Tech Center 2800 • Art Units: 2816 2892 2894 2898 2899
This examiner grants 82% of resolved cases
Mohammad M Choudhry is an examiner in Tech Center 2800 and Art Unit 2816 with 712 resolved cases. He maintains a high allowance rate of 82.2 percent. This statistic indicates a favorable environment for applicants seeking patent protection in his area of expertise within the 712 resolved cases processed.
The data shows an interview lift of 11.7 percent. This suggests that conducting an interview provides a notable benefit to the prosecution process, potentially resolving issues more effectively than written correspondence alone. Practitioners should evaluate the 11.7 percent increase when deciding on their communication strategy to reach an allowance in Tech Center 2800.
The median days to allowance for his cases is 1007. This timeframe represents a stable metric for the duration of successful prosecution. The combination of an 82.2 percent allowance rate and a 1007-day timeline defines his profile in Art Unit 2816.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18743705 | VERTICAL NON-VOLATILE MEMORY DEVICE INCLUDING MEMORY CELL STRING | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18735325 | COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR IMAGE SENSING DEVICES | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18544767 | GATE STRUCTURES AND SEMICONDUCTOR DEVICES INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 17959892 | SEMICONDUCTOR PACKAGE MANUFACTURING METHOD | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 17976869 | MANUFACTURING METHOD OF ELECTRONIC DEVICE | Final Rejection | Innolux Corporation |
| 18810468 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | SK hynix Inc. |
| 18777946 | METHOD OF MANUFACTURING A MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18825245 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Kioxia Corporation |
| 18544815 | BIOMETRIC INFORMATION MEASUREMENT DEVICE AND METHOD OF MANUFACTURING BIOMETRIC INFORMATION MEASUREMENT DEVICE | Final Rejection | Sharp Semiconductor Innovation Corporation |
| 18426241 | STRING DRIVER WITH DEEP TRENCH ISOLATIONS | Non-Final OA | Micron Technology, Inc. |
| 18626638 | METHOD FOR TREATING TWO SUBSTRATES AND SEMICONDUCTOR APPARATUS FOR PERFORMING THE TREATMENT | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18432197 | INTEGRATED CIRCUIT DEVICE INCLUDING A HIGH THERMAL CONDUCTIVITY ELECTRICALLY INSULATING STRUCTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18410301 | Semiconductor Packages and Methods of Forming | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18232133 | ADHESION IMPROVEMENTS IN METAL-CONTAINING HARDMASKS | Final Rejection | Applied Materials, Inc. |
| 18224576 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | UNITED MICROELECTRONICS CORP. |
| 17444229 | FLOW GUIDING STRUCTURE OF CHIP | Final Rejection | SITRONIX TECHNOLOGY CORP. |
| 18798449 | LIGHT-EMITTING DEVICE, MANUFACTURING METHOD THEREOF AND DISPLAY MODULE USING THE SAME | Non-Final OA | Ennostar Corporation |
| 18451873 | SEMICONDUCTOR DEVICE AND METHOD FOR FORMING SAME | Final Rejection | CHANGXIN MEMORY TECHNOLOGIES, INC. |
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