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Last updated: August 17, 2026

Examiner: TRAN, MICHAEL THANH

Tech Center 2800 • Art Units: 2825 2827

This examiner grants 96% of resolved cases

Performance Statistics

95.8%

Allow Rate

+27.8% vs TC avg

1,536

Total Applications

+0.4%

Interview Lift

594

Avg Prosecution Days

Based on 1516 resolved cases, 2023–2026

Rejection Statute Breakdown

2.9%

§101 Eligibility

55.9%

§102 Novelty

12.3%

§103 Obviousness

5.9%

§112 Clarity

Currently Pending Office Actions

App #	Title	Status	Assignee
19031610	SEMICONDUCTOR DEVICE	Non-Final OA	Samsung Electronics Co., Ltd.
18970479	MEMORY DEVICE AND OPERATING METHOD OF MEMORY DEVICE	Non-Final OA	SAMSUNG ELECTRONICS CO., LTD.
18400049	NON-VOLATILE MEMORY DEVICE AND RECOVERY METHOD OF NON-VOLATILE MEMORY DEVICE	Non-Final OA	Samsung Electronics Co., Ltd.
18977477	Overlapping a Page Operation with a Processing-in-Memory Computation	Non-Final OA	Google LLC
18984252	METHOD FOR READING MEMORY DEVICE AND MEMORY DEVICE	Non-Final OA	YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18990013	READ LEVEL COMPENSATION FOR PARTIALLY PROGRAMMED BLOCKS OF MEMORY DEVICES	Non-Final OA	Micron Technology, Inc.
18819191	ANALOG STORAGE USING MEMORY DEVICE	Non-Final OA	Micron Technology, Inc.
18803290	IDENTIFY THE PROGRAMMING MODE OF MEMORY CELLS DURING READING OF THE MEMORY CELLS	Final Rejection	Micron Technology, Inc.
18785912	MANAGING COMPENSATION FOR CELL-TO-CELL COUPLING AND LATERAL MIGRATION IN MEMORY DEVICES USING SEGMENTATION	Non-Final OA	Micron Technology, Inc.
18678802	PROGRAM CURRENT CONTROLLER AND SENSE CIRCUIT FOR CROSS-POINT MEMORY DEVICES	Non-Final OA	Micron Technology, Inc.
18990122	SEMICONDUCTOR MEMORY DEVICES AND METHODS OF MANUFACTURING THEREOF	Non-Final OA	Taiwan Semiconductor Manufacturing Company, Ltd.
18969094	MEMORY DRIVER, MEMORY SYSTEM, AND OPERATING METHOD	Non-Final OA	Taiwan Semiconductor Manufacturing Company, Ltd.
19027728	SEMICONDUCTOR MEMORY DEVICE WITH MEMORY CELLS EACH INCLUDING A CHARGE ACCUMULATION LAYER AND A CONTROL GATE	Non-Final OA	KIOXIA CORPORATION
18812006	SEMICONDUCTOR MEMORY DEVICE	Final Rejection	Kioxia Corporation
18897573	WORD LINE ZONE ERASE TECHNIQUES FOR MEMORY DEVICES	Final Rejection	Sandisk Technologies, Inc.
19000707	MEMORY TESTING SYSTEM AND MEMORY TESTING METHOD	Non-Final OA	NANYA TECHNOLOGY CORPORATION

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