Prosecution Insights
Last updated: May 29, 2026

Examiner: PIZARRO CRESPO, MARCOS D

Tech Center 2800 • Art Units: 2814

This examiner grants 66% of resolved cases

Performance Statistics

65.8%
Allow Rate
-2.2% vs TC avg
592
Total Applications
+14.9%
Interview Lift
1332
Avg Prosecution Days
Based on 550 resolved cases, 2023–2026

Rejection Statute Breakdown

0.1%
§101 Eligibility
12.1%
§102 Novelty
74.4%
§103 Obviousness
11.2%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
17391342 SEMICONDUCTOR DEVICE Final Rejection Samsung Electronics Co., Ltd.
17306267 IMAGE SENSOR PACKAGES Non-Final OA Samsung Electronics Co., Ltd.
17504182 ELECTRONIC DEVICE HAVING CHEMICALLY COATED BUMP BONDS Non-Final OA TEXAS INSTRUMENTS INCORPORATED
17980010 SOLID-STATE IMAGING DEVICE AND ELECTRONIC DEVICE Final Rejection SONY SEMICONDUCTOR SOLUTIONS CORPORATION
17567812 SEMICONDUCTOR DEVICE Non-Final OA Semiconductor Energy Laboratory Co., Ltd.
17879097 SELECTION GATE STRUCTURE AND FABRICATION METHOD FOR 3D MEMORY Non-Final OA Applied Materials, Inc.
17089047 PMOS High-K Metal Gates Final Rejection Applied Materials, Inc.
17547980 WRAP-AROUND CONTACT WITH REDUCED RESISTANCE Final Rejection Intel Corporation
18118021 SEMICONDUCTOR DEVICE Final Rejection Toshiba Electronic Devices & Storage Corporation
18097939 LOW Z-HEIGHT LED ARRAY PACKAGE HAVING TSV SUPPORT STRUCTURE Non-Final OA Lumileds LLC
18156414 SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18083576 FINFET HAVING A GATE DIELECTRIC COMPRISING A MULTI-LAYER STRUCTURE INCLUDING AN OXIDE LAYER WITH DIFFERENT THICKNESSES ON SIDE AND TOP SURFACES OF THE FINS Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
17859982 Strained Channel Field Effect Transistor Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18043730 ADHESIVE FOR SEMICONDUCTORS, AND SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME Final Rejection Resonac Corporation
18518081 Metal Contact Structure and Method of Forming the Same in a Semiconductor Device Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18335741 CONTACT FORMATION METHOD AND RELATED STRUCTURE Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18166517 SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME Non-Final OA Industrial Technology Research Institute
17227383 MEMORY DEVICE AND METHOD OF FABRICATING THE SAME Final Rejection Winbond Electronics Corp.
18377367 FORMING VIRTUAL MICROPHONE ARRAYS USING DUAL OMNIDIRECTIONAL MICROPHONE ARRAY (DOMA) Non-Final OA Jawbone Innovations, LLC
17315740 SEMICONDUCTOR DEVICE AND FORMING METHOD THEREOF Non-Final OA Semiconductor Manufacturing International (Beijing) Corporation

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