Tech Center 2800 • Art Units: 2800 2823 2842 2892
This examiner grants 90% of resolved cases
Lalrinfamkim Hmar Malsawma is an examiner in Tech Center 2800 and Art Unit 2800. The examiner has managed 1111 resolved cases, which provides the basis for performance metrics. The overall allowance rate is 90.5 percent. This 90.5 percent figure serves as a baseline for applicants to evaluate their chances of success. Practitioners can use the 1111 case history to assess the examiner's experience level in this specific field.
The data highlights an 8.8 percent interview lift, suggesting that direct communication can influence the outcome of a case. This 8.8 percent lift is a key tactical consideration for those deciding whether to request a formal discussion. The median days to allowance for the examiner's cases is 765. This 765 day period reflects the typical timeframe from filing to patent issuance for successful applications. Understanding the 765 day median pendency and the impact of interviews can help practitioners develop a more efficient prosecution strategy for this area of Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18658546 | SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18616279 | SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18683224 | DISPLAY MODULE, DISPLAY DEVICE | Non-Final OA | BOE TECHNOLOGY GROUP CO., LTD. |
| 18565294 | DISPLAYING BASE PLATE AND DISPLAYING DEVICE | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 18277228 | Display Panel and Display Apparatus | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18264484 | DISPLAY PANEL AND DISPLAY APPARATUS | Final Rejection | BOE Technology Group Co., Ltd. |
| 18616957 | DISPLAY DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18588306 | DISPLAY DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18142421 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF | Final Rejection | LG Display Co., Ltd. |
| 18278479 | DISPLAY DEVICE | Non-Final OA | SHARP KABUSHIKI KAISHA |
| 18384448 | METHOD AND SYSTEM FOR TUNING PHOTORESIST ADHESION LAYER PROPERTIES | Final Rejection | ASM IP Holding B.V. |
| 18533148 | WRAP-AROUND DIELECTRIC LINER TO PREVENT BACKSIDE CONTACT TO GATE SHORT | Non-Final OA | International Business Machines Corporation |
| 18439768 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | SK hynix Inc. |
| 18782660 | METHOD FOR FORMING SEMICONDUCTOR MEMORY DEVICE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18433908 | SEMICONDUCTOR PACKAGE AND METHOD OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18820625 | FLEXIBLE COVER LENS FILMS | Non-Final OA | Applied Materials, Inc. |
| 18616483 | SEMICONDUCTOR DEVICE | Non-Final OA | ROHM CO., LTD. |
| 18797617 | SEMICONDUCTOR STRUCTURE INCLUDING A BIT LINE STRUCTURE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | NANYA TECHNOLOGY CORPORATION |
| 18592646 | SUBSTRATE PROCESSING APPARATUS, CLEANING METHOD, SUBSTRATE PROCESSING METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM | Non-Final OA | Kokusai Electric Corporation |
| 18437847 | WAFER, AND FRONT/BACK SURFACE DETERMINATION METHOD FOR WAFER | Final Rejection | DISCO CORPORATION |
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