Tech Center 2800 • Art Units: 2819 2823 2896
This examiner grants 72% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18164228 | IMAGE SENSOR | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18489082 | Organic Light-Emitting Display Device | Non-Final OA | LG Display Co., Ltd. |
| 17416497 | OLED DISPLAY HAVING INSLATING LAYERS REMOVED OVER THIN-FILM TRANSISTOR | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18480886 | SEMICONDUCTOR APPARATUS | Non-Final OA | Mitsubishi Electric Corporation |
| 18116513 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18044780 | METHOD OF PATTERNING A LAYER OF SUPERCONDUCTOR MATERIAL | Non-Final OA | Microsoft Technology Licensing, LLC |
| 17879091 | SELECTIVE SILICIDE DEPOSITION FOR 3-D DRAM | Non-Final OA | Applied Materials, Inc. |
| 18183574 | Image Sensor Structures And Methods For Forming The Same | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17482926 | INTEGRATED, CONFIGURABLE MICRO HEAT PUMP AND MICROCHANNELS | Final Rejection | Intel Corporation |
| 18620002 | MEMORY ARRAY HAVING BRIDGING MATERIAL BETWEEN ADJACENT MEMORY BLOCKS | Non-Final OA | Micron Technology, Inc. |
| 18489172 | PHASE CHANGE RAM DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | Korea Advanced Institute of Science and Technology |
| 18458023 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18450187 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | Kioxia Corporation |
| 18182529 | SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18182765 | SEMICONDUCTOR STORAGE DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR STORAGE DEVICE, AND SEMICONDUCTOR WAFER | Non-Final OA | Kioxia Corporation |
| 17696042 | SEMICONDUCTOR PACKAGE | Non-Final OA | MEDIATEK INC. |
| 17969301 | IMAGE SENSING DEVICE | Final Rejection | SK hynix Inc. |
| 18186441 | SEMICONDUCTOR DEVICES HAVING SHIELDING ELEMENT | Non-Final OA | Yangtze Memory Technologies Co., Ltd. |
| 17948549 | THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME | Final Rejection | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18240065 | SEMICONDUCTOR PACKAGE AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18480996 | HIGH VOLTAGE AND HIGH-POWER DIAMOND BASED JUNCTION-GATE FIELD EFFECT TRANSISTOR (JFET) SWITCH WITH PHOTO-CONTROLLED GATE | Non-Final OA | Lawrence Livermore National Security, LLC |
| 18169780 | SEMICONDUCTOR DEVICE HAVING A SUPER JUNCTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
| 18109211 | BACKSIDE REFRACTION LAYER FOR BACKSIDE ILLUMINATED IMAGE SENSOR AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18064133 | STATIC RANDOM-ACCESS MEMORY DEVICE WITH THREE-LAYERED CELL DESIGN | Non-Final OA | IMEC VZW |
| 18152193 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME | Non-Final OA | CHANGXIN MEMORY TECHNOLOGIES, INC. |
| 18149210 | PATTERNING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE | Non-Final OA | CHANGXIN MEMORY TECHNOLOGIES, INC. |
| 18185388 | MICRO LIGHT EMITTING DIODE | Non-Final OA | PlayNitride Display Co., Ltd. |
| 18106209 | CMOS Image Sensor and Method for Forming the Same | Final Rejection | HUA HONG SEMICONDUCTOR (WUXI) LIMITED |
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