Prosecution Insights
Prosecution Insights
Technology area: Semiconductors, Circuits & Optics
14 pending office actions • 4 art units • 12 examiners • 0 of 14 (0%) have an AI response strategy ready • 40 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 4 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 4 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 1 (7%) |
| §101 + other | 2 (14%) |
| §103 only | 2 (14%) |
| §112 only | 1 (7%) |
| Multi-statute (no §101) | 8 (57%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| CLARKE, ADAM S | 2 | 79.0% | +11.3% |
| MILLER, DANIEL R | 2 | 82.6% | +20.8% |
| MCANDREW, CHRISTOPHER P | 1 | 85.9% | +13.9% |
| HAILE, BENYAM | 1 | 61.6% | +24.6% |
| RIOS RUSSO, RAUL J | 1 | 87.2% | +8.6% |
| MONSUR, NASIMA | 1 | 78.5% | +26.7% |
| EDWARDS, ETHAN WESLEY | 1 | 68.2% | +15.3% |
| ALEJNIKOV JR, ROBERT P | 1 | 85.8% | +17.6% |
| TRAN, HOANG Q | 1 | 67.7% | +32.7% |
| WEST, PAUL M | 1 | 84.1% | +14.0% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18104193 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE SPECIFIC CONTROL SIGNALING | MILLER, DANIEL R | 14d |
| 18931093 | CONNECTING DEVICE, TESTING DEVICE, AND COMMUNICATION DEVICE | RIOS RUSSO, RAUL J | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 17127596 | GRAPHICAL USER INTERFACE FOR TRAFFIC CAPTURE AND DEBUGGING TOOL | NGHIEM, MICHAEL P | 132d overdue |
| 18104183 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE SIGNALS TRANSMITTED VIA A BIDIRECTIONAL REAL-TIME INTERFACE | GEISS, BRIAN BUTLER | 13d |
| 19050905 | AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AND COMPUTER PROGRAM USING A FITTING APPROACH TO OBTAIN TEMPERATURE CONTROL INSTRUCTIONS | MCANDREW, CHRISTOPHER P | — |
| 18949857 | COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS | HAILE, BENYAM | — |
| 18850431 | SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS | CLARKE, ADAM S | — |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | MILLER, DANIEL R | — |
| 18753303 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | MONSUR, NASIMA | — |
| 18753355 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | EDWARDS, ETHAN WESLEY | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18104193 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE SPECIFIC CONTROL SIGNALING | MILLER, DANIEL R | 14d |
| 18524722 | PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM | CLARKE, ADAM S | 34d |
| 19050905 | AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AND COMPUTER PROGRAM USING A FITTING APPROACH TO OBTAIN TEMPERATURE CONTROL INSTRUCTIONS | MCANDREW, CHRISTOPHER P | — |
| 18949857 | COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS | HAILE, BENYAM | — |
| 18850431 | SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS | CLARKE, ADAM S | — |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | MILLER, DANIEL R | — |
| 18753303 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | MONSUR, NASIMA | — |
| 18753355 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | EDWARDS, ETHAN WESLEY | — |
| Art Unit | Apps |
|---|---|
| 2858 | 5 |
| 2857 | 3 |
| 2874 | 1 |
| 2855 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19050905 | AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AND COMPUTER PROGRAM USING A FITTING APPROACH TO OBTAIN TEMPERATURE CONTROL INSTRUCTIONS | MCANDREW, CHRISTOPHER P | — | §102§103Other | Non-Final OA | — | Pending | Feb 11, 2025 |
| 18949857 | COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS | HAILE, BENYAM | — | §102§103 | Non-Final OA | — | Pending | Nov 15, 2024 |
| 18931093 | CONNECTING DEVICE, TESTING DEVICE, AND COMMUNICATION DEVICE | RIOS RUSSO, RAUL J | — | §112 | Non-Final OA | — | Pending | Oct 30, 2024 |
| 18850431 | SOCKET ASSEMBLY AND ELECTRONIC COMPONENT TEST APPARATUS | CLARKE, ADAM S | 2858 | §102§103§112 | Non-Final OA | — | Pending | Sep 24, 2024 |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | MILLER, DANIEL R | 2858 | §102§103§112 | Non-Final OA | — | Pending | Aug 27, 2024 |
| 18753303 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | MONSUR, NASIMA | 2858 | §101§102§112 | Non-Final OA | — | Pending | Jun 25, 2024 |
| 18753355 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | EDWARDS, ETHAN WESLEY | — | §101§103§112 | Non-Final OA | — | Pending | Jun 25, 2024 |
| 18738071 | TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE MEDIUM | ALEJNIKOV JR, ROBERT P | 2857 | §101 | Non-Final OA | — | Pending | Jun 10, 2024 |
| 18442106 | OPTICAL CIRCUIT, OPTICAL INTEGRATED CIRCUIT, AND METHOD FOR PROVIDING POLARIZATION-INDEPENDENT OUTPUT LIGHT | TRAN, HOANG Q | 2874 | §102§103 | Non-Final OA | — | Pending | Feb 15, 2024 |
| 18524722 | PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM | CLARKE, ADAM S | 2858 | §103 | Non-Final OA | 34d | Pending | Nov 30, 2023 |
| 18485415 | PORE DEVICE AND FINE PARTICLE MEASUREMENT SYSTEM | WEST, PAUL M | 2855 | §102§103 | Non-Final OA | — | Pending | Oct 12, 2023 |
| 18104183 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE SIGNALS TRANSMITTED VIA A BIDIRECTIONAL REAL-TIME INTERFACE | GEISS, BRIAN BUTLER | 2857 | §102§103§112 | Non-Final OA | 13d | Pending | Jan 31, 2023 |
| 18104193 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE SPECIFIC CONTROL SIGNALING | MILLER, DANIEL R | 2858 | §103 | Final Rejection | 14d | Pending | Jan 31, 2023 |
| 17127596 | GRAPHICAL USER INTERFACE FOR TRAFFIC CAPTURE AND DEBUGGING TOOL | NGHIEM, MICHAEL P | 2857 | §103§112 | Final Rejection | 132d overdue | Pending | Dec 18, 2020 |
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