Prosecution Insights
Last updated: October 27, 2026

Carl Zeiss SMT GmbH: all pending office actions

← Back to Carl Zeiss SMT GmbH

App #TitleExaminerArt UnitStatutesStatusDue inAIFiled
19188275 METHOD FOR SIMULATING ILLUMINATION AND IMAGING PROPERTIES OF AN OPTICAL PRODUCTION SYSTEM WHEN AN OBJECT IS ILLUMINATED AND IMAGED BY MEANS OF AN OPTICAL MEASUREMENT SYSTEM RIDDLE, CHRISTINA A 2882 §101§102§103§112 Non-Final OA — Pending Apr 24, 2025
19170372 METHOD FOR COATING A SUBSTRATE BERMAN, JASON 1794 §102§103 Final Rejection 34d Pending Apr 04, 2025
19171128 METHOD FOR OPERATING AN OPTICAL COMPONENT, AND OPTICAL COMPONENT RIDDLE, CHRISTINA A 2882 §102§103§112 Non-Final OA — Pending Apr 04, 2025
19170404 MIRROR, IN PARTICULAR FOR A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS, AND METHOD OF PROCESSING A MIRROR RIDDLE, CHRISTINA A 2882 §103§112 Non-Final OA — Pending Apr 04, 2025
19095316 COMPUTER IMPLEMENTED METHOD, COMPUTER-READABLE MEDIUM, COMPUTER PROGRAM PRODUCT AND CORRESPONDING SYSTEMS FOR THE PREDICTION OF DEFECTS IN WAFERS AND FOR OFFLINE WAFER-LESS PROCESS WINDOW QUALIFICATION TSWEI, YU-JANG 2614 §101§103 Non-Final OA — Pending Mar 31, 2025
19082444 METHOD FOR OPERATING A PROJECTION EXPOSURE SYSTEM WHITESELL, STEVEN H 1759 §102§103 Non-Final OA — Pending Mar 18, 2025
19082944 OPTICAL ELEMENT FOR A PROJECTION EXPOSURE SYSTEM, OPTICAL SYSTEM COMPRISING SAME AND PROJECTION EXPOSURE SYSTEM COMPRISING THE OPTICAL ELEMENT AND/OR THE OPTICAL SYSTEM RIDDLE, CHRISTINA A 2882 §103§112 Non-Final OA — Pending Mar 18, 2025
19074961 BIPOD, OPTICAL SYSTEM AND PROJECTION EXPOSURE APPARATUS ASFAW, MESFIN T 2882 §102§103 Non-Final OA — Pending Mar 10, 2025
19073220 MICROELECTROMECHANICAL DEVICE WHITESELL, STEVEN H 1759 §103 Non-Final OA — Pending Mar 07, 2025
19068695 ILLUMINATION SYSTEM, RADIATION SOURCE APPARATUS, METHOD FOR ILLUMINATING A RETICLE, AND LITHOGRAPHY SYSTEM ASFAW, MESFIN T 2882 §102§103 Non-Final OA — Pending Mar 03, 2025
19063773 INDIVIDUAL MIRROR OF A PUPIL FACET MIRROR AND PUPIL FACET MIRROR FOR AN ILLUMINATION OPTICAL UNIT OF A PROJECTION EXPOSURE APPARATUS ASFAW, MESFIN T 2882 §103 Non-Final OA — Pending Feb 26, 2025
19059808 INTERMEDIATE PRODUCT FOR PRODUCING AN OPTICAL ELEMENT FOR A PROJECTION EXPOSURE APPARATUS, OPTICAL ELEMENT FOR A PROJECTION EXPOSURE APPARATUS, METHOD FOR PRODUCING AN INTERMEDIATE PRODUCT, AND METHOD FOR PRODUCING AN OPTICAL ELEMENT NGUYEN, HUNG 2882 §102§103 Non-Final OA — Pending Feb 21, 2025
19018304 LENS ELEMENT FOR A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS DESIGNED FOR OPERATION IN THE DUV, AND METHOD AND ARRANGEMENT FOR FORMING AN ANTIREFLECTION LAYER WHITESELL, STEVEN H 1759 §103 Non-Final OA — Pending Jan 13, 2025
19015842 X-RAY IMAGING SYSTEM HO, ALLEN C 2884 §102 Non-Final OA — Pending Jan 10, 2025
19008383 APPARATUS AND METHOD FOR PROVIDING SENSOR DATA OF AN OPTICAL SYSTEM, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS HAVING AN OPTICAL SYSTEM PERSAUD, DEORAM 2882 §102§103 Non-Final OA — Pending Jan 02, 2025
19000922 MEASURING ASSEMBLY FOR DETECTING A DISTANCE BETWEEN TWO ELEMENTS, DISTANCE MEASURING DEVICE, OPTICAL MEASURING SYSTEM AND METHOD NGUYEN, SANG H 2877 §102§103 Non-Final OA — Pending Dec 24, 2024
