Tech Center 2100 • Art Units: 2111 2117
This examiner grants 87% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18785972 | STORAGE DEVICE AND STORAGE SYSTEM INCLUDING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18952275 | Short-Distance Communication Method, Apparatus, and System | Non-Final OA | Huawei Technologies Co., Ltd. |
| 18908761 | ADAPTIVE DATA RATE METHODS OF COMMUNICATION DEVICE FOR ACHIEVING HIGH THROUGHPUT | Non-Final OA | Realtek Semiconductor Corp. |
| 18355249 | QUANTUM FEDERATED LEARNING SYSTEM AND METHOD | Non-Final OA | KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION |
| 18778993 | EXTERNAL MAGNETIC FIELD DETECTION FOR MRAM DEVICE | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18439316 | USING BUILT-IN SELF TEST OR TEST RESULTS TO IDENTIFY WEAK MEMORY BITS AND ENABLE ASSIST CIRCUITS WHEN NECESSARY | Non-Final OA | Taiwan Semiconductor Manufacturing Company Ltd. |
| 18592718 | COMMUNICATION DEVICE AND IMAGE FORMING APPARATUS | Non-Final OA | RICOH COMPANY, LTD. |
| 18907092 | SYSTEMS AND METHODS FOR ERROR DETECTION AND CONTROL FOR EMBEDDED MEMORY AND COMPUTE ELEMENTS | Non-Final OA | Intel Corporation |
| 18853475 | CORRECTABLE ERROR COUNTER AND LEAKY BUCKET FOR PERIPHERAL COMPONENT INTERCONNECT EXPRESS (PCIE) AND COMPUTE EXPRESS LINK (CXL) DEVICES | Non-Final OA | Intel Corporation |
| 18782624 | FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY | Non-Final OA | Micron Technology, Inc. |
| 17885439 | SEMICONDUCTOR DEVICE WITH POWER-SAVING MODE AND ASSOCIATED METHODS AND SYSTEMS | Final Rejection | Micron Technology, Inc. |
| 18958550 | OPTIMIZING VOLTAGE TUNING USING PRIOR VOLTAGE TUNING RESULTS | Non-Final OA | PURE STORAGE, INC. |
| 18961956 | MEMORY DEVICE AND METHOD OF TESTING THE MEMORY DEVICE FOR FAILURE | Non-Final OA | SK hynix Inc. |
| 18679452 | MEMORY DEVICE AND TESTING METHOD THEREOF | Final Rejection | SK hynix Inc. |
| 18509019 | MEMORY SYSTEMS AND OPERATION METHODS THEREOF, AND READABLE STORAGE MEDIA | Final Rejection | Yangtze Memory Technologies Co., Ltd. |
| 18744887 | CRITICAL PATH SENSITIZATION IN ELECTRONIC SYSTEMS | Non-Final OA | NXP B.V. |
| 18960776 | RECOVERING SCRAMBLING SEQUENCE INITIALIZATION FROM FROZEN BITS OF AN UNCODED DOWNLINK CONTROL INFORMATION VECTOR | Non-Final OA | VIAVI Solutions Inc. |
| 18849579 | METHOD AND SYSTEM FOR QUANTUM ERROR MITIGATION | Non-Final OA | Yissum Research Development Company of the Hebrew University of Jerusalem Ltd. |
| 18595877 | SEMICONDUCTOR MEMORY DEVICE, CONTROL METHOD, AND CONTROL DEVICE | Non-Final OA | Winbond Electronics Corp. |
| 18490762 | DECODING METHOD, MEMORY STORAGE DEVICE AND MEMORY CONTROL CIRCUIT UNIT | Final Rejection | PHISON ELECTRONICS CORP. |
| 18106244 | TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY | Non-Final OA | Altera Corporation |
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