34 pending office actions
| App # | Title | Examiner | Art Unit | Status | Filed |
|---|---|---|---|---|---|
| 18747753 | LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION | LEE, EUNICE SOMIN | 2656 | Non-Final OA | Jun 19, 2024 |
| 18747764 | LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION | LEE, EUNICE SOMIN | 2656 | Non-Final OA | Jun 19, 2024 |
| 18662561 | LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION | LEE, EUNICE SOMIN | 2656 | Non-Final OA | May 13, 2024 |
| 18654306 | ELECTRICAL AND THERMAL CONNECTION CABLE FOR CHARGED PARTICLE MICROSCOPES | PATEL, AMOL H | 2847 | Non-Final OA | May 03, 2024 |
| 18611256 | Lamella End-Pointing Via Graph-Weighted Neural Networks | CHU, RANDOLPH I | 2667 | Non-Final OA | Mar 20, 2024 |
| 18605200 | TILED REGION ADJACENCY GRAPH COMPUTATION VIA PIXEL-REGION ADJACENCY GRAPHS | LIU, XIAO | 2664 | Non-Final OA | Mar 14, 2024 |
| 18393233 | Method for Alignment Free Ion Column | IPPOLITO, NICOLE MARIE | 2881 | Non-Final OA | Dec 21, 2023 |
| 18392097 | Detectors For Microscopy | FAYE, MAMADOU | 2884 | Non-Final OA | Dec 21, 2023 |
| 18391947 | COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARAMETERS FOR IMAGING AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY | CHANG, HANWAY | 2878 | Non-Final OA | Dec 21, 2023 |
| 18529239 | Fiber Fabry-Perot Cavity Laser Phase Plate For Charged Particle Microscopy | IPPOLITO, NICOLE MARIE | 2881 | Non-Final OA | Dec 05, 2023 |
| 18525230 | SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS | NGUYEN, KIET TUAN | 2881 | Non-Final OA | Nov 30, 2023 |
| 18516040 | Method and System for Imaging a Sample | MASKELL, MICHAEL P | 2878 | Non-Final OA | Nov 21, 2023 |
| 18512815 | CARBON CONTAINING PRECURSORS FOR BEAM-INDUCED DEPOSITION | CROWELL, ANNA M | 1716 | Non-Final OA | Nov 17, 2023 |
| 18510047 | INCREASING INFORMATION RESULTING FROM APODIZATION | KOETH, MICHELLE M | 2671 | Non-Final OA | Nov 15, 2023 |
| 18509205 | IN-VACUUM CHAMBER CONTROLLED-GAS-FILM DEVICE TO REDUCE LASER ABLATION REDEPOSITS | CHANG, HANWAY | 2878 | Non-Final OA | Nov 14, 2023 |
| 18506957 | MINIMIZATION OF ENERGY SPREAD IN FOCUSED ION BEAM (FIB) SYSTEMS | GASSEN, CHRISTOPHER J | 2881 | Non-Final OA | Nov 10, 2023 |
| 18485133 | DRY ELECTRON SOURCE ENVIRONMENT | KALISZEWSKI, ALINA ROSE | 2881 | Non-Final OA | Oct 11, 2023 |
| 18476964 | ADAPTIVE SLICE DEPTH IN SLICE & VIEW WORKFLOW | STOFFA, WYATT A | 2881 | Non-Final OA | Sep 28, 2023 |
| 18477251 | METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE | CHOI, JAMES J | 2878 | Non-Final OA | Sep 28, 2023 |
| 18473035 | SAMPLE CARRIER AND USES THEREOF | LI, LARRY | 2881 | Final Rejection | Sep 22, 2023 |
| 18458929 | FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION | MCCORMACK, JASON L | 2881 | Non-Final OA | Aug 30, 2023 |
| 18453978 | DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTROMETERS | KALISZEWSKI, ALINA ROSE | 2881 | Final Rejection | Aug 22, 2023 |
| 18451759 | MICROSCOPY SAMPLE PREPARATION METHODS AND ASSOCIATED SYSTEMS | VANORE, DAVID A | 2878 | Final Rejection | Aug 17, 2023 |
| 18448430 | METHOD AND SYSTEM FOR PREPARING A SPECIMEN | TANDY, LAURA ELOISE | 2881 | Non-Final OA | Aug 11, 2023 |
| 18447812 | THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT | TANDY, LAURA ELOISE | 2881 | Non-Final OA | Aug 10, 2023 |
| 18355956 | METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE | STOFFA, WYATT A | 2881 | Final Rejection | Jul 20, 2023 |
| 18221603 | ADAPTIVE AND RETROSPECTIVE ENDPOINT DETECTION FOR AUTOMATED DELAYERING OF SEMICONDUCTOR SAMPLES | YU, YUECHUAN | 1718 | Non-Final OA | Jul 13, 2023 |
| 18128223 | Method and system for analyzing three-dimensional features | MCCORMACK, JASON L | 2881 | Non-Final OA | Mar 30, 2023 |
| 18178156 | METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS | TANDY, LAURA ELOISE | 2881 | Final Rejection | Mar 03, 2023 |
| 18068769 | POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST IN ELECTRON MICROSCOPE IMAGING | LOGIE, MICHAEL J | 2881 | Final Rejection | Dec 20, 2022 |
| 17957445 | DATA TRIAGE IN MICROSCOPY SYSTEMS | SHARIFF, MICHAEL ADAM | 2672 | Final Rejection | Sep 30, 2022 |
| 17957171 | CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER | CHOI, JAMES J | 2878 | Non-Final OA | Sep 30, 2022 |
| 17948531 | APPARATUS AND METHOD FOR AUTOMATED GRID VALIDATION | CHOI, JAMES J | 2878 | Non-Final OA | Sep 20, 2022 |
| 17823661 | Automated Selection And Model Training For Charged Particle Microscope Imaging | BEZUAYEHU, SOLOMON G | 2674 | Non-Final OA | Aug 31, 2022 |
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