Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2824 2827
This examiner grants 85% of resolved cases
Examiner Jerome Larry Leboeuf, based in Tech Center 2800 and Art Unit 2824, has an allowance rate of 85.4% across 520 resolved cases. The data indicates an interview lift of 6.4%, which shows that conducting an interview increases the probability of a grant above the 85.4% baseline. This 6.4% lift is a useful metric for practitioners when deciding on their prosecution strategy in this art unit.
The median days to allowance for this examiner is 750. This 750-day timeframe provides a benchmark for the duration of the patent acquisition process. With 520 resolved cases, the examiner's profile is well-established. In Art Unit 2824, the 85.4% allowance rate and the 6.4% lift from interviews suggest that direct communication is a beneficial tactic to reach a grant within the 750-day median period.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19022183 | Memory System Having Combined High Density, Low Bandwidth and Low Density, High Bandwidth Memories | Non-Final OA | Apple Inc. |
| 19022153 | Memory System Having Combined High Density, Low Bandwidth and Low Density, High Bandwidth Memories | Non-Final OA | Apple Inc. |
| 17957945 | DEVICE, METHOD AND SYSTEM TO PROVIDE A RANDOM ACCESS MEMORY WITH A FERROELECTRIC RESISTIVE JUNCTION | Final Rejection | Intel Corporation |
| 18832322 | Storage Device | Final Rejection | Semiconductor Energy Laboratory Co., Ltd. |
| 18871083 | SEMICONDUCTOR DEVICE AND ELECTRONIC APPARATUS | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18926712 | SEMICONDUCTOR MEMORY DEVICE WITH FIRST AND SECOND SENSE AMPLIFIERS | Final Rejection | KIOXIA CORPORATION |
| 19073768 | VOLTAGE SUPPLY CIRCUIT | Non-Final OA | SK hynix Inc. |
| 18904197 | MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18476939 | SEMICONDUCTOR DEVICE PERFORMING A FIRING OPERATION,- AND OPERATING METHOD OF THE SEMICONDUCTOR DEVICE | Final Rejection | SK hynix Inc. |
| 18913710 | WRITE LATENCY AND ENERGY USING ASYMMETRIC CELL DESIGN | Non-Final OA | Micron Technology, Inc. |
| 18734724 | REFRESH OF NEIGHBORING MEMORY CELLS BASED ON READ STATUS | Non-Final OA | Micron Technology, Inc. |
| 19026389 | MEMORY DEVICES AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 19007022 | CHARGE PUMP SYSTEM WITH LOW RIPPLE OUTPUT VOLTAGE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18952719 | MULTIPLE LAYER DUAL PORT MEMORY CELL MANUFACTURING METHOD | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18580872 | COMPUTING APPARATUS AND ROBUSTNESS PROCESSING METHOD THEREFOR | Non-Final OA | TSINGHUA UNIVERSITY |
| 19017028 | CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE | Non-Final OA | Rambus Inc. |
| 18810360 | APPARATUS AND METHOD FOR SELECTIVE REFRESH SUPPRESSION | Final Rejection | Rambus Inc. |
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