Prosecution Insights
Last updated: October 02, 2026

Examiner: MICHAUD, NICHOLAS BRIAN

Tech Center 2800 • Art Units: 2818

This examiner grants 75% of resolved cases

Analysis

Nicholas Brian Michaud operates within Tech Center 2800 and Art Unit 2818, where he has managed 59 resolved cases. His allowance rate stands at 74.6 percent. Practitioners should note that the median days to allowance for this examiner is 1208, which provides a timeline for expectations regarding the duration of the prosecution process. This 1208-day duration reflects the typical path for the 59 resolved cases in his history.

The data highlights an interview lift of 30.9 percent. This metric indicates that conducting an interview with the examiner is associated with a higher probability of reaching an allowance compared to cases where no interview occurs. This lift suggests that direct engagement is an effective strategy for overcoming rejections. The 30.9 percent lift is a factor for attorneys to consider when the 74.6 percent allowance rate is not met through written responses alone. Direct communication may help clarify technical issues and expedite the examination process.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

75.0%
Allow Rate
+7.0% vs TC avg
90
Total Applications
+30.0%
Interview Lift
1204
Avg Prosecution Days
Based on 60 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
17.3%
§102 Novelty
57.0%
§103 Obviousness
25.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18765633 SEMICONDUCTOR DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18538631 SUBSTRATE HAVING UNDERFILL DAM AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME, AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR PACKAGE Non-Final OA Samsung Electronics Co., Ltd.
18294098 ARRAY SUBSTRATE, DISPLAY PANEL, DISPLAY DEVICE, AND TILED DISPLAY APPARATUS Final Rejection BOE TECHNOLOGY GROUP CO., LTD.
18562556 SILICON-BASED MASK, MANUFACTURING METHOD, AND DISPLAY PANEL Final Rejection BOE TECHNOLOGY GROUP CO., LTD.
18339583 LIGHT EMITTING ELEMENT, DISPLAY DEVICE INCLUDING THE SAME, AND METHOD OF FABRICATING THE DISPLAY DEVICE Final Rejection Samsung Display Co., LTD.
18434084 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA Toshiba Electronic Devices & Storage Corporation
18394754 DISPLAY APPARATUS Final Rejection LG Display Co., Ltd.
18171864 OPTOELECTRONIC DEVICE WITH SUB-WAVELENGTH ANTIREFLECTIVE STRUCTURE, ASSOCIATED SCREEN AND MANUFACTURING METHOD Final Rejection COMMISSARIAT À L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
18593989 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Kioxia Corporation
18593988 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Non-Final OA Kioxia Corporation
18443013 MERGED CAVITIES FOR CONDUCTOR FORMATION IN A MEMORY DIE Non-Final OA Micron Technology, Inc.
17888650 SILICIDE INTERFCACES OF DEVICE HAING DIFFERENT CONDUCTIVITY TYPE TRANSISTORS AND METHOD THEREOF Non-Final OA Micron Technology, Inc.
18781335 SEMICONDUCTOR DEVICE HAVING THERMALLY CONDUCTIVE AIR GAP STRUCTURE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18778989 MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18486203 METHOD FOR TWO-DIMENSIONAL MENTAL LINE PATTERNING Final Rejection TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
17747058 SEMICONDUCTOR DEVICE HAVING NANOSHEET TRANSISTORS AND BACK-SIDE INTERCONNECT STRUCTURE COMPRISING POWER LINE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18442758 SEMICONDUCTOR PACKAGE AND METHODS Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
17864552 Metal Surface Blocking Molecules for Selective Deposition Non-Final OA Applied Materials, Inc.
18443115 PIXEL DEVICE AND DISPLAY APPARATUS HAVING THE SAME Final Rejection SEOUL VIOSYS CO., LTD.

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