Prosecution Insights
Last updated: October 02, 2026

Examiner: WILCZEWSKI, MARY A

Tech Center 2800 • Art Units: 2819 2822 2898

This examiner grants 85% of resolved cases

Analysis

Mary A. Wilczewski serves as an examiner in Art Unit 2819, which is part of Tech Center 2800. She has managed 838 resolved cases, providing a robust statistical foundation for her profile. His allowance rate is 84.8 percent, indicating that a strong majority of applications she reviews reach a grant. This 84.8 percent rate suggests a favorable environment for applicants in this art unit.

The data shows an interview lift of 10.2 percent for this examiner. This positive lift indicates that direct communication is a beneficial tool for advancing applications and resolving outstanding issues. Practitioners should utilize the 10.2 percent lift to improve their chances of success, as it represents a significant advantage over standard written prosecution. The 838 resolved cases demonstrate the effectiveness of this strategy.

The median time to allowance is 961 days. This 961-day timeframe serves as a benchmark for the expected duration of the prosecution process. By analyzing the 84.8 percent allowance rate and the 961-day median, attorneys can develop effective strategies and manage client expectations. These metrics provide a comprehensive view of the examination trends in Art Unit 2819.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

84.9%
Allow Rate
+16.9% vs TC avg
870
Total Applications
+10.2%
Interview Lift
962
Avg Prosecution Days
Based on 839 resolved cases, 2023–2026

Rejection Statute Breakdown

0.6%
§101 Eligibility
24.1%
§102 Novelty
44.5%
§103 Obviousness
21.7%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18340419 MEMORY DEVICES INCLUDING VERTICAL STACK STRUCTURE, METHODS OF MANUFACTURING AND OPERATING THE SAME, AND ELECTRONIC APPARATUSES INCLUDING MEMORY DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18108125 SEMICONDUCTOR DEVICES Non-Final OA Samsung Electronics Co., Ltd.
18665907 DISPLAY DEVICE AND MANUFACTURING METHOD OF DISPLAY DEVICE Non-Final OA Samsung Display Co., LTD.
18781527 LIGHT EMITTING DISPLAY APPARATUS Non-Final OA LG Display Co., Ltd.
17798828 DISPLAY DEVICE Non-Final OA SHARP KABUSHIKI KAISHA
18496081 SEMICONDUCTOR PROCESSING CHAMBER WITH FILAMENT LAMPS HAVING NONUNIFORM HEAT OUTPUT Final Rejection ASM IP Holding B.V.
17788238 COMPONENT AND METHOD FOR PRODUCING A COMPONENT Non-Final OA ams-OSRAM International GmbH
18897128 SEMICONDUCTOR DEVICE Non-Final OA IDEMITSU KOSAN CO., LTD.
18365241 ANNEALING APPARATUS AND METHOD OF OPERATING THE SAME Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
18352583 ISOLATION BETWEEN DEVICE AREAS Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18321844 METHOD FOR PERFORMING TRENCH ISOLATION PROCESS Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18197968 FINFET DEVICE STRUCTURE AND METHOD Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18786886 INTERFACE TRAP CHARGE DENSITY REDUCTION Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18782214 EMBEDDED STRESSORS IN EPITAXY SOURCE/DRAIN REGIONS Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18782255 Dual Dopant Source/Drain Regions and Methods of Forming Same Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18783352 SYSTEMS AND METHODS FOR PROCESSING A SUBSTRATE Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18447149 SILICON-GERMANIUM FINS AND METHODS OF PROCESSING THE SAME IN FIELD-EFFECT TRANSISTORS Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18363444 SEMICONDUCTOR DEVICE AND METHOD Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18363554 FINFET DEVICE AND METHOD Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18329396 INTERFACE TRAP CHARGE DENSITY REDUCTION Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
17814725 Semiconductor Device and Method Non-Final OA Taiwan Semiconductor Manufacturing Co.,Ltd.
17813700 MITIGATION OF TIME DEPENDENT DIELECTRIC BREAKDOWN Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.
17383299 INTERCONNECTION STRUCTURE WITH SIDEWALL PROTECTION LAYER Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
17150044 FINFET DEVICE AND METHOD Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.
17891923 INTEGRATED DIPOLE REGION FOR TRANSISTOR Non-Final OA Applied Materials, Inc.
18738371 Transistor and Method for Manufacturing Same Non-Final OA Microchip Technology Incorporated
16388225 Compositions and Methods Using Same for Deposition of Silicon-Containing Films Non-Final OA Versum Materials US, LLC
17611418 ORGANIC LIGHT-EMITTING MATERIAL CONTAINING TETRAPHENYLBENZENE, PREPARATION,AND APPLICATION Non-Final OA South China University of Technology

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