Prosecution Insights
Prosecution Insights
Technology area: Chemistry & Materials
22 pending office actions • 5 art units • 12 examiners • 0 of 22 (0%) have an AI response strategy ready • 45 patents granted in the last 365 days
Globalwafers Co., Ltd. is currently managing 22 pending office actions within the Chemistry & Materials technology area. These actions are distributed across 5 distinct art units. The company deals with 12 distinct examiners, which results in examiners reviewing multiple applications within the portfolio. This ratio indicates that several examiners are reviewing multiple applications within the portfolio.
QI, HUA is the busiest examiner for the portfolio, handling a workload of 5 pending office actions. This concentration under QI, HUA, combined with the fact that 12 distinct examiners cover 22 actions, indicates examiner overlap. Practitioners can expect to interact with specific examiners like QI, HUA across multiple cases. This environment may allow for consistent prosecution strategies across the 5 art units involved, as the company frequently interacts with this group of 12 distinct examiners. The high volume of 22 pending office actions requires a strategy that leverages this examiner concentration.
Based on the USPTO statutory response window for each pending office action. 8 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 8 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §103 only | 13 (59%) |
| §102 only | 1 (5%) |
| §112 only | 2 (9%) |
| Double-patenting + other | 1 (5%) |
| Multi-statute (no §101) | 5 (23%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| QI, HUA | 5 | 56.6% | +23.1% |
| BRATLAND JR, KENNETH A | 5 | 56.1% | +16.3% |
| KUNEMUND, ROBERT M | 2 | 82.0% | +13.2% |
| SONG, MATTHEW J | 2 | 60.4% | +13.9% |
| NEIBAUR, ROBERT F | 1 | 76.8% | +31.6% |
| ZAWORSKI, JONATHAN R | 1 | 52.7% | +26.7% |
| HOBAN, MATTHEW E | 1 | 60.4% | +25.3% |
| BRECHT, CHARLES MATTHEW | 1 | — | — |
| LAW, NGA LEUNG V | 1 | 56.7% | +20.7% |
| HORGER, KIM S. | 1 | 70.7% | +20.0% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18940294 | SYSTEMS AND METHODS FOR CONTROLLING A GAS DOPANT VAPORIZATION RATE DURING A CRYSTAL GROWTH PROCESS | KUNEMUND, ROBERT M | — |
| 18666359 | SYSTEMS AND METHODS FOR COOLING A CHUNK POLYCRYSTALLINE FEEDER | KUNEMUND, ROBERT M | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18104443 | EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME | HORGER, KIM S. | 44d overdue |
| 18342986 | RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RESISTIVITY AND ULTRA-HIGH RESISTIVITY SINGLE CRYSTAL SILICON INGOT GROWTH | QI, HUA | 9d overdue |
| 18675609 | METHODS OF GROWING SINGLE CRYSTAL INGOTS USING SUSCEPTOR ASSEMBLY WITH SACRIFICE RING | QI, HUA | — |
| 18622166 | INGOT PULLER APPARATUS INCLUDING MOVEABLE COOLING JACKET FOR CONTROLLED INGOT COOLING PROFILES | BRATLAND JR, KENNETH A | — |
| 17455347 | NON-CONTACT SYSTEMS AND METHODS FOR DETERMINING DISTANCE BETWEEN SILICON MELT AND REFLECTOR IN A CRYSTAL PULLER | QI, HUA | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18104443 | EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME | HORGER, KIM S. | 44d overdue |
| 18326487 | METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED CARBON CONTAMINATION AND SUSCEPTORS FOR USE IN SUCH METHODS | BRATLAND JR, KENNETH A | 30d overdue |
| 18342986 | RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RESISTIVITY AND ULTRA-HIGH RESISTIVITY SINGLE CRYSTAL SILICON INGOT GROWTH | QI, HUA | 9d overdue |
| 18410347 | INGOT PULLER APPARATUS AND METHODS FOR GROWING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED LOWER CHAMBER DEPOSITS | BRATLAND JR, KENNETH A | 8d |
| 18507219 | INGOT PULLER APPARATUS HAVING A REFLECTOR ASSEMBLY SUSPENDED FROM SUPPORT SHAFTS | QI, HUA | 8d |
| 18448788 | CRUCIBLES HAVING ANCHORS AND METHODS FOR PRODUCING AND USING SAME | SONG, MATTHEW J | 34d |
| 18104462 | EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME | LAW, NGA LEUNG V | 34d |
| 18940294 | SYSTEMS AND METHODS FOR CONTROLLING A GAS DOPANT VAPORIZATION RATE DURING A CRYSTAL GROWTH PROCESS | KUNEMUND, ROBERT M | — |
