Tech Center 2800 • Art Units: 2817
This examiner grants 65% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18528621 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18125870 | SEMICONDUCTOR DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 17274324 | Display Panel and Manufacture Method Thereof, and Display Apparatus | Final Rejection | BOE Technology Group Co., Ltd. |
| 17887595 | MOVING BLADE CAVITY TECHNOLOGY FOR HIGH DENSE UNITS PER STRIP DESIGN | Final Rejection | Texas Instruments Incorporated |
| 18166361 | SEMICONDUCTOR MODULE WITH INTEGRATED CURRENT SENSOR | Non-Final OA | AUDI AG |
| 17741575 | FILM, ELEMENT, AND EQUIPMENT | Final Rejection | CANON KABUSHIKI KAISHA |
| 18530849 | MICRO-LED DBR FABRICATION BY ELECTROCHEMICAL ETCHING | Non-Final OA | Snap Inc. |
| 18468279 | DIELECTRIC AND TWO-DIMENSIONAL SEMICONDUCTOR MATERIAL NANOSHEET DEVICES | Non-Final OA | International Business Machines Corporation |
| 18364734 | DEEP TRENCH ISOLATION STRUCTURE IN A PIXEL SENSOR | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17874048 | CHIP STRUCTURE WITH CONDUCTIVE VIA STRUCTURE | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17561686 | GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING SOURCE OR DRAIN STRUCTURES WITH SUBSTRATE CONNECTION PORTIONS | Non-Final OA | Intel Corporation |
| 17805034 | Metal Pillars Preventing Wetting on Sidewalls and Method Forming Same | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17417715 | SEMICONDUCTOR STRUCTURE FOR DIGITAL AND RADIOFREQUENCY APPLICATIONS | Non-Final OA | Soitec |
| 17651651 | STRUCTURES WITH DEFORMABLE CONDUCTORS | Non-Final OA | Liquid Wire Inc. |
| 18520980 | METHOD OF PASSIVATING CLEAVED SEMICONDUCTOR STRUCTURE | Non-Final OA | Comptek Solutions Oy |
| 18260859 | THREE-DIMENSIONAL FLASH MEMORY INCLUDING CHANNEL LAYER HAVING MULTILAYER STRUCTURE, AND METHOD FOR MANUFACTURING SAME | Non-Final OA | IUCF-HYU (Industry University Cooperation Foundation Hanyang University) |
| 17616023 | METHOD FOR TUNING ELECTRICAL PROPERTIES OF OXIDE SEMICONDUCTORS AND THE DEVELOPMENT OF HIGHLY CONDUCTIVE P-TYPE AND N-TYPE Ga2O3 | Non-Final OA | Bowling Green State University |
| 17912419 | METHOD FOR FABRICATING STRAIN SENSING FILM, STRAIN SENSING FILM, AND PRESSURE SENSOR | Final Rejection | SHENZHEN NEW DEGREE TECHNOLOGY CO., LTD. |
| 17733033 | POROUS RF SWITCH FOR REDUCED CROSSTALK | Non-Final OA | IQE plc |
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