Tech Center 2800 • Art Units: 2816 2822 2899
This examiner grants 86% of resolved cases
Examiner Lawrence C. Tynes Jr. is a member of Tech Center 2800 and operates within Art Unit 2816. With 791 resolved cases, his profile provides a substantial dataset for evaluating prosecution trends. His allowance rate of 85.5% indicates a high frequency of granted patents, suggesting that the examiner is generally open to finding allowable subject matter. This rate serves as a primary benchmark for applicants assessing their chances of success when assigned to his docket.
The median days to allowance for this examiner is 862, which offers a clear expectation for the timeline of a successful application. Practitioners should also consider the interview lift of 8.8%, which shows a positive correlation between direct communication and patent issuance. While the base allowance rate is already high, this lift suggests that interviews can be a useful tool for resolving minor disagreements or clarifying technical points. The 862-day median pendency is a critical figure for budgeting and strategic planning.
For those navigating Art Unit 2816, the combination of an 85.5% allowance rate and an 8.8% interview lift suggests a collaborative environment. The 791 resolved cases indicate that these metrics are stable and representative of the examiner's long-term performance. Applicants may find that while the standard prosecution path is often successful, the added benefit of an interview can help maintain momentum toward the 862-day median resolution. This data-driven approach allows for more precise forecasting of outcomes in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18736228 | SEMICONDUCTOR DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18732848 | SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18663449 | SEMICONDUCTOR DEVICE HAVING SOURCE/DRAIN REGIONS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18544881 | DISPLAY DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18389134 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | LG DISPLAY CO., LTD. |
| 18715890 | SEMICONDUCTOR DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18353671 | Inter-Terminal Die-to-Die Attachment | Final Rejection | Murata Manufacturing Co., Ltd. |
| 17977091 | FAN-OUT PACKAGE HAVING BALL GRID ARRAY SUBSTRATE WITH SIGNAL AND POWER METALLIZATION | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18410303 | SEMICONDUCTOR STRUCTURE HAVING NON-SILICIDE SOURCE/DRAIN CONTACT AND METHOD FOR MANUFACTURING THE SAME | Final Rejection | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18779329 | SEMICONDUCTOR PACKAGES AND METHODS OF FORMING SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18744471 | METHOD AND DEVICE TO INCREASE NANOSHEET DEVICE WIDTH | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18767239 | Zero Mask High Density Capacitor | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 17641365 | HIGH DENSITY PLASMA CVD FOR DISPLAY ENCAPSULATION APPLICATION | Non-Final OA | Applied Materials, Inc. |
| 18651931 | METHOD FOR FORMING CONDUCTORS AND THEIR CONTACTS WHICH CARRY SIGNALS FOR ADVANCED SEMICONDUCTOR MEMORY DEVICES | Non-Final OA | Nanya Technology Corporation |
| 18813043 | ORGANIC LIGHT-EMITTING DIODE DISPLAY PANEL | Non-Final OA | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18361081 | SINGLE PACKAGE DATA STORAGE DEVICE | Non-Final OA | Sandisk Technologies, Inc |
| 18674710 | ELECTRONIC SYSTEM AND SEMICONDUCTOR MODULE | Non-Final OA | Advanced Semiconductor Engineering, Inc. |
| 18310072 | ELECTRONIC PACKAGE AND MANUFACTURING METHOD THEREOF | Final Rejection | SILICONWARE PRECISION INDUSTRIES CO., LTD. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy