Prosecution Insights
Last updated: May 29, 2026

Fei Company

30 pending office actions • 13 art units • 23 examiners • 0 of 30 (0%) have an AI response strategy ready • 56 patents granted in the last 365 days

Portfolio Summary

30
Total Pending OAs
21
Non-Final OAs
8
Final Rejections
1
Advisory / Quayle

Response Deadline Pressure

Based on the USPTO statutory response window for each pending office action. 29 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.

18
Overdue
1
Due this week
5
Due this month
3
Due in next 60 days
2
Due later

Deadline Fire Line

Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 29 of the docket's apps have a known mailing date.

-30dToday30d60d90d120d
Overdue (18)Due ≤ 7 days (1)Due ≤ 30 days (5)Due ≤ 60 days (3)Due later (2)

Case Difficulty Mix

Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.

0
Hard (0%)
29
Medium (97%)
1
Easy (3%)
0
Unknown (0%)

Rejection Statute Mix

BucketCases
§103 only27 (90%)
§102 only2 (7%)
§112 only1 (3%)

Industry Mix

How the docket's pending cases split across USPTO tech-center bands.

2
Life Sciences
7% of docket
0
Information Tech
0% of docket
7
Communications
23% of docket
20
Semiconductors
67% of docket
1
Mechanical / Eng
3% of docket
0
Business / Other
0% of docket

Time-on-OA Estimate

Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.

300 h
Manual time on pending OAs
60 h
Time saved (low, 20%)
105 h
Time saved (mid, 35%)
2.6 wks
FTE-weeks freed (mid)

Top Examiners on this docket

ExaminerApps on this docketAllow rateInterview lift
TANDY, LAURA ELOISE 4 62.0% +41.0%
LEE, EUNICE SOMIN 3 85.7% +33.3%
CHOI, JAMES J 2 66.8% +46.6%
MCCORMACK, JASON L 2 84.4% +8.1%
PATEL, AMOL H 1 85.2% +9.4%
CHU, RANDOLPH I 1 80.3% +5.9%
FAYE, MAMADOU 1 78.3% +7.1%
CHANG, HANWAY 1 85.8% +8.5%
IPPOLITO, NICOLE MARIE 1 86.6% +9.5%
NGUYEN, KIET TUAN 1 88.8% -0.1%

Quick Wins (10)

Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 8 ordered by deadline are shown.

App #TitleExaminerDue in
18525230 SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS NGUYEN, KIET TUAN 43d overdue
18662561 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 37d overdue
18654306 ELECTRICAL AND THERMAL CONNECTION CABLE FOR CHARGED PARTICLE MICROSCOPES PATEL, AMOL H 35d overdue
18747753 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 31d overdue
18747764 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 28d overdue
18611256 Lamella End-Pointing Via Graph-Weighted Neural Networks CHU, RANDOLPH I 28d overdue
18393233 Method for Alignment Free Ion Column IPPOLITO, NICOLE MARIE 23d overdue
18391947 COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARAMETERS FOR IMAGING AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY CHANG, HANWAY 19d

Interview Candidates (9)

Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.

App #TitleExaminerDue in
18662561 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 37d overdue
18477251 METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE CHOI, JAMES J 36d overdue
18747753 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 31d overdue
18747764 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 28d overdue
18447812 THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT TANDY, LAURA ELOISE 17d overdue
18178156 METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS TANDY, LAURA ELOISE 4d overdue
18448430 METHOD AND SYSTEM FOR PREPARING A SPECIMEN TANDY, LAURA ELOISE 6d
17957171 CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER CHOI, JAMES J 28d

Top Art Units

Art UnitApps
2881 12
2878 5
2656 3
2847 1
2667 1
2884 1
1716 1
2671 1
3763 1
2857 1

