Prosecution Insights
Last updated: April 19, 2026

Examiner: FAYETTE, NATHALIE RENEE

Tech Center 2800 • Art Units: 2812

This examiner grants 97% of resolved cases

Performance Statistics

96.7%
Allow Rate
+28.7% vs TC avg
62
Total Applications
+4.8%
Interview Lift
1283
Avg Prosecution Days
Based on 30 resolved cases, 2023–2026

Rejection Statute Breakdown

0.4%
§101 Eligibility
25.3%
§102 Novelty
53.7%
§103 Obviousness
18.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18375715 LIGHT EMITTING DEVICE AND LIGHT EMITTING DISPLAY DEVICE INCLUDING THE SAME Non-Final OA LG Display Co., Ltd.
18497485 DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Samsung Display Co., LTD.
18306314 DISPLAY DEVICE AND MANUFACTURING METHOD FOR THE SAME Non-Final OA Samsung Display Co., Ltd.
18551613 IMAGING DEVICE AND MANUFACTURING METHOD FOR IMAGING DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18108719 DIPOLE FORMATION PROCESSES Final Rejection Applied Materials, Inc.
18324729 WRAP-AROUND SILICIDE LAYER Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18186778 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18149767 DIELECTRIC STRUCTURE FOR SMALL PIXEL DESIGNS Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
17951995 ALTERING OPERATIONAL CHARACTERISTICS OF A SEMICONDUCTOR DEVICE USING ACCELERATED IONS Non-Final OA Intel Corporation
17561915 FORMATION OF METAL CONTACTS TO SILICON GERMANIUM LAYERS WITH ETCH RESISTIVE CAP LAYERS Non-Final OA Intel Corporation
17557128 INTEGRATED CIRCUITS WITH MAX OR MX CONDUCTIVE MATERIALS Final Rejection Intel Corporation
18111496 SEMICONDUCTOR ASSEMBLIES WITH SYSTEM AND METHOD FOR SMOOTHING SURFACES OF 3D STRUCTURES Final Rejection Micron Technology, Inc.
18318480 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE Non-Final OA SK hynix Inc.
18093199 THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME Final Rejection YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18284891 HIGH-ELECTRON-MOBILITY TRANSISTOR STRUCTURE AS WELL AS FABRICATING METHOD AND USE THEREOF Non-Final OA SUZHOU INSTITUTE OF NANO-TECH AND NANO-BIONICS (SINANO) , CHINESE ACADEMY OF SCIENCES
17789567 DISPLAY PANEL, MANUFACTURING METHOD THEREOF, AND SPLICING DISPLAY DEVICE Non-Final OA TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
17995461 LOSS PREVENTION DURING ATOMIC LAYER DEPOSITION Non-Final OA Lam Research Corporation
18243453 CHARGE-SENSING SEMICONDUCTOR DEVICE WITH DELTA LAYER TUNNEL JUNCTION Non-Final OA National Technology & Engineering Solutions of Sandia, LLC
18281790 ENHANCED GAN HEMT RADIO-FREQUENCY DEVICE AND MANUFACTURING METHOD THEREOF Non-Final OA SOUTH CHINA UNIVERSITY OF TECHNOLOGY

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