practitioners navigating the prosecution process.

The interview lift is 22.9 percent, suggesting that interviews are an effective tool for securing an allowance. This 22.9 percent lift highlights the value of direct communication in resolving outstanding issues. The median days to allowance is 1113, which is a standard timeframe for this volume of cases. Practitioners should use this 1113-day median to manage client expectations regarding the total duration of prosecution. The combination of a high allowance rate and a significant interview lift makes Art Unit 2826 a relatively favorable environment for patent acquisition.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

71.9%
Allow Rate
+3.9% vs TC avg
551
Total Applications
+23.2%
Interview Lift
1114
Avg Prosecution Days
Based on 502 resolved cases, 2023–2026

Rejection Statute Breakdown

0.2%
§101 Eligibility
18.4%
§102 Novelty
57.7%
§103 Obviousness
19.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18755040 IMAGE SENSOR Non-Final OA Samsung Electronics Co., Ltd.
18419907 SEMICONDUCTOR DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18196276 SEMICONDUCTOR PACKAGE AND IMAGE SENSOR PACKAGE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18417997 CIRCUIT BOARD AND DISPLAY DEVICE INCLUDING SAME Non-Final OA Samsung Display Co., Ltd.
18487734 WINDOW AND DISPLAY DEVICE INCLUDING THE SAME Final Rejection SAMSUNG DISPLAY CO., LTD.
17296234 DISPLAY PANEL AND MANUFACTURING METHOD THEREOF Non-Final OA WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
18316379 RADIATION DETECTION ELEMENT, RADIATION DETECTION APPARATUS, X-RAY CT APPARATUS, AND MANUFACTURING METHOD OF RADIATION DETECTION ELEMENT Non-Final OA CANON KABUSHIKI KAISHA
18130582 AIR-GAP TRACES AND AIR-GAP EMBEDDED BRIDGE INTEGRATED IN GLASS INTERPOSER Non-Final OA Intel Corporation
18617086 INTERPOSER FOR BACKSIDE POWER DELIVERY NETWORK Non-Final OA Adeia Semiconductor Bonding Technologies, Inc.
18359096 SEMICONDUCTOR DEVICE, POWER CONVERSION DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Final Rejection Mitsubishi Electric Corporation
18262932 SEMICONDUCTOR DEVICE AND IMAGING DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18696886 DISPLAY DEVICE Non-Final OA Sharp Display Technology Corporation
17902275 BACKSIDE POWER DELIVER NETWORK CONNECTION THROUGH DUMMY GATES Non-Final OA INTERNATIONAL BUSINESS MACHINES CORPORATION
18176445 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD Non-Final OA Kioxia Corporation
18910671 ELECTRONIC DEVICE WITH GALLIUM NITRIDE TRANSISTORS AND METHOD OF MAKING SAME Non-Final OA Texas Instruments Incorporated
18314585 ELECTRONIC DEVICE WITH IMPROVED LEADFRAME TRIMMING PROCESS Final Rejection TEXAS INSTRUMENTS INCORPORATED
18070523 OPEN CAVITY INTEGRATED CIRCUIT Final Rejection TEXAS INSTRUMENTS INCORPORATED
17988115 INTEGRATED CIRCUIT PACKAGE WITH WIRE BOND Final Rejection TEXAS INSTRUMENTS INCORPORATED
18050458 INSULATION FOR MAGNETIC-MOLDING COMPOUND (MMC) MODULE Final Rejection TEXAS INSTRUMENTS INCORPORATED
17508009 IC PACKAGE WITH INTERFACE REGION Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18420538 STAIRCASE LANDING PADS VIA RIVETS Non-Final OA Micron Technology, Inc.
17738521 FINFET ISOLATION DEVICE AND METHOD Non-Final OA Micron Technology, Inc.
18421312 SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18440331 SEMICONDUCTOR DEVICE AND METHOD OF MAKING Non-Final OA Taiwan Semiconductor Manufacturing Company Limited
18034591 OPTICAL SENSOR USING FERROELECTRICS AND METHOD FOR MANUFACTURING THE SAME Non-Final OA KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
18254310 SEMICONDUCTOR DEVICE Final Rejection ROHM CO., LTD.
18317632 SEMICONDUCTOR DEVICE Final Rejection ROHM CO., LTD.
17680409 Method for Fabricating a Substrate with a Solder Stop Structure, Substrate with a Solder Stop Structure and Electronic Device Non-Final OA Infineon Technologies AG
18132351 ELECTRONIC DEVICE Final Rejection Advanced Semiconductor Engineering, Inc.
18283713 POWER MODULE AND METHOD FOR PRODUCING SAME Non-Final OA AMOSENSE CO., LTD.

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