17 pending office actions • 7 art units • 17 examiners • 0 of 17 (0%) have an AI response strategy ready • 41 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 6 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 6 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 1 (6%) |
| §101 + other | 1 (6%) |
| §103 only | 2 (12%) |
| §102 only | 1 (6%) |
| §112 only | 3 (18%) |
| Multi-statute (no §101) | 9 (53%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| PHAN, THO GIA | 1 | 91.4% | +4.0% |
| PHAM, THAI N | 1 | 77.9% | +20.4% |
| HAILE, BENYAM | 1 | 62.0% | +24.2% |
| LEE, BENNY T | 1 | 87.4% | +25.3% |
| MILLER, DANIEL R | 1 | 82.5% | +20.9% |
| ASTACIO-OQUENDO, GIOVANNI | 1 | 88.4% | +10.4% |
| MONSUR, NASIMA | 1 | 78.7% | +26.0% |
| ALEJNIKOV JR, ROBERT P | 1 | 86.2% | +17.1% |
| LE, THANG XUAN | 1 | 88.4% | +8.6% |
| OLAMIT, JUSTIN N | 1 | 62.0% | +9.2% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19078442 | PUSHER FOR USE IN AN AUTOMATED TEST EQUIPMENT, A TEST ARRANGEMENT COMPRISING THE PUSHER AND A METHOD FOR MECHANICALLY PUSHING THE DEVICE UNDER TEST WITH AN ANTENNA INTO A DEVICE UNDER TEST SOCKET | PHAN, THO GIA | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 17127596 | GRAPHICAL USER INTERFACE FOR TRAFFIC CAPTURE AND DEBUGGING TOOL | NGHIEM, MICHAEL P | 132d overdue |
| 18104183 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE SIGNALS TRANSMITTED VIA A BIDIRECTIONAL REAL-TIME INTERFACE | GEISS, BRIAN BUTLER | 13d |
| 18589333 | MEASUREMENT ARRANGEMENT, MEASUREMENT SETUP, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A BEAMFORMING CHARACTERISTIC OF A DEVICE UNDER TEST | LE, THANG XUAN | 14d |
| 18776540 | SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS | ASTACIO-OQUENDO, GIOVANNI | 55d |
| 19078433 | PUSHER FOR USE IN AN AUTOMATED TEST EQUIPMENT, A TEST ARRANGEMENT COMPRISING THE PUSHER AND A METHOD FOR MECHANICALLY PUSHING THE DEVICE UNDER TEST WITH A SINGLE-LINEARLY POLARIZED ANTENNA INTO A DEVICE UNDER TEST SOCKET | PHAM, THAI N | — |
| 18949857 | COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS | HAILE, BENYAM | — |
| 18854694 | BIASING CIRCUIT | LEE, BENNY T | — |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | MILLER, DANIEL R | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 7 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18776540 | SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS | ASTACIO-OQUENDO, GIOVANNI | 55d |
| 19078433 | PUSHER FOR USE IN AN AUTOMATED TEST EQUIPMENT, A TEST ARRANGEMENT COMPRISING THE PUSHER AND A METHOD FOR MECHANICALLY PUSHING THE DEVICE UNDER TEST WITH A SINGLE-LINEARLY POLARIZED ANTENNA INTO A DEVICE UNDER TEST SOCKET | PHAM, THAI N | — |
| 18949857 | COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS | HAILE, BENYAM | — |
| 18854694 | BIASING CIRCUIT | LEE, BENNY T | — |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | MILLER, DANIEL R | — |
| 18753303 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | MONSUR, NASIMA | — |
| 18738071 | TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE MEDIUM | ALEJNIKOV JR, ROBERT P | — |
| Art Unit | Apps |
|---|---|
| 2858 | 6 |
| 2857 | 3 |
| 2843 | 1 |
| 2853 | 1 |
| 2855 | 1 |
| 2115 | 1 |
