Prosecution Insights
Last updated: April 19, 2026

Examiner: OWENS, DOUGLAS W

Tech Center 2800 • Art Units: 2811 2814 2821 2823 2844 2897

This examiner grants 81% of resolved cases

Performance Statistics

80.8%
Allow Rate
+12.8% vs TC avg
357
Total Applications
+2.8%
Interview Lift
875
Avg Prosecution Days
Based on 328 resolved cases, 2023–2026

Rejection Statute Breakdown

0.6%
§101 Eligibility
36.8%
§102 Novelty
35.9%
§103 Obviousness
18.0%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18402883 SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18577470 WIRING SUBSTRATE, MANUFACTURING METHOD THEREOF, LIGHT-EMITTING SUBSTRATE, AND DISPLAY DEVICE Non-Final OA BOE TECHNOLOGY GROUP CO., LTD.
17957352 SEMICONDUCTOR DIE WITH DISSOLVABLE METAL LAYER Final Rejection TEXAS INSTRUMENTS INCORPORATED
18561063 DISPLAY DEVICE, METHOD FOR PRODUCING DISPLAY DEVICE, AND AQUEOUS SOLUTION Non-Final OA Sharp Display Technology Corporation
18396713 SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING A SEMICONDUCTOR STRUCTURE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18524644 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATION THEREOF Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18524661 SEMICONDUCTOR DEVICES WITH BACKSIDE GATE CONTACTS AND METHODS OF FABRICATION THEREOF Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18671060 THIN FILM TRANSISTOR AND DISPLAY DEVICE Non-Final OA Magnolia White Corporation
18573116 LIQUID METAL CONNECTION DEVICE AND METHOD Non-Final OA Intel Corporation
18630911 ASSEMBLY INCLUDING TERMINAL PADS ASSOCIATED WITH CONDUCTIVE TRACES AND HAVING IRREGULAR SURFACE TOPOGRAPHY, AND RELATED METHODS AND ELECTRONIC SYSTEMS Non-Final OA Micron Technology, Inc.
18572959 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS Non-Final OA Tokyo Electron Limited
18565663 EPITAXIAL WAFER FOR ULTRAVIOLET RAY EMISSION DEVICE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA SHIN-ETSU CHEMICAL CO., LTD.
18402950 METHODS AND SYSTEMS FOR FORMING STRUCTURES COMPRISING A THRESHOLD VOLTAGE TUNING LAYER Non-Final OA ASM IP Holding B.V.
18399098 ELECTROMAGNETIC SHILEDING FOR LEADLESS SEMICONDUCTOR PACKAGE Non-Final OA NXP USA, Inc.
18573297 POWER MODULE Non-Final OA AMOSENSE CO., LTD.
18399064 SEMICONDUCTOR STRUCTURE WITH BURIED POWER RAILS AND METHOD OF FABRICATING THE SAME Non-Final OA WUHAN XINXIN SEMICONDUCTOR MANUFACTURING CO., LTD.
18525356 THREE LAYER SYSTEM IN PACKAGE AND A METHOD OF ENABLING THEREOF Non-Final OA LightSpeed Photonics Pte Ltd

Facing This Examiner?

IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.

Build Your Strategy

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month