Tech Center 2800 • Art Units: 2815
This examiner grants 47% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18481443 | INTEGRATED CIRCUIT INCLUDING STANDARD CELLS AND METHOD OF DESIGNING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18133964 | SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 17861479 | SEMICONDUCTOR MEMORY DEVICE INCLUDING A BIT-CONTACT AND A CONTACT OHMIC LAYER THEREUNDER | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 15913621 | ELECTRONIC CIRCUIT WITH GUARD FEATURES FOR RELIABILITY IN HUMID ENVIRONMENTS | Non-Final OA | Texas Instruments Incorporated |
| 14967515 | WAFER ASSEMBLY PACKAGE METHOD FOR INTEGRATED CIRCUIT HAVING MEMS STRUCTURE | Non-Final OA | Texas Instruments Incorporated |
| 17457597 | APPARATUS FOR FABRICATING A SEMICONDUCTOR DEVICE HAVING REDUCED CONTACT RESISTANCE | Final Rejection | Applied Materials, Inc. |
| 18227785 | DETECTION DEVICE AND METHOD FOR MANUFACTURING THE SAME | Final Rejection | Japan Display Inc. |
| 18320464 | SEMICONDUCTOR STRUCTURE WITH MEMORY DEVICES AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 17584716 | MEMORY DEVICE WITH DUAL CHANNEL TRANSISTOR | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18331177 | THREE-DIMENSIONAL (3D) SEMICONDUCTOR MEMORY DEVICE INCLUDING DUMMY CHANNEL FILMS | Non-Final OA | SK hynix Inc. |
| 18194654 | SEMICONDUCTOR DEVICE HAVING STORAGE NODE CONTACT PLUGS AND METHOD FOR FABRICATING THE SAME | Non-Final OA | SK hynix Inc. |
| 17974092 | SEMICONDUCTOR DEVICE OF A THREE-DIMENSIONAL STRUCTURE AND METHOD FOR FABRICATING THE SAME | Final Rejection | SK hynix Inc. |
| 18232719 | METHOD OF FORMING BIOLOGICAL FIELD EFFECT TRANSISTORS INTEGRATED WITH HEATERS | Final Rejection | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17107420 | METHOD OF FORMING BIOLOGICAL FIELD EFFECT TRANSISTORS INTEGRATED WITH HEATERS | Non-Final OA | Taiwan Semiconductor manufacturing Co., Ltd. |
| 17693534 | DYNAMIC RANDOM ACCESS MEMORY DEVICES WITH ENHANCED DATA RETENTION AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18155107 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE | Final Rejection | CHANGXIN MEMORY TECHNOLOGIES, INC. |
| 17849987 | METHOD FOR FORMING A SEMI-BURIED BIT LINE STRUCTURE AND PERIPHERAL GATE SIMULTANEOUSLY | Final Rejection | CHANGXIN MEMORY TECHNOLOGIES, INC. |
| 18111412 | SEMICONDUCTOR DEVICE HAVING A MULTI-PURPOSE CAPACITIVE STRUCTURE | Final Rejection | AMKOR TECHNOLOGY SINGAPORE HOLDING PTE. LTD. |
| 18043196 | MESA AVALANCHE PHOTODIODE WITH SIDEWALL PASSIVATION | Non-Final OA | NATIONAL RESEARCH COUNCIL OF CANADA |
| 17831530 | SEMICONDUCTOR DEVICE INCLUDING ACTIVE PATTERN WITH INTEGRATED CONDUCTIVE STRUCTURE AND INTERCONNECTION | Final Rejection | SAMSUNG ELECTRONICS CO. |
| 17507752 | CASCADED TYPE II SUPERLATTICE INFRARED DETECTOR OPERATING AT 300 K | Non-Final OA | FIREFLY PHOTONICS, LLC |
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