18971089 COMPUTER IMPLEMENTED METHOD FOR GENERATING AN AERIAL IMAGE OF A PHOTOLITHOGRAPHY MASK USING A MACHINE LEARNING MODEL BAYAT, ALI 2677 §101§103§112 Non-Final OA — Pending Dec 06, 2024
18935796 METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING LIGHT REFLECTIVITY AND AN EFFECT OF A POLARIZATION OF MEASURING LIGHT ON A MEASURING LIGHT IMPINGEMENT ON A LITHOGRAPHY MASK AYUB, HINA F 2877 §112 Final Rejection — Pending Nov 04, 2024
18920238 METHOD FOR MEASURING THE ILLUMINATION PUPIL IN A SCANNER TAKING INTO ACCOUNT A MEASUREMENT RETICLE KIM, PETER B 2882 §102§112 Final Rejection — Pending Oct 18, 2024
18901513 DEVICE AND METHOD FOR ALIGNING TWO COMPONENTS WHITESELL, STEVEN H 1759 §102§103§112 Non-Final OA — Pending Sep 30, 2024
18897888 BEAM ANGLE ROTATION AND SAMPLE ROTATION KALISZEWSKI, ALINA ROSE 2881 §102§103§112 Non-Final OA — Pending Sep 26, 2024
18895292 DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS WHITESELL, STEVEN H 1759 §112 Final Rejection 5d overdue Pending Sep 24, 2024
18830054 COMPUTER IMPLEMENTED METHOD FOR THE DETECTION OF ANOMALIES IN AN IMAGING DATASET OF A WAFER, AND SYSTEMS MAKING USE OF SUCH METHODS HARPER, ELIYAH STONE 2166 §102 Non-Final OA — Pending Sep 10, 2024
18807439 METHOD FOR MACHINING A WORKPIECE GATES, BRADFORD M 1713 §102§103§112 Non-Final OA — Pending Aug 16, 2024
18802211 OPTICAL SYSTEM COMPRISING AN EUV MIRROR AND METHOD FOR OPERATING AN OPTICAL SYSTEM BOOHER, ADAM W — §102§103 Final Rejection — Pending Aug 13, 2024
18792737 COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN OBJECT COMPRISING INTEGRATED CIRCUIT PATTERNS AND CORRESPONDING COMPUTER-READABLE MEDIUM, COMPUTER PROGRAM AND SYSTEM PHAM, ANNIE 2662 §101§102§103§112 Non-Final OA — Pending Aug 02, 2024
18792755 COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATASET OF AN OBJECT COMPRISING INTEGRATED CIRCUIT PATTERNS HSIEH, PING Y 2664 §102§103 Final Rejection — Pending Aug 02, 2024
18781256 COMPUTER IMPLEMENTED METHOD FOR THE DETECTION AND CLASSIFICATION OF ANOMALIES IN AN IMAGING DATASET OF A WAFER, AND SYSTEMS MAKING USE OF SUCH METHODS EL-BATHY, IBRAHIM N 3626 §101 Non-Final OA — Pending Jul 23, 2024
18778483 INFEROMETRIC MEASURING APPARATUS SCHNASE, PAUL DANIEL 2877 §103 Final Rejection 12d Pending Jul 19, 2024
18746596 METHOD AND DRYING DEVICE TREMARCHE, CONNOR J. — §103 Non-Final OA — Pending Jun 18, 2024
18741925 METHOD AND APPARATUS FOR PRODUCING AT LEAST ONE HOLLOW STRUCTURE, MIRROR, EUV LITHOGRAPHY SYSTEM, FLUID FEED APPARATUS AND METHOD FOR FEEDING A FLUID KIM, PETER B 2882 §102§103§112 Final Rejection — Pending Jun 13, 2024
18674144 COMPENSATION RASTER SCANNING MCCORMACK, JASON L 2881 §102§103§112 Non-Final OA — Pending May 24, 2024
18666211 METHOD, OPTICAL SYSTEM, TEST DEVICE AND ARRANGEMENT MILLER, DANIEL R 2858 §103§112 Non-Final OA — Pending May 16, 2024
18648644 OPTICAL SYSTEM FOR A METROLOGY SYSTEM AND METROLOGY SYSTEM WITH SUCH AN OPTICAL SYSTEM MENDOZA, ALEXANDRIA ARELLANO 2877 §103 Non-Final OA 12d Pending Apr 29, 2024
18639028 MEASUREMENT APPARATUS AND METHOD FOR INSPECTING PHOTOMASKS INTENDED FOR EUV MICROLITHOGRAPHY WANG, JING 2881 §103 Final Rejection — Pending Apr 18, 2024
18631733 HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOGRAPHY INFORMATION AND METHOD OF MASK INSPECTION SMYTH, ANDREW P 2878 §103§112 Non-Final OA — Pending Apr 10, 2024
