Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2825
This examiner grants 93% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18806022 | MEMORY DEVICE AND MEMORY SYSTEM | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18738711 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18790879 | MEMORY POWER DIGITAL MULTIPLEXER | Non-Final OA | Arm Limited |
| 18739769 | WORD LINE BASED PROGRAM VOLTAGE ADJUSTMENT | Non-Final OA | Micron Technology, Inc. |
| 18423992 | GATE VOLTAGE STEP AND PROGRAM VERIFY LEVEL ADJUSTMENT IN A MEMORY DEVICE | Final Rejection | Micron Technology, Inc. |
| 18538652 | DYNAMIC PROGRAMMING TIME FOR A MEMORY DEVICE | Non-Final OA | Micron Technology, Inc. |
| 18428967 | INTEGRATED CIRCUIT STRUCTURE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18892306 | MEMORY AND OPERATION METHOD THEREOF, AND MEMORY SYSTEM | Non-Final OA | Yangtze Memory Technologies Co., Ltd. |
| 18671452 | MEMORY DEVICE AND ERASE OPERATION THEREOF | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18241191 | METHODS OF OPERATING A MEMORY, MEMORY AND MEMORY SYSTEMS | Final Rejection | Yangtze Memory Technologies Co., Ltd. |
| 18624032 | OPERATING METHOD FOR CONTROLLING MEMORY CELL AND MEMORY SYSTEM | Final Rejection | Winbond Electronics Corp. |
| 18743421 | PROACTIVE ERROR DETECTION IN A MEMORY DEVICE | Non-Final OA | SanDisk Technologies, Inc. |
| 18639632 | THREE DIMENSION NAND DUAL-STRING PROGRAM | Final Rejection | Sandisk Technologies, Inc. |
| 18220387 | BITLINE TIMING-BASED MULTI-STATE PROGRAMMING IN NON-VOLATILE MEMORY STRUCTURES | Non-Final OA | SanDisk Technologies LLC |
| 18581327 | Static Random Access Memory | Non-Final OA | UNITED MICROELECTRONICS CORP. |
| 18686611 | FLASH MEMORY ARRAY, AND WRITING METHOD AND ERASING METHOD THEREFOR | Non-Final OA | Beijing PXMicro Technology Co. Ltd. |
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