Prosecution Insights
Prosecution Insights
Tech Center 2100 • Art Units: 2111 2114 2117 2133 2138 2192
This examiner grants 87% of resolved cases
Demetrios C Kerveros works in Tech Center 2100 and Art Unit 2111. He has 1105 resolved cases. The allowance rate pct is 87.4. This 87.4 allowance rate pct provides a measure of the outcomes for applications on his docket. The 1105 resolved cases serve as a basis for evaluating prosecution in Art Unit 2111.
The interview lift pct is 2.6. This 2.6 interview lift pct indicates the correlation between conducting an interview and the probability of an allowance. Practitioners can use the 2.6 figure when deciding whether to engage in verbal advocacy with the examiner. This metric is a component of the data for Tech Center 2100.
The median days to allowance is 851. This 851 median days to allowance represents the time required for an application to reach a grant. The 851 figure is a timeline for the prosecution process from filing to resolution. These metrics provide a view of the examiner's history across the 1105 resolved cases.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18907092 | SYSTEMS AND METHODS FOR ERROR DETECTION AND CONTROL FOR EMBEDDED MEMORY AND COMPUTE ELEMENTS | Non-Final OA | Intel Corporation |
| 18853475 | CORRECTABLE ERROR COUNTER AND LEAKY BUCKET FOR PERIPHERAL COMPONENT INTERCONNECT EXPRESS (PCIE) AND COMPUTE EXPRESS LINK (CXL) DEVICES | Non-Final OA | Intel Corporation |
| 18326039 | MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL CIRCUITS | Non-Final OA | Intel Corporation |
| 18106244 | TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY | Final Rejection | Altera Corporation |
| 18182448 | COMPUTER MEMORY HARDWARE CORRECTION USING BASELINE WANDER | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 19088010 | MULTIPLE BIT FLIP THRESHOLD SETS FOR IMPROVED ERROR CORRECTION IN A MEMORY SUB-SYSTEM | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 19075572 | OPERATIONAL MODES OF A MEMORY REGISTER | Non-Final OA | Micron Technology, Inc. |
| 19054497 | DISTRIBUTING SELECT GATE SCAN ACROSS ERASE CYCLES | Non-Final OA | Micron Technology, Inc. |
| 18889273 | ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS | Non-Final OA | Micron Technology, Inc. |
| 18782624 | FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY | Non-Final OA | Micron Technology, Inc. |
| 18595877 | SEMICONDUCTOR MEMORY DEVICE, CONTROL METHOD, AND CONTROL DEVICE | Final Rejection | Winbond Electronics Corp. |
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