Prosecution Insights
Last updated: May 29, 2026

Examiner: ASSOUMAN, HERVE-LOUIS Y

Tech Center 2800 • Art Units: 2812 2818 2826

This examiner grants 91% of resolved cases

Performance Statistics

91.1%
Allow Rate
+23.1% vs TC avg
697
Total Applications
+4.2%
Interview Lift
767
Avg Prosecution Days
Based on 666 resolved cases, 2023–2026

Rejection Statute Breakdown

0.9%
§101 Eligibility
5.6%
§102 Novelty
83.1%
§103 Obviousness
0.7%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18507224 SEMICONDUCTOR DEVICE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18225447 SEMICONDUCTOR PACKAGE Final Rejection Samsung Electronics Co., Ltd.
18345065 BUMP LANDING WITH BOND WIRES FOR IMPROVED SOLDER WETTING Final Rejection Texas Instruments Incorporated
18509035 BONDING STRUCTURES FOR HIGH-DENSITY METAL-TO-METAL BONDING AND METHODS FOR FORMING THE SAME Non-Final OA WESTERN DIGITAL TECHNOLOGIES, INC.,
18408633 BACKSIDE ANGLED SOURCE/DRAIN CONTACT STRUCTURE Non-Final OA INTERNATIONAL BUSINESS MACHINES CORPORATION
18381331 LOW TEMPERATURE CO-FLOW EPITAXIAL DEPOSITION PROCESS Non-Final OA Applied Materials, Inc.
18537324 INSULATION MODULE Non-Final OA ROHM CO., LTD.
18507817 POST PASSIVATION INTERCONNECT Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18155912 SEMICONDUCTOR DEVICE INCLUDING INSULATING STRUCTURE SURROUNDING THROUGH VIA AND METHOD FOR FORMING THE SAME Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18398028 IMAGE SENSING DEVICE Non-Final OA SK hynix Inc.
18506163 HETEROSTRUCTURE HAVING NON-VOLATILE ACTUATABLE POLARIZATION Non-Final OA Technion Research & Development Foundation Limited
17563921 MULTI-DIE COMMUNICATIONS COUPLINGS USING A SINGLE BRIDGE DIE Final Rejection ADVANCED MICRO DEVICES, INC.
18397847 HIGH DNAMIC RANGE OPTICAL SENSOR USING TRENCH CAPACITORS WITH SIDEWALL STRUCTURES Non-Final OA SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
18172904 PROTECTION DAM FOR A POWER MODULE WITH SPACERS Non-Final OA SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
18761587 ELECTRONIC IMAGING DETECTOR WITH THERMAL CONDUCTION LAYER Non-Final OA Gatan, Inc.
17736567 SUPERCONDUCTING THROUGH SUBSTRATE VIAS Final Rejection IQM Finland Oy
18575114 FAN-OUT PACKAGING METHOD, FAN-OUT PACKAGE STRUCTURE AND MANUFACTURING METHOD HEREOF Non-Final OA HYGON INFORMATION TECHNOLOGY CO., LTD.
18345607 DIRECT BONDING ON BURIED POWER RAILS Final Rejection Adeia Semiconductor Bonding Technologies, Inc.
18572868 DISPLAY PANEL AND MANUFACTURING METHOD THEREOF Non-Final OA XIAMEN EXTREMELY PQ DISPLAY TECHNOLOGY CO., LTD.
18104856 THROUGH-SILICON-VIA STRUCTURE AND METHOD FOR PREPARING SAME, THROUGH-SILICON-VIA INTERCONNECTION STRUCTURE AND METHOD FOR PREPARING SAME, AND ELECTRONIC DEVICE Non-Final OA GUSU LABORATORY OF MATERIALS

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