Prosecution Insights
Prosecution Insights
Tech Center 4100 • Art Units: 1745 2815 4100
This examiner grants 82% of resolved cases
Woo Kyung Lee, in Tech Center 4100 and Art Unit 1745, has 202 resolved cases. The allowance rate is 81.7 percent. The interview lift is 13.1 percent, which is a moderate boost to the chances of allowance.
The median days to allowance is 1169. This timeline is based on the 202 resolved cases. The 81.7 percent allowance rate indicates a favorable environment for applicants. The 13.1 percent interview lift suggests that interviews are a useful tool for resolving issues.
In Art Unit 1745, the 1169 median days to allowance is a key planning figure. The allowance rate across resolved cases shows a consistent pattern of success. The interview lift is a helpful metric for practitioners to consider when developing their strategy. This data set provides a reliable outlook for future filings.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18626935 | INTEGRATED CIRCUITS INCLUDING BACKSIDE WIRING | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18596179 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18441700 | SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18520977 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE DISPLAY DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 17997519 | LIGHT EMITTING DEVICE AND DISPLAY APPARATUS COMPRISING SAME | Final Rejection | Samsung Display Co., LTD. |
| 18528449 | DISPLAY DEVICE | Final Rejection | LG Display Co., Ltd. |
| 18468650 | CERAMIC SINTERED BODY SUBSTRATE, LIGHT-EMITTING DEVICE, AND MANUFACTURING METHODS THEREOF | Final Rejection | NICHIA CORPORATION |
| 18212295 | FORKSHEET DEVICES WITH DIELECTRIC SPINE AT CELL BOUNDARY | Non-Final OA | Intel Corporation |
| 18728173 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE | Non-Final OA | Semiconductor Energy Laboratory Co., Ltd. |
| 18695175 | DISPLAY DEVICE, DISPLAY MODULE, ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING DISPLAY DEVICE | Non-Final OA | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18718507 | IMAGING ELEMENT, METHOD FOR MANUFACTURING IMAGING ELEMENT, AND ELECTRONIC DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 17767257 | SAFETY CIRCUITS FOR IMAGING WITH SENSOR INTEGRATED DRESSINGS AND SYSTEMS | Final Rejection | T.J.Smith and Nephew,Limited |
| 18352572 | GROUP III NITRIDE-BASED SEMICONDUCTOR DEVICE | Non-Final OA | Infineon Technologies AG |
| 18659532 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SK hynix Inc. |
| 18705428 | ATOMIC LAYER DEPOSITION SEAM REDUCTION | Non-Final OA | Lam Research Corporation |
| 18789554 | Isolation Structures Of Semiconductor Devices | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18789104 | SEMICONDUCTOR STRUCTURE WITH ISOLATION FEATURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18787608 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18783474 | METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE USING DEHYDRATING CHEMICAL, AND METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18398213 | CONSUMABLE MEMBER, PLASMA PROCESSING APPARATUS, AND METHOD OF MANUFACTURING CONSUMABLE MEMBER | Final Rejection | Tokyo Electron Limited |
| 18008451 | SEMICONDUCTOR DEVICE | Final Rejection | ROHM CO., LTD. |
| 17599745 | ORGANIC LIGHT-EMITTING DISPLAY DEVICE AND METHOD OF MANUFACTURING SAME | Final Rejection | TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. |
| 18043728 | TRANSISTOR AND METHOD FOR FABRICATING THE SAME | Non-Final OA | BEIJING HUA TAN YUAN XIN ELECTRONICS TECHNOLOGY CO., LTD. |
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