Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2800 2817 2895 2896 2899
This examiner grants 90% of resolved cases
Ratisha Mehta is a patent examiner in Tech Center 2800, working within Art Unit 2800. The examiner has 645 resolved cases and an allowance rate of 89.6 percent. This 89.6 percent rate reflects the proportion of applications that reach a grant. For the 645 cases handled, this data provides a basis for understanding the probability of success during the examination process. The volume of resolved cases reflects the examiner's experience within Tech Center 2800.
The median days to allowance for this examiner is 734. This 734-day timeline represents the duration for an application to move from filing to a grant. Applicants should consider this period when planning their patent strategy and resource allocation. The volume of 645 resolved cases suggests that this duration is a consistent aspect of the examiner's workflow in Art Unit 2800. This median provides a specific metric for evaluating the expected length of prosecution.
The data shows an interview lift of 5.6 percent. This 5.6 percent lift represents the change in the likelihood of allowance when an interview is conducted. It suggests that direct communication is a method for addressing the probability of a grant. For practitioners, utilizing an interview is an option to navigate the prosecution process and achieve a positive outcome. Practitioners can use this lift to evaluate the potential benefits of direct engagement.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18711005 | DISPLAY DEVICE | Non-Final OA | LG ELECTRONICS INC. |
| 18738153 | SEMICONDUCTOR PACKAGE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18521994 | INTERCONNECT STRUCTURE AND ELECTRONIC DEVICE INCLUDING THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 18762750 | DISPLAY PANEL | Non-Final OA | BOE TECHNOLOGY GROUP CO., LTD. |
| 18695944 | LIGHT-EMITTING UNIT AND METHOD FOR PREPARING SAME, DISPLAY PANEL, AND DISPLAY DEVICE | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18617991 | DISPLAY DEVICE AND METHOD FOR MANUFACTURING SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18494387 | DISPLAY DEVICE AND METHOD OF FABRICATING THE SAME | Final Rejection | Samsung Display Co., LTD. |
| 18492927 | THIN FILM TRANSISTOR, MANUFACTURING METHOD OF THE SAME, AND DISPLAY DEVICE HAVING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18213900 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 18189066 | DISPLAY DEVICE | Final Rejection | Samsung Display Co., LTD. |
| 18518230 | DISPLAY DEVICE | Non-Final OA | LG Display Co., Ltd. |
| 18743090 | TRANSFERRING HEAD AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE | Non-Final OA | InnoLux Corporation |
| 18703792 | Power Module and Method for Assembling a Power Module | Non-Final OA | ZF Friedrichshafen AG |
| 18148717 | METHODS AND APPARATUS TO DETECT DEFECTS DURING SEMICONDUCTOR CHIP FABRICATION AND/OR TO DEBUG SEMICONDUCTOR CHIPS AFTER FABRICATION | Non-Final OA | Intel Corporation |
| 18361834 | Laterally-Diffused Metal-Oxide Semiconductor Devices with Reduced Gate Charge and Time-Dependent Dielectric Breakdown | Non-Final OA | Avago Technologies International Sales Pte. Limited |
| 18535332 | STACKED FET WITH SHIFTED CHANNEL STRUCTURE | Non-Final OA | International Business Machines Corporation |
| 18478213 | MEMORY DEVICE | Non-Final OA | Kioxia Corporation |
| 18478087 | PACKAGES WITH STEPPED CONDUCTIVE TERMINALS | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18424704 | MICROELECTRONIC DEVICES INCLUDING CONTACT STRUCTURES, AND RELATED MEMORY DEVICES, AND ELECTRONIC SYSTEMS | Non-Final OA | Micron Technology, Inc. |
| 18780748 | CUT METAL GATE IN MEMORY MACRO EDGE AND MIDDLE STRAP | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18408932 | SEMICONDUCTOR DEVICE AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18523255 | LOW MELT POINT METAL BASED THERMAL INTERFACE MATERIAL | Non-Final OA | Honeywell International Inc. |
| 18598866 | MOSFETS WITH IMPLANTED CHARGE COMPENSATION REGIONS | Non-Final OA | Wolfspeed, Inc. |
| 18534754 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | Final Rejection | UNITED MICROELECTRONICS CORP. |
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