Prosecution Insights
Prosecution Insights
12 pending office actions • 10 art units • 11 examiners • 0 of 12 (0%) have an AI response strategy ready • 50 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 9 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 9 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §103 only | 12 (100%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| KOO, LAMONT B | 2 | 80.5% | +4.9% |
| DION, MARCEL T | 1 | 39.7% | +35.6% |
| WEGNER, AARON MICHAEL | 1 | 71.4% | -2.2% |
| CHACKO DAVIS, DABORAH