Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2891 2893
This examiner grants 82% of resolved cases
Akhee Sarker-Nag operates in Tech Center 2800 and Art Unit 2891. Based on 71 resolved cases, the examiner has an allowance rate of 81.7 percent. This high rate suggests that the majority of applications handled by this examiner result in a grant. The median days to allowance is 1253, indicating a specific prosecution timeline for this art unit. Despite the already high allowance rate, the data shows an interview lift of 12.5 percent.
This suggests that while 81.7 percent of cases are allowed, an interview can further improve the chances of success. With 71 resolved cases, these metrics provide a clear picture of the examiner's tendencies. Practitioners should prepare for a timeline of approximately 1253 days while noting that the 12.5 percent interview lift offers a viable path for resolving outstanding issues. The allowance rate remains a strong indicator of a favorable prosecution environment.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18775867 | SEMICONDUCTOR PACKAGE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18422924 | INTEGRATED CIRCUIT INCLUDING BACKSIDE WIRING AND METHOD OF DESIGNING THE INTEGRATED CIRCUIT | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18223649 | IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 17970008 | SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18500042 | METHOD OF MANUFACTURING LIGHT EMITTING DIODE | Final Rejection | Samsung Display Co., LTD. |
| 18744207 | LIGHT EMITTING ELEMENT AND DISPLAY DEVICE COMPRISING THE SAME | Non-Final OA | LG Display Co., Ltd. |
| 18486467 | SIP-TYPE ELECTRONIC DEVICE AND METHOD FOR MAKING SUCH A DEVICE | Final Rejection | COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
| 18334968 | SEMICONDUCTOR APPARATUS, METHOD FOR MANUFACTURING SEMICONDUCTOR APPARATUS, EQUIPMENT, AND SUBSTRATE | Final Rejection | CANON KABUSHIKI KAISHA |
| 17691213 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18595717 | BACKSIDE POWER DISTRIBUTION NETWORK | Non-Final OA | International Business Machines Corporation |
| 18474574 | GATE METAL JUMPER IN STACKED FET SRAM | Non-Final OA | International Business Machines Corporation |
| 18363889 | BACKSIDE POWER RAIL TO BACKSIDE CONTACT CONNECTION | Final Rejection | International Business Machines Corporation |
| 17994487 | SEPARATE EPITAXY IN MONOLITHIC STACKED AND STEPPED NANOSHEETS | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18779844 | DOPED SEMICONDUCTOR STRUCTURE FOR NIR SENSORS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18395728 | SEMICONDUCTOR DEVICE FOR HIGH-VOLTAGE APPLICATION | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18328502 | CRYSTALLIZATION TEMPERATURE REDUCTION OF HIGH-K DIELECTRIC LAYER | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18526418 | SEMICONDUCTOR DEVICES AND SYSTEMS INCLUDING STACKED LOGIC DIES | Non-Final OA | Advanced Micro Devices, Inc. |
| 18900273 | SEMICONDUCTOR DEVICE | Non-Final OA | FUJI ELECTRIC CO., LTD. |
| 18415624 | INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | United Microelectronics Corp. |
| 18515299 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | Non-Final OA | United Microelectronics Corp. |
| 17821039 | Interband Cascade Infrared Photodetectors and Methods of Use | Non-Final OA | The Board of Regents of the University of Oklahoma |
| 18715742 | PHOTOELECTRIC DETECTOR | Final Rejection | INNOLIGHT TECHNOLOGY (SUZHOU) LTD. |
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