Prosecution Insights
Last updated: May 29, 2026

Globalwafers Co. Ltd.

20 pending office actions • 12 art units • 17 examiners • 0 of 20 (0%) have an AI response strategy ready • 48 patents granted in the last 365 days

Portfolio Summary

20
Total Pending OAs
14
Non-Final OAs
6
Final Rejections
0
Advisory / Quayle

Response Deadline Pressure

Based on the USPTO statutory response window for each pending office action. 20 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.

8
Overdue
2
Due this week
6
Due this month
3
Due in next 60 days
1
Due later

Deadline Fire Line

Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 20 of the docket's apps have a known mailing date.

-30dToday30d60d90d120d
Overdue (8)Due ≤ 7 days (2)Due ≤ 30 days (6)Due ≤ 60 days (3)Due later (1)

Case Difficulty Mix

Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.

1
Hard (5%)
16
Medium (80%)
3
Easy (15%)
0
Unknown (0%)

Rejection Statute Mix

BucketCases
§101 only1 (5%)
§103 only15 (75%)
§102 only1 (5%)
§112 only3 (15%)

Industry Mix

How the docket's pending cases split across USPTO tech-center bands.

12
Life Sciences
60% of docket
0
Information Tech
0% of docket
1
Communications
5% of docket
6
Semiconductors
30% of docket
1
Mechanical / Eng
5% of docket
0
Business / Other
0% of docket

Time-on-OA Estimate

Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.

200 h
Manual time on pending OAs
40 h
Time saved (low, 20%)
70 h
Time saved (mid, 35%)
1.8 wks
FTE-weeks freed (mid)

Top Examiners on this docket

ExaminerApps on this docketAllow rateInterview lift
QI, HUA 3 55.4% +23.7%
BRATLAND JR, KENNETH A 2 56.3% +16.3%
KUNEMUND, ROBERT M 1 82.0% +14.2%
FERGUSON, LAWRENCE D 1 78.3% +13.5%
DANG, PHUC T 1 95.4% +1.3%
NGUYEN, CUONG B 1 87.9% +16.2%
SONG, MATTHEW J 1 60.4% +14.0%
KIM, JAY C 1 48.8% +22.3%
TUROCY, DAVID P 1 46.7% +36.3%
SAFAIPOUR, BOBBAK 1 86.1% +10.7%

Quick Wins (4)

Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 4 ordered by deadline are shown.

App #TitleExaminerDue in
18436223 METHODS FOR PREPARING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED RADIAL RESISTIVITY VARIATION KUNEMUND, ROBERT M 6d
18510046 EPITAXIAL STRUCTURE DANG, PHUC T 15d
18454895 METHODS OF PREPARING SILICON-ON-INSULATOR STRUCTURES USING EPITAXIAL WAFERS NGUYEN, CUONG B 21d
18341343 SYSTEMS AND METHODS FOR AIR POCKET DEFECT DETECTION SAFAIPOUR, BOBBAK 27d

Hard Cases (1)

Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 1 ordered by deadline are shown.

App #TitleExaminerDue in
18071631 METHOD AND DEVICE FOR PROVIDING WIRE BREAKAGE WARNING HINZE, LEO T 132d overdue

Interview Candidates (12)

Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.

App #TitleExaminerDue in
18326487 METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED CARBON CONTAMINATION AND SUSCEPTORS FOR USE IN SUCH METHODS BRATLAND JR, KENNETH A 30d overdue
18342986 RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RESISTIVITY AND ULTRA-HIGH RESISTIVITY SINGLE CRYSTAL SILICON INGOT GROWTH QI, HUA 9d overdue
18228994 LIGHT-EMITTING ELEMENT STRUCTURE KIM, JAY C 4d overdue
18436223 METHODS FOR PREPARING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED RADIAL RESISTIVITY VARIATION KUNEMUND, ROBERT M 6d
18184886 SYSTEMS AND METHODS FOR DETERMINING MECHANICAL WEAR IN A CRYSTAL PULLER QI, HUA 6d
18410347 INGOT PULLER APPARATUS AND METHODS FOR GROWING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED LOWER CHAMBER DEPOSITS BRATLAND JR, KENNETH A 8d
18507219 INGOT PULLER APPARATUS HAVING A REFLECTOR ASSEMBLY SUSPENDED FROM SUPPORT SHAFTS QI, HUA 8d
18454895 METHODS OF PREPARING SILICON-ON-INSULATOR STRUCTURES USING EPITAXIAL WAFERS NGUYEN, CUONG B 21d

