Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2811 2816 2818 2896
This examiner grants 40% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18637844 | WIRING STRUCTURE, METHOD OF MANUFACTURING THE WIRING STRUCTURE, AND SEMICONDUCTOR PACKAGE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18250792 | DISPLAY PANEL AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE | Final Rejection | BOE Technology Group Co., Ltd. |
| 17425300 | DISPLAY SUBSTRATE, DISPLAY PANEL, DISPLAY DEVICE, AND METHOD FOR MANUFACTURING DISPLAY SUBSTRATE | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 17971448 | DISPLAY DEVICE INCLUDING SEMICONDUCTOR LIGHT EMITTING DEVICE | Final Rejection | LG Display Co., Ltd. |
| 18299282 | LIGHT-EMITTING ELEMENT, METHOD FOR MANUFACTURING LIGHT-EMITTING ELEMENT, AND LIGHT-EMITTING DEVICE | Non-Final OA | NICHIA CORPORATION |
| 18526872 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Final Rejection | SAMSUNG DISPLAY CO., LTD. |
| 18131827 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF | Final Rejection | Samsung Display Co., LTD. |
| 18106408 | DISPLAY APPARATUS | Non-Final OA | SAMSUNG DISPLAY CO., LTD. |
| 18101809 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 17421367 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREFOR | Non-Final OA | Samsung Display Co., Ltd. |
| 17327168 | LIGHT-EMITTING ELEMENT, METHOD OF MANUFACTURING LIGHT-EMITTING ELEMENT, AND DISPLAY DEVICE INCLUDING LIGHT-EMITTING ELEMENT | Final Rejection | Samsung Display Co., LTD. |
| 18429571 | Electronic Device | Non-Final OA | InnoLux Corporation |
| 18309308 | SEMICONDUCTOR DEVICES WITH DOUBLE-SIDED FANOUT CHIP PACKAGES | Non-Final OA | Avago Technologies International Sales Pte. Limited |
| 17367431 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME | Final Rejection | Yangtze Memory Technologies Co., Ltd. |
| 18537929 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18538009 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18538192 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18538161 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18234410 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18234414 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18102808 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18012554 | METHOD FOR CONTACTING A POWER SEMICONDUCTOR ON A SUBSTRATE | Final Rejection | Siemens Aktiengesellschaft |
| 18393306 | SEMICONDUCTOR DEVICE WITH A DEFECT REGION AND METHOD OF FABRICATION THEREFOR | Non-Final OA | NXP B.V. |
| 18355238 | IMAGE SENSING DEVICE | Final Rejection | SK hynix Inc. |
| 18307620 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SK hynix Inc. |
| 17406953 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR MEMORY DEVICE | Final Rejection | SK hynix Inc. |
| 17446370 | MICROELECTRONIC DEVICES HAVING TRANSITION AREAS INCLUDING UPPER DUMMY PILLARS SPACED FROM SOURCE/DRAIN CONTACTS, AND RELATED METHODS AND SYSTEMS | Non-Final OA | Micron Technology, Inc. |
| 18599702 | CHANNEL EXTENSION STRUCTURES FOR SEMICONDUCTOR DEVICES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18405318 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18149783 | ETCH STOP STRUCTURE FOR IC TO INCREASE STABILITY AND ENDURANCE | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
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