Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2812 2826
This examiner grants 87% of resolved cases
Tan N Tran is an examiner in Tech Center 2800 and Art Unit 2812. The record contains 1121 resolved cases. The allowance rate is 86.9 percent, which represents the probability of a grant. These 1121 resolved cases provide a sample for analyzing the examiner's performance. This volume of cases ensures the metrics are based on a broad range of applications.
The interview lift is 9.9 percent, which shows the change in the chance of allowance following an interview. The median days to allowance is 780, representing the duration for successful prosecution. In Art Unit 2812, these metrics offer a view of the examiner's past behavior.
Practitioners should consider the 9.9 percent interview lift when deciding on a prosecution strategy. The 86.9 percent allowance rate and the 780 median days to allowance are key for managing expectations. These data points from Tech Center 2800 help in understanding the examination process.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18673864 | SEMICONDUCTOR PACKAGES | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18615116 | SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18587326 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18417264 | SEMICONDUCTOR PACKAGE | Final Rejection | Samsung Electronics Co., Ltd. |
| 18689874 | Wiring Substrate, Electronic Element and Electronic Apparatus | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18794324 | DISPLAY APPARATUS | Non-Final OA | Samsung Display Co., Ltd. |
| 18242713 | DISPLAY DEVICE | Non-Final OA | SAMSUNG DISPLAY CO., LTD. |
| 18231247 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 18529525 | DISPLAY DEVICE | Final Rejection | LG Display Co., Ltd. |
| 18528672 | DISPLAY APPARATUS | Final Rejection | LG Display Co., Ltd. |
| 17980181 | Organic Light Emitting Display Device | Final Rejection | LG Display Co., Ltd. |
| 17899657 | THIN FILM TRANSISTOR, FABRICATION METHOD THEREOF, AND DISPLAY APPARATUS COMPRISING THE SAME | Final Rejection | LG DISPLAY CO., LTD. |
| 18741745 | MEMORY DEVICES HAVING VERTICAL TRANSISTORS IN OTP MEMORY CELLS | Non-Final OA | Yangtze Memory Technologies Co., Ltd. |
| 18689927 | LIGHT-EMITTING DEVICE AND PRODUCTION METHOD THEREFOR | Non-Final OA | Sharp Display Technology Corporation |
| 18739898 | LOW-K DIELECTRIC MATERIAL FOR INTERCONNECT STRUCTURES | Non-Final OA | International Business Machines Corporation |
| 18533085 | SEMICONDUCTOR DEVICE WITH AN ETCH STOP LAYER AT THE MIDDLE OF LINE | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18661326 | METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES | Final Rejection | Lodestar Licensing Group LLC |
| 18428718 | PACKAGE CONDUCTIVE TERMINALS WITH REDUCED PALLADIUM VOLUMES | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18398969 | LEADFRAME WITH RETAINING FEATURES | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18534056 | INTEGRATED DEVICES WITH CONDUCTIVE BARRIER STRUCTURE | Final Rejection | Texas Instruments Incorporated |
| 18781059 | SEMICONDUCTOR DEVICE AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18587104 | SEMICONDUCTOR STRUCTURE WITH BONDING INTERFACE AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18410329 | VIA-FIRST SELF-ALIGNED INTERCONNECT FORMATION PROCESS | Final Rejection | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18407527 | METHODS FOR PROTECTING A PERIPHERAL EDGE AND BACKSIDE OF A SEMICONDUCTOR SUBSTRATE | Non-Final OA | Tokyo Electron Limited |
| 18585451 | HIGH EFFICIENT LED PIXEL ARRAY WITH COMPOSITE N-CONTACT | Non-Final OA | Lumileds LLC |
| 18802110 | SEMICONDUCTOR DEVICE | Non-Final OA | FUJI ELECTRIC CO., LTD. |
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