| Art Unit | Apps |
|---|---|
| 1714 | 13 |
| 1717 | 1 |
| 1784 | 1 |
| 1718 | 1 |
| 3723 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18940294 | SYSTEMS AND METHODS FOR CONTROLLING A GAS DOPANT VAPORIZATION RATE DURING A CRYSTAL GROWTH PROCESS | KUNEMUND, ROBERT M | — | §103 | Non-Final OA | — | Pending | Nov 07, 2024 |
| 18886599 | METHODS FOR CONDITIONING POLISHING PADS | NEIBAUR, ROBERT F | — | §103 | Non-Final OA | — | Pending | Sep 16, 2024 |
| 18809199 | INGOT EDGE-POLISHING MACHINE TOOL | ZAWORSKI, JONATHAN R | — | §103 | Non-Final OA | — | Pending | Aug 19, 2024 |
| 18770677 | SILICON CARBIDE MATERIAL | HOBAN, MATTHEW E | — | §102DP | Non-Final OA | — | Pending | Jul 12, 2024 |
| 18675609 | METHODS OF GROWING SINGLE CRYSTAL INGOTS USING SUSCEPTOR ASSEMBLY WITH SACRIFICE RING | QI, HUA | 1714 | §102§103 | Non-Final OA | — | Pending | May 28, 2024 |
| 18666359 | SYSTEMS AND METHODS FOR COOLING A CHUNK POLYCRYSTALLINE FEEDER | KUNEMUND, ROBERT M | 1714 | §103 | Non-Final OA | — | Pending | May 16, 2024 |
| 18635262 | SYSTEMS AND METHODS FOR MICROVOID ANALYSIS IN CRYSTALS GROWN BY CONTINUOUS CZOCHRALSKI PULLERS | BRATLAND JR, KENNETH A | 1714 | §112 | Non-Final OA | — | Pending | Apr 15, 2024 |
| 18631819 | SEMICONDUCTOR ON INSULATOR STRUCTURE COMPRISING A PLASMA NITRIDE LAYER AND METHOD OF MANUFACTURE THEREOF | BRECHT, CHARLES MATTHEW | — | §103 | Non-Final OA | — | Pending | Apr 10, 2024 |
| 18622166 | INGOT PULLER APPARATUS INCLUDING MOVEABLE COOLING JACKET FOR CONTROLLED INGOT COOLING PROFILES | BRATLAND JR, KENNETH A | 1714 | §102§103§112 | Non-Final OA | — | Pending | Mar 29, 2024 |
| 18411957 | METHODS FOR PRODUCING SINGLE CRYSTAL SILICON WAFERS FOR INSULATED GATE BIPOLAR TRANSISTORS | SONG, MATTHEW J | 1714 | §103 | Final Rejection | — | Pending | Jan 12, 2024 |
| 18410347 | INGOT PULLER APPARATUS AND METHODS FOR GROWING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED LOWER CHAMBER DEPOSITS | BRATLAND JR, KENNETH A | 1714 | §102 | Final Rejection | 8d | Pending | Jan 11, 2024 |
| 18398449 | METHODS OF PROCESSING EPITAXIAL SEMICONDUCTOR WAFERS | BRATLAND JR, KENNETH A | 1714 | §103 | Final Rejection | — | Pending | Dec 28, 2023 |
| 18507219 | INGOT PULLER APPARATUS HAVING A REFLECTOR ASSEMBLY SUSPENDED FROM SUPPORT SHAFTS | QI, HUA | 1714 | §103 | Final Rejection | 8d | Pending | Nov 13, 2023 |
| 18448788 | CRUCIBLES HAVING ANCHORS AND METHODS FOR PRODUCING AND USING SAME | SONG, MATTHEW J | 1714 | §103 | Final Rejection | 34d | Pending | Aug 11, 2023 |
| 18342986 | RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RESISTIVITY AND ULTRA-HIGH RESISTIVITY SINGLE CRYSTAL SILICON INGOT GROWTH | QI, HUA | 1714 | §103§112 | Non-Final OA | 9d overdue | Pending | Jun 28, 2023 |
| 18326343 | INGOT PULLER APPARATUS INCLUDING AUTOMATED FEED ASSEMBLY FOR CHARGING SEMICONDUCTOR MATERIAL | QI, HUA | 1714 | §112 | Non-Final OA | — | Pending | May 31, 2023 |
| 18326487 | METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED CARBON CONTAMINATION AND SUSCEPTORS FOR USE IN SUCH METHODS | BRATLAND JR, KENNETH A | 1714 | §103 | Non-Final OA | 30d overdue | Pending | May 31, 2023 |
| 18104462 | EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME | LAW, NGA LEUNG V | 1717 | §103 | Final Rejection | 34d | Pending | Feb 01, 2023 |
| 18104443 | EPITAXIAL STRUCTURE AND METHOD OF MANUFACTURING THE SAME | HORGER, KIM S. | 1784 | §103§112 | Final Rejection | 44d overdue | Pending | Feb 01, 2023 |
| 17934875 | SYSTEMS AND METHODS FOR DYNAMIC CONTROL OF COOLING FLUID FLOW IN AN EPITAXIAL REACTOR FOR SEMICONDUCTOR WAFER PROCESSING | REYES, JOSHUA NATHANIEL PI | 1718 | §103 | Final Rejection | 5d overdue | Pending | Sep 23, 2022 |
| 17455347 | NON-CONTACT SYSTEMS AND METHODS FOR DETERMINING DISTANCE BETWEEN SILICON MELT AND REFLECTOR IN A CRYSTAL PULLER | QI, HUA | 1714 | §103§112 | Final Rejection | — | Pending | Nov 17, 2021 |
| 16946340 | SEMICONDUCTOR SUBSTRATE POLISHING WITH POLISHING PAD TEMPERATURE CONTROL | MCCONNELL, AARON R | 3723 | §103 | Non-Final OA | — | Pending | Jun 17, 2020 |
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