Tech Center 2800 • Art Units: 2812 2896
This examiner grants 76% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18478280 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18065531 | IMAGE SENSOR INCLUDING STACKED CHIPS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 17636963 | Large Dzyaloshinskii – Moriya Interaction and Perpendicular Magnetic Anisotropy Induced by Chemisorbed Species on Ferromagnets | Final Rejection | The Regents of the University of California |
| 17517296 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | Final Rejection | Seoul Semiconductor Co., Ltd. |
| 18172664 | DISPLAY DEVICE AND METHOD OF PROVIDING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18051668 | DISPLAY DEVICE | Final Rejection | SAMSUNG DISPLAY CO., LTD. |
| 18079978 | HIGH-FREQUENCY CIRCUIT DEVICE AND DETECTION SYSTEM | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18040166 | SOLID-STATE IMAGING DEVICE AND ELECTRONIC DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18673084 | SEMICONDUCTOR-SUPERCONDUCTOR HYBRID DEVICE AND ITS FABRICATION | Non-Final OA | Microsoft Technology Licensing, LLC |
| 18084934 | METHODS FOR DETERMINING THE CONVERSION FACTOR BETWEEN THE VOLTAGE APPLIED TO A SYSTEM AND A PARAMETER OF SAID SYSTEM, THE OSCILLATION PERIOD BETWEEN TWO SPIN STATES AND THE EXCHANGE INTERACTION BETWEEN TWO CHARGED PARTICLES AND SYSTEM THEREFOR | Final Rejection | CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE |
| 18153890 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18067557 | DEVICE HAVING AN IN-SUBSTRATE INDUCTOR AND METHOD FOR MAKING THE INDUCTOR | Non-Final OA | QUALCOMM Incorporated |
| 18064968 | ELECTRONIC COMPONENT AND METHOD FOR MANUFACTURING ELECTRONIC COMPONENT | Final Rejection | Murata Manufacturing Co., Ltd. |
| 18470729 | MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SK hynix Inc. |
| 18150912 | SEMICONDUCTOR DEVICE WITH INDUCTIVE COMPONENT AND METHOD OF FORMING | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17875199 | SOIC CHIP ARCHITECTURE | Final Rejection | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18155148 | CHIP-SCALE PACKAGE | Final Rejection | NEXPERIA B.V. |
| 18494806 | Chip-On-Interposer Assembly Containing A Decoupling Capacitor | Non-Final OA | KYOCERA AVX Components Corporation |
| 17694548 | Large Dzyaloshinskii-Moriya Interaction and Perpendicular Magnetic Anisotrophy Induced by Chemisorbed Species on Ferromagnets | Final Rejection | Georgetown University |
| 18470557 | FILM-ON-INSULATOR SUBSTRATE INCLUDING A PRE-NOTCHED FILM AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18505074 | METHOD OF FORMING SEMICONDUCTOR DEVICE | Non-Final OA | UNITED MICROELECTRONICS CORP. |
| 18575281 | Magnetic Memory Cell and Magnetic Memory | Non-Final OA | ZHEJIANG HIKSTOR TECHNOLOGY CO., LTD. |
| 18043324 | NOR-TYPE MEMORY DEVICE, METHOD OF MANUFACTURING NOR-TYPE MEMORY DEVICE, AND ELECTRONIC APPARATUS INCLUDING MEMORY DEVICE | Non-Final OA | INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES |
| 18236667 | GERMANIUM-SILICON LIGHT SENSING APPARATUS | Non-Final OA | Artilux, Inc. |
| 18086668 | Non-volatile Memory Cell | Non-Final OA | AMIC Technology Corporation |
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