Pending Office Actions

App #TitleExaminerArt UnitStatutesStatusDue inAIFiled
18747753 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 2656 §103 Non-Final OA 31d overdue Pending Jun 19, 2024
18747764 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 2656 §103 Non-Final OA 28d overdue Pending Jun 19, 2024
18662561 LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION LEE, EUNICE SOMIN 2656 §103 Non-Final OA 37d overdue Pending May 13, 2024
18654306 ELECTRICAL AND THERMAL CONNECTION CABLE FOR CHARGED PARTICLE MICROSCOPES PATEL, AMOL H 2847 §103 Non-Final OA 35d overdue Pending May 03, 2024
18611256 Lamella End-Pointing Via Graph-Weighted Neural Networks CHU, RANDOLPH I 2667 §102 Non-Final OA 28d overdue Pending Mar 20, 2024
18392097 Detectors For Microscopy FAYE, MAMADOU 2884 §103 Non-Final OA 23d overdue Pending Dec 21, 2023
18391947 COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARAMETERS FOR IMAGING AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY CHANG, HANWAY 2878 §103 Non-Final OA 19d Pending Dec 21, 2023
18393233 Method for Alignment Free Ion Column IPPOLITO, NICOLE MARIE 2881 §102 Non-Final OA 23d overdue Pending Dec 21, 2023
18525230 SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS NGUYEN, KIET TUAN 2881 §103 Non-Final OA 43d overdue Pending Nov 30, 2023
18516040 Method and System for Imaging a Sample MASKELL, MICHAEL P 2878 §103 Non-Final OA 40d Pending Nov 21, 2023
18512815 CARBON CONTAINING PRECURSORS FOR BEAM-INDUCED DEPOSITION CROWELL, ANNA M 1716 §103 Non-Final OA 28d Pending Nov 17, 2023
18510047 INCREASING INFORMATION RESULTING FROM APODIZATION KOETH, MICHELLE M 2671 §103 Non-Final OA 50d overdue Pending Nov 15, 2023
18504000 METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARACTERISTICS BANKS, KEONA LAUREN 3763 §103 Non-Final OA 18d overdue Pending Nov 07, 2023
18485133 DRY ELECTRON SOURCE ENVIRONMENT KALISZEWSKI, ALINA ROSE 2881 §103 Non-Final OA 24d overdue Pending Oct 11, 2023
18478966 ABERRATION CORRECTION SYSTEMS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME VANORE, DAVID A 2878 §112 Non-Final OA 70d Pending Sep 29, 2023
18477251 METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE CHOI, JAMES J 2878 §103 Non-Final OA 36d overdue Pending Sep 28, 2023
18473035 SAMPLE CARRIER AND USES THEREOF LI, LARRY 2881 §103 Final Rejection 1d overdue Pending Sep 22, 2023
18458929 FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION MCCORMACK, JASON L 2881 §103 Final Rejection 70d Pending Aug 30, 2023
18448430 METHOD AND SYSTEM FOR PREPARING A SPECIMEN TANDY, LAURA ELOISE 2881 §103 Non-Final OA 6d Pending Aug 11, 2023
18447812 THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT TANDY, LAURA ELOISE 2881 §103 Non-Final OA 17d overdue Pending Aug 10, 2023
18362207 ENERGY DISPERSIVE X-RAY SPECTROSCOPY PHASE SPECTRUM SYNTHESIS BRYANT, CHRISTIAN THOMAS 2857 §103 Final Rejection Pending Jul 31, 2023
18355956 METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE STOFFA, WYATT A 2881 §103 Final Rejection 67d overdue Pending Jul 20, 2023
18221603 ADAPTIVE AND RETROSPECTIVE ENDPOINT DETECTION FOR AUTOMATED DELAYERING OF SEMICONDUCTOR SAMPLES YU, YUECHUAN 1718 §103 Non-Final OA 26d Pending Jul 13, 2023
18299635 TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY TANDY, LAURA ELOISE 2881 §103 Final Rejection 40d Pending Apr 12, 2023
18178156 METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS TANDY, LAURA ELOISE 2881 §103 Final Rejection 4d overdue Pending Mar 03, 2023
18068769 POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST IN ELECTRON MICROSCOPE IMAGING LOGIE, MICHAEL J 2881 §103 Final Rejection 89d overdue Pending Dec 20, 2022
17989550 Method Of Imaging And Milling A Sample MCCORMACK, JASON L 2881 §103 Non-Final OA 55d Pending Nov 17, 2022
17957171 CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER CHOI, JAMES J 2878 §103 Non-Final OA 28d Pending Sep 30, 2022
17957445 DATA TRIAGE IN MICROSCOPY SYSTEMS SHARIFF, MICHAEL ADAM 2672 §103 Final Rejection 27d Pending Sep 30, 2022
17823661 Automated Selection And Model Training For Charged Particle Microscope Imaging BEZUAYEHU, SOLOMON G 2674 §103 Non-Final OA 9d overdue Pending Aug 31, 2022

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