Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2826 2893 2896 2898
This examiner grants 88% of resolved cases
Moazzam Hossain is an examiner in Tech Center 2800 and Art Unit 2826. The record includes 847 resolved cases. An allowance rate of 88.1 percent is observed. This percentage offers a benchmark for applicants evaluating their prospects. The median days to allowance is 861. This period reflects the typical prosecution length for granted patents. Practitioners may use this figure to establish expected timelines for their clients.
The interview lift for Hossain is 11.1 percent. This statistic suggests that an interview improves the likelihood of obtaining a patent. The 11.1 percent interview lift is smaller than the 88.1 percent allowance rate. For the 847 resolved cases, the median days to allowance of 861 is a key planning metric. In Art Unit 2826, the interview lift indicates that verbal communication is a valuable strategy. This analysis provides a foundation for prosecution in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18227788 | SEMICONDUCTOR LIGHT EMITTING DEVICE FOR A DISPLAY PIXEL AND A DISPLAY DEVICE INCLUDING THE SAME | Final Rejection | LG ELECTRONICS INC. |
| 18666612 | SEMICONDUCTOR DEVICES HAVING PERIPHERAL CONTACT PLUGS | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18662083 | SEMI-DAMASCENE STRUCTURE WITH DIELECTRIC HARDMASK LAYER | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18625801 | TRANSISTOR AND DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18409221 | SEMICONDUCTOR DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18833936 | DISPLAY PANEL AND DISPLAY APPARATUS | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18709640 | DETECTION SUBSTRATE AND DETECTION DEVICE | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18756130 | SUB-PIXEL AND DISPLAY DEVICE INCLUDING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 18630095 | DISPLAY PANEL AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 18599386 | DISPLAY DEVICE AND METHOD OF PROVIDING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18455956 | SEMICONDUCTOR POWER MODULE HAVING MORE EFFICIENT HEAT DISSIPATION AND IMPROVED SWITCHING BEHAVIOR | Non-Final OA | ZF Friedrichshafen AG |
| 18547022 | CARTRIDGE INTERFERENCE | Final Rejection | VueReal Inc. |
| 18126134 | GLASS CORE SUBSTRATE WITH LGA NOTCH | Final Rejection | Intel Corporation |
| 18743239 | JOSEPHSON DEVICE, SUPERCONDUCTING CIRCUIT, QUANTUM OPERATION DEVICE, AND METHOD FOR MANUFACTURING JOSEPHSON DEVICE | Non-Final OA | Fujitsu Limited |
| 18451542 | Shallow Trench Isolation using Porous Semiconductor | Final Rejection | Murata Manufacturing Co., Ltd. |
| 18670000 | Package with Single Integral Body Carrying Two Transistor Chips with Half Bridge Configuration | Non-Final OA | Infineon Technologies AG |
| 18817993 | SEMICONDUCTOR DEVICE | Non-Final OA | DENSO CORPORATION |
| 18782345 | TECHNIQUES FOR MRAM MTJ TOP ELECTRODE TO VIA INTERFACE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18734575 | IMAGE SENSOR DEVICES AND METHODS OF FORMATION | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18345988 | SEMICONDUCTOR DEVICE HAVING DIELECTRIC GATE ISOLATION SECTION | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18348967 | Cut Metal Gate Refill With Buffer Layer | Final Rejection | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18277505 | MULTIMODE SUPERCONDUCTING CAVITY RESONATORS | Non-Final OA | Yale University |
| 18023337 | METHOD FOR TREATING AN OPTOELECTRONIC DEVICE | Final Rejection | ALEDIA |
| 18809472 | Selective Dielectric Capping for Hybrid Bonding | Non-Final OA | Nanyang Technological University |
| 18702836 | CHIP TESTING STRUCTURE AND CHIP TESTING METHOD | Non-Final OA | HYGON INFORMATION TECHNOLOGY CO., LTD. |
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