| 2447 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19078442 | PUSHER FOR USE IN AN AUTOMATED TEST EQUIPMENT, A TEST ARRANGEMENT COMPRISING THE PUSHER AND A METHOD FOR MECHANICALLY PUSHING THE DEVICE UNDER TEST WITH AN ANTENNA INTO A DEVICE UNDER TEST SOCKET | PHAN, THO GIA | — | §102 | Non-Final OA | — | Pending | Mar 13, 2025 |
| 19078433 | PUSHER FOR USE IN AN AUTOMATED TEST EQUIPMENT, A TEST ARRANGEMENT COMPRISING THE PUSHER AND A METHOD FOR MECHANICALLY PUSHING THE DEVICE UNDER TEST WITH A SINGLE-LINEARLY POLARIZED ANTENNA INTO A DEVICE UNDER TEST SOCKET | PHAM, THAI N | — | §103§112Other | Non-Final OA | — | Pending | Mar 13, 2025 |
| 18949857 | COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS | HAILE, BENYAM | — | §102§103 | Non-Final OA | — | Pending | Nov 15, 2024 |
| 18854694 | BIASING CIRCUIT | LEE, BENNY T | 2843 | §102§112 | Non-Final OA | — | Pending | Oct 07, 2024 |
| 18816814 | SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM | MILLER, DANIEL R | 2858 | §102§103§112 | Non-Final OA | — | Pending | Aug 27, 2024 |
| 18776540 | SEMICONDUCTOR DEVICE HANDLING APPARATUS AND SEMICONDUCTOR DEVICE TESTING APPARATUS | ASTACIO-OQUENDO, GIOVANNI | 2858 | §102§103 | Non-Final OA | 55d | Pending | Jul 18, 2024 |
| 18753303 | SEMICONDUCTOR TEST RESULT ANALYSIS DEVICE, SEMICONDUCTOR TEST RESULT ANALYSIS METHOD, AND RECORDING MEDIUM | MONSUR, NASIMA | 2858 | §101§102§112 | Final Rejection | — | Pending | Jun 25, 2024 |
| 18738071 | TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE MEDIUM | ALEJNIKOV JR, ROBERT P | 2857 | §101 | Final Rejection | — | Pending | Jun 10, 2024 |
| 18589333 | MEASUREMENT ARRANGEMENT, MEASUREMENT SETUP, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A BEAMFORMING CHARACTERISTIC OF A DEVICE UNDER TEST | LE, THANG XUAN | 2858 | §102§103 | Non-Final OA | 14d | Pending | Feb 27, 2024 |
| 18574967 | RAW MILK MEASURING APPARATUS AND METHOD OF MANUFACTURING THE SAME | OLAMIT, JUSTIN N | 2853 | §103 | Non-Final OA | 42d overdue | Pending | Dec 28, 2023 |
| 18524722 | PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM | CLARKE, ADAM S | 2858 | §103 | Final Rejection | 34d | Pending | Nov 30, 2023 |
| 18485415 | PORE DEVICE AND FINE PARTICLE MEASUREMENT SYSTEM | WEST, PAUL M | 2855 | §102§103 | Non-Final OA | — | Pending | Oct 12, 2023 |
| 18229965 | LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW POWER MODE | WANG, ZHIPENG | 2115 | §112 | Non-Final OA | — | Pending | Aug 03, 2023 |
| 18354771 | AUTOMATIC TEST EQUIPMENT | BARRON, JEREMIAH JOHN | 2858 | §112 | Final Rejection | — | Pending | Jul 19, 2023 |
| 18104183 | METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE SIGNALS TRANSMITTED VIA A BIDIRECTIONAL REAL-TIME INTERFACE | GEISS, BRIAN BUTLER | 2857 | §102§103§112 | Non-Final OA | 13d | Pending | Jan 31, 2023 |
| 18162702 | PROTECTING A MEASUREMENT SYSTEM FROM UNAUTHORIZED CHANGES | HUANG, KAYLEE J | 2447 | §112 | Final Rejection | — | Pending | Jan 31, 2023 |
| 17127596 | GRAPHICAL USER INTERFACE FOR TRAFFIC CAPTURE AND DEBUGGING TOOL | NGHIEM, MICHAEL P | 2857 | §103§112 | Final Rejection | 132d overdue | Pending | Dec 18, 2020 |
IP Author helps IP teams respond to office actions faster with AI-generated responses, examiner analytics, and prosecution intelligence.
Start Free Trial