Prosecution Insights
Last updated: May 29, 2026

Advantest Corporation

16 pending office actions • 6 art units • 16 examiners • 0 of 16 (0%) have an AI response strategy ready • 47 patents granted in the last 365 days

Portfolio Summary

16
Total Pending OAs
9
Non-Final OAs
6
Final Rejections
1
Advisory / Quayle

Response Deadline Pressure

Based on the USPTO statutory response window for each pending office action. 16 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.

7
Overdue
0
Due this week
7
Due this month
2
Due in next 60 days
0
Due later

Deadline Fire Line

Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 16 of the docket's apps have a known mailing date.

-30dToday30d60d90d120d
Overdue (7)Due ≤ 30 days (7)Due ≤ 60 days (2)

Case Difficulty Mix

Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.

0
Hard (0%)
15
Medium (94%)
0
Easy (0%)
1
Unknown (6%)

Rejection Statute Mix

BucketCases
§103 only14 (88%)
§102 only1 (6%)
No statute on record1 (6%)

Industry Mix

How the docket's pending cases split across USPTO tech-center bands.

0
Life Sciences
0% of docket
4
Information Tech
25% of docket
0
Communications
0% of docket
12
Semiconductors
75% of docket
0
Mechanical / Eng
0% of docket
0
Business / Other
0% of docket

Time-on-OA Estimate

Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.

160 h
Manual time on pending OAs
32 h
Time saved (low, 20%)
56 h
Time saved (mid, 35%)
1.4 wks
FTE-weeks freed (mid)

Top Examiners on this docket

ExaminerApps on this docketAllow rateInterview lift
CHASE, SHELLY A 1 94.7% +2.6%
CHAUDRY, MUJTABA M 1 84.4% +3.7%
ASTACIO-OQUENDO, GIOVANNI 1 88.4% +10.4%
BRYAN, JASON B 1 76.5% +14.8%
ALEJNIKOV JR, ROBERT P 1 85.9% +17.4%
ZAKARIA, AKM 1 82.4% +16.2%
MERANT, GUERRIER 1 88.5% -2.6%
NGUYEN, VINH P 1 86.3% +16.2%
LE, THANG XUAN 1 88.3% +8.7%
NASIR, TAQI R 1 87.0% +13.6%

Quick Wins (8)

Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 8 ordered by deadline are shown.

App #TitleExaminerDue in
18632311 TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM NGUYEN, VINH P 35d overdue
18674142 PROBE ASSEMBLY FOR CALIBRATING RF POWER SIGNALS TO A DEVICE PIN ALEJNIKOV JR, ROBERT P 30d overdue
18708854 TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPARATUS ZAKARIA, AKM 2d overdue
18413516 MAGNETIC SIGNAL NOISE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUM NASIR, TAQI R 8d
18589333 MEASUREMENT ARRANGEMENT, MEASUREMENT SETUP, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A BEAMFORMING CHARACTERISTIC OF A DEVICE UNDER TEST LE, THANG XUAN 14d
18646654 EVALUATION APPARATUS, EVALUATION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM MERANT, GUERRIER 19d
18971433 APPARATUS FOR TESTING A DEVICE UNDER TEST SEPARATING ERRORS WITHIN A RECEIVED PATTERN ASSOCIATED WITH DIFFERENT FUNCTIONAL BLOCKS OF A DEVICE UNDER TEST OR ASSOCIATED WITH DIFFERENT BLOCKS OF ONE OR MORE BITS, METHOD AND COMPUTER PROGRAM CHASE, SHELLY A 29d
18776540 SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS ASTACIO-OQUENDO, GIOVANNI 55d

Interview Candidates (6)

Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 6 ordered by deadline are shown.

