Tech Center 2800 • Art Units: 2817 2891 2895 2896
This examiner grants 86% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18367683 | IMAGE SENSOR AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 17128362 | IMAGE SENSOR AND METHOD FOR FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18236225 | DISPLAY PANEL AND DISPLAY DEVICE | Non-Final OA | LG Display Co., Ltd. |
| 18213661 | SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE | Non-Final OA | TOYODA GOSEI CO., LTD. |
| 18694135 | SOLID-STATE IMAGE-CAPTURING ELEMENT AND ELECTRONIC EQUIPMENT | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18366175 | PIXEL SENSOR INCLUDING REFRACTION STRUCTURES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18354217 | DEEP TRENCH ISOLATION STRUCTURE FOR IMAGE SENSOR NARROWED BY EPITAXY GROWTH | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18346772 | SEMICONDUCTOR DEVICE HAVING LOW-RESISTANCE GATE CONNECTOR | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18323465 | STRUCTURE FOR MICROELECTROMECHANICAL SYSTEMS (MEMS) DEVICES TO CONTROL PRESSURE AT HIGH TEMPERATURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17817023 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18113561 | NOVEL GATE FEATURE IN FINFET DEVICE | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17884636 | PMOSFET SOURCE DRAIN | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17872439 | Semiconductor Device With Facet S/D Feature And Methods Of Forming The Same | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17871890 | IMAGE SENSOR GRID AND METHOD OF FABRICATION OF SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
| 17705804 | Semiconductor Devices and Methods of Formation | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18131267 | SEMICONDUCTOR SUBSTRATE WITH PASSIVATED FULL DEEP-TRENCH ISOLATION | Non-Final OA | OmniVision Technologies, Inc. |
| 17741310 | 4H-SIC MOSFET DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | STMicroelectronics S.r.l. |
| 18137358 | BACKSIDE ILLUMINATED IMAGE SENSOR | Non-Final OA | DB HITEK CO., LTD. |
| 18075774 | IMAGE SENSOR | Non-Final OA | VisEra Technologies Company Limited |
| 18115775 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | Non-Final OA | United Semiconductor Japan Co., Ltd. |
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