18612515 APPARATUS AND METHOD FOR ANALYZING AN ELEMENT OF A PHOTOLITHOGRAPHY PROCESS WITH THE AID OF A TRANSFORMATION MODEL DINH, LYNDA 2857 §101§103§112 Non-Final OA — Pending Mar 21, 2024
18587228 METHOD AND MEASURING DEVICE FOR INSPECTING PHOTOMASKS, AND EUV CAMERA CARLSON, JOSHUA MICHAEL 2877 §103Other Final Rejection 24d overdue Pending Feb 26, 2024
18422302 METHOD FOR EXAMINING SAMPLES PERTAINING TO MICROLITHOGRAPHY NGUYEN, LEON VIET Q 2663 §103 Non-Final OA — Pending Jan 25, 2024
18419940 APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD MCCORMACK, JASON L 2881 §102§103 Non-Final OA 20d Pending Jan 23, 2024
18419167 METHOD FOR OPERATING AN OPTICAL SYSTEM RIVERA VARGAS, MANUEL A 2857 §101 Final Rejection — Pending Jan 22, 2024
18519993 METHODS, SYSTEMS, COMPUTER PROGRAMS AND COMPUTER-READABLE MEDIA FOR AUTOMATICALLY DESIGNING A WORKFLOW TO PERFORM A SEMICONDUCTOR INSPECTION TASK WALTON, CHESIREE A 3624 §101§103 Non-Final OA — Pending Nov 27, 2023
18387905 METHOD AND APPARATUS FOR PARTICLE BEAM-INDUCED PROCESSING OF A DEFECT OF A MICROLITHOGRAPHIC PHOTOMASK GARBOWSKI, LEIGH M 2851 §102 Non-Final OA — Pending Nov 08, 2023
18480263 ACTUATOR-SENSOR DEVICE AND LITHOGRAPHY APPARATUS RIDDLE, CHRISTINA A 2882 §102§103 Non-Final OA — Pending Oct 03, 2023
18367208 Mesh Integrity Check CARLSON, JOSHUA MICHAEL 2877 §103 Non-Final OA 23d overdue Pending Sep 12, 2023
18460760 Support Device for One or More MEMS Components MCDONALD, JASON ANDREW 2898 §103§112 Final Rejection — Pending Sep 05, 2023
18456309 ION BEAM INSPECTION AND REPAIR WITH INCREASED SECONDARY ELECTRON YIELD GHYKA, ALEXANDER G 2812 §103§112 Non-Final OA — Pending Aug 25, 2023
18362630 METHOD FOR PRODUCING A MULTI-PART MIRROR OF A PROJECTION ILLUMINATION SYSTEM FOR MICROLITHOGRAPHY WHITESELL, STEVEN H 1759 §103 Final Rejection 29d Pending Jul 31, 2023
18350522 OPTICAL ELEMENT FOR REFLECTING RADIATION, AND OPTICAL ASSEMBLY GASSEN, CHRISTOPHER J 2881 §103 Non-Final OA 12d Pending Jul 11, 2023
18319617 METHOD FOR PRODUCING A MAIN BODY OF AN OPTICAL ELEMENT FOR SEMICONDUCTOR LITHOGRAPHY, AND MAIN BODY OF AN OPTICAL ELEMENT FOR SEMICONDUCTOR LITHOGRAPHY CARRUTH, JENNIFER DOAK 2871 §102§103 Final Rejection 58d overdue Pending May 18, 2023
18124171 METHOD AND APPARATUS FOR MASK REPAIR ANGEBRANNDT, MARTIN J 1737 §102§103§112 Final Rejection — Pending Mar 21, 2023
18121722 APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD LOGIE, MICHAEL J 2881 §102 Final Rejection — Pending Mar 15, 2023
18098215 METHOD AND DEVICE FOR DETERMINING AN ALIGNMENT OF A PHOTOMASK ON A SAMPLE STAGE WHICH IS DISPLACEABLE ALONG AT LEAST ONE AXIS AND ROTATABLE ABOUT AT LEAST ONE AXIS OSENBAUGH-STEWART, ELIZA W 2881 §102§103 Non-Final OA — Pending Jan 18, 2023
18090067 OPTICAL ELEMENT FOR THE VUV WAVELENGTH RANGE, OPTICAL ARRANGEMENT, AND METHOD FOR MANUFACTURING AN OPTICAL ELEMENT AHVAZI, BIJAN 1763 §103 Final Rejection — Pending Dec 28, 2022
17742733 METHOD FOR DETERMINING A REGISTRATION ERROR RODGERS, ALEXANDER JOHN 2661 §102§103§112 Non-Final OA — Pending May 12, 2022
17162439 SUBSTRATE FOR AN EUV-LITHOGRAPHY MIRROR CARRUTH, JENNIFER DOAK 2871 §103 Final Rejection — Pending Jan 29, 2021

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month