Prosecution Insights
Last updated: April 19, 2026

Examiner: GHYKA, ALEXANDER G

Tech Center 2800 • Art Units: 2812

This examiner grants 84% of resolved cases

Performance Statistics

83.5%
Allow Rate
+15.5% vs TC avg
1312
Total Applications
+13.8%
Interview Lift
893
Avg Prosecution Days
Based on 1278 resolved cases, 2023–2026

Rejection Statute Breakdown

1.2%
§101 Eligibility
15.8%
§102 Novelty
55.4%
§103 Obviousness
12.2%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18308401 MAGNETIC MEMORY DEVICES Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18371738 COVER MODULE AND DISPLAY DEVICE INCLUDING THE SAME Non-Final OA LG Display Co., Ltd.
17957983 THIN FILM RESISTOR MISMATCH IMPROVEMENT USING A SELF-ALIGNED DOUBLE PATTERN (SADP) TECHNIQUE Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18373094 DISPLAY APPARATUS Non-Final OA Samsung Display Co., Ltd.
18235245 DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Samsung Display Co., LTD.
18486576 THREE-DIMENSIONAL MEMORY DEVICE WORDLINES WITH REDUCED BLOCKING LAYER DAMAGE Non-Final OA Applied Materials, Inc.
18364507 NEUTRAL STRESS DIAMOND-LIKE CARBON Non-Final OA Applied Materials, Inc.
18321343 SEMICONDUCTOR STRUCTURE INCLUDING VERTICAL DIODE DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18315672 STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WITH THROUGH SEMICONDUCTOR VIA Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18312718 TEST LINE STRUCTURE FOR INTEGRATED CHIP COMPRISING OPTICAL DEVICES Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18312012 WAFER BONDING APPARATUS AND METHOD Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18173526 METHOD FOR MANUFACTURING A CARRIER SUBSTRATE ON A SEMICONDUCTOR WAFER AND DEVICE INCLUDING A SEMICONDUCTOR WAFER Non-Final OA Robert Bosch GmbH
18285902 MULTILAYER BODY FOR IMAGE DISPLAY DEVICE AND IMAGE DISPLAY DEVICE Non-Final OA DAI NIPPON PRINTING CO., LTD.
18350774 DISPLAY DEVICE, METHOD FOR MANUFACTURING DISPLAY DEVICE, AND METHOD FOR INSPECTING DISPLAY DEVICE Non-Final OA Japan Display Inc.
17997158 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR MANUFACTURING DEVICE, AND SYSTEM Non-Final OA Tokyo Electron Limited
18247077 METHOD FOR MANUFACTURING WIRING BOARD, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND RESIN SHEET Non-Final OA Resonac Corporation
17953516 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM Non-Final OA Kokusai Electric Corporation
18298709 SEMICONDUCTOR DEVICE PACKAGE AND METHOD FOR MANUFACTURING THE SAME Non-Final OA NEXPERIA B.V.
18248169 METHOD FOR PRODUCING A SUBSTRATE FOR EPITAXIAL GROWTH OF A GALLIUM-BASED III-N ALLOY LAYER Non-Final OA Soitec
17927620 A Memory Device Comprising an Electrically Floating Body Transistor Non-Final OA Zeno Semiconductor, Inc.
18123357 TEST KEY STRUCTURE Non-Final OA United Semiconductor (Xiamen) Co., Ltd.
18455755 LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING LIGHT-EMITTING DEVICE Non-Final OA NIKKISO CO., LTD.
17965691 SUBSTRATE STRUCTURE FOR LIGHT-EMITTING DIODES AND METHOD OF MAKING THE SAME Non-Final OA BOLB INC.

Facing This Examiner?

IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.

Build Your Strategy

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month