Top Art Units

Art UnitApps
1714 7
2818 2
1718 2
1781 1
2897 1
2815 1
2665 1
1717 1
1784 1
2853 1

Pending Office Actions

App #TitleExaminerArt UnitStatutesStatusDue inAIFiled
18436223 METHODS FOR PREPARING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED RADIAL RESISTIVITY VARIATION KUNEMUND, ROBERT M 1714 §112 Non-Final OA 6d Pending Feb 08, 2024
18429457 SILICON CARBIDE SEED CRYSTAL FERGUSON, LAWRENCE D 1781 §103 Non-Final OA 76d Pending Feb 01, 2024
18410347 INGOT PULLER APPARATUS AND METHODS FOR GROWING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED LOWER CHAMBER DEPOSITS BRATLAND JR, KENNETH A 1714 §102 Non-Final OA 8d Pending Jan 11, 2024
18510046 EPITAXIAL STRUCTURE DANG, PHUC T 2897 §103 Non-Final OA 15d Pending Nov 15, 2023
18507219 INGOT PULLER APPARATUS HAVING A REFLECTOR ASSEMBLY SUSPENDED FROM SUPPORT SHAFTS QI, HUA 1714 §103 Non-Final OA 8d Pending Nov 13, 2023
18454895 METHODS OF PREPARING SILICON-ON-INSULATOR STRUCTURES USING EPITAXIAL WAFERS NGUYEN, CUONG B 2818 §103 Non-Final OA 21d Pending Aug 24, 2023
18448788 CRUCIBLES HAVING ANCHORS AND METHODS FOR PRODUCING AND USING SAME SONG, MATTHEW J 1714 §103 Final Rejection 34d Pending Aug 11, 2023
18228994 LIGHT-EMITTING ELEMENT STRUCTURE KIM, JAY C 2815 §112 Non-Final OA 4d overdue Pending Aug 01, 2023
18351188 METHODS FOR SEMICONDUCTOR WAFER PROCESSING USING A RADIANT HEAT CAP IN A SEMICONDUCTOR WAFER REACTOR TUROCY, DAVID P 1718 §103 Non-Final OA 56d Pending Jul 12, 2023
18342986 RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RESISTIVITY AND ULTRA-HIGH RESISTIVITY SINGLE CRYSTAL SILICON INGOT GROWTH QI, HUA 1714 §103 Final Rejection 9d overdue Pending Jun 28, 2023
18341343 SYSTEMS AND METHODS FOR AIR POCKET DEFECT DETECTION SAFAIPOUR, BOBBAK 2665 §103 Final Rejection 27d Pending Jun 26, 2023
18326487 METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED CARBON CONTAMINATION AND SUSCEPTORS FOR USE IN SUCH METHODS BRATLAND JR, KENNETH A 1714 §103 Non-Final OA 30d overdue Pending May 31, 2023
18184886 SYSTEMS AND METHODS FOR DETERMINING MECHANICAL WEAR IN A CRYSTAL PULLER QI, HUA 1714 §103 Non-Final OA 6d Pending Mar 16, 2023
18177130 WAFER AND METHOD OF PROCESSING WAFER DEGRASSE, IAN ISAAC 2818 §103 Final Rejection 9d Pending Mar 02, 2023
18104462 EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME LAW, NGA LEUNG V 1717 §103 Non-Final OA 34d Pending Feb 01, 2023
18104443 EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME HORGER, KIM S. 1784 §103 Non-Final OA 44d overdue Pending Feb 01, 2023
18071631 METHOD AND DEVICE FOR PROVIDING WIRE BREAKAGE WARNING HINZE, LEO T 2853 §101 Final Rejection 132d overdue Pending Nov 30, 2022
17934875 SYSTEMS AND METHODS FOR DYNAMIC CONTROL OF COOLING FLUID FLOW IN AN EPITAXIAL REACTOR FOR SEMICONDUCTOR WAFER PROCESSING SEOANE, TODD MICHAEL 1718 §103 Non-Final OA 5d overdue Pending Sep 23, 2022
17860108 INGOT JIG ASSEMBLY AND INGOT EDGE-POLISHING MACHINE TOOL ZAWORSKI, JONATHAN R 3723 §112 Final Rejection 23d overdue Pending Jul 08, 2022
17553835 EPITAXY SUBSTRATE AND EPITAXIAL WAFER STRUCTURE HSIEH, HSIN YI 2899 §103 Non-Final OA 60d overdue Pending Dec 17, 2021

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