App #TitleExaminerDue in
18632311 TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM NGUYEN, VINH P 35d overdue
18674142 PROBE ASSEMBLY FOR CALIBRATING RF POWER SIGNALS TO A DEVICE PIN ALEJNIKOV JR, ROBERT P 30d overdue
18673501 FAST CORRELATION RF EXTENSION FOR AUTOMATIC HARDWARE INTERFACE SWITCHING BRYAN, JASON B 5d overdue
18708854 TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPARATUS ZAKARIA, AKM 2d overdue
18413516 MAGNETIC SIGNAL NOISE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUM NASIR, TAQI R 8d
18776540 SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS ASTACIO-OQUENDO, GIOVANNI 55d

Top Art Units

Art UnitApps
2858 8
2857 3
2112 2
2114 1
2111 1
2853 1

Pending Office Actions

App #TitleExaminerArt UnitStatutesStatusDue inAIFiled
18971433 APPARATUS FOR TESTING A DEVICE UNDER TEST SEPARATING ERRORS WITHIN A RECEIVED PATTERN ASSOCIATED WITH DIFFERENT FUNCTIONAL BLOCKS OF A DEVICE UNDER TEST OR ASSOCIATED WITH DIFFERENT BLOCKS OF ONE OR MORE BITS, METHOD AND COMPUTER PROGRAM CHASE, SHELLY A 2112 §103 Non-Final OA 29d Pending Dec 06, 2024
18946120 AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION CHAUDRY, MUJTABA M 2112 Other Non-Final OA 9d overdue Pending Nov 13, 2024
18776540 SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS ASTACIO-OQUENDO, GIOVANNI 2858 §103 Non-Final OA 55d Pending Jul 18, 2024
18673501 FAST CORRELATION RF EXTENSION FOR AUTOMATIC HARDWARE INTERFACE SWITCHING BRYAN, JASON B 2114 §103 Final Rejection 5d overdue Pending May 24, 2024
18674142 PROBE ASSEMBLY FOR CALIBRATING RF POWER SIGNALS TO A DEVICE PIN ALEJNIKOV JR, ROBERT P 2857 §103 Non-Final OA 30d overdue Pending May 24, 2024
18708854 TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPARATUS ZAKARIA, AKM 2858 §103 Non-Final OA 2d overdue Pending May 09, 2024
18646654 EVALUATION APPARATUS, EVALUATION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM MERANT, GUERRIER 2111 §103 Non-Final OA 19d Pending Apr 25, 2024
18632311 TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM NGUYEN, VINH P 2858 §103 Non-Final OA 35d overdue Pending Apr 11, 2024
18589333 MEASUREMENT ARRANGEMENT, MEASUREMENT SETUP, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A BEAMFORMING CHARACTERISTIC OF A DEVICE UNDER TEST LE, THANG XUAN 2858 §103 Final Rejection 14d Pending Feb 27, 2024
18413516 MAGNETIC SIGNAL NOISE MEASURING APPARATUS, METHOD, AND RECORDING MEDIUM NASIR, TAQI R 2858 §103 Final Rejection 8d Pending Jan 16, 2024
18574967 RAW MILK MEASURING APPARATUS AND METHOD OF MANUFACTURING THE SAME OLAMIT, JUSTIN N 2853 §103 Non-Final OA 42d overdue Pending Dec 28, 2023
18524722 PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM CLARKE, ADAM S 2858 §103 Final Rejection 34d Pending Nov 30, 2023
18379063 MAGNETICALLY RETAINED REPLACEABLE CYLINDER COMPONENT FOR PICK-AND-PLACE TEST HEAD UNIT RHODES-VIVOUR, TEMILADE S 2858 §102 Non-Final OA 12d Pending Oct 11, 2023
18104183 METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE SIGNALS TRANSMITTED VIA A BIDIRECTIONAL REAL-TIME INTERFACE GEISS, BRIAN BUTLER 2857 §103 Final Rejection 13d Pending Jan 31, 2023
18104193 METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE SPECIFIC CONTROL SIGNALING MILLER, DANIEL R 2858 §103 Non-Final OA 14d Pending Jan 31, 2023
17127596 GRAPHICAL USER INTERFACE FOR TRAFFIC CAPTURE AND DEBUGGING TOOL NGHIEM, MICHAEL P 2857 §103 Final Rejection 132d overdue Pending Dec 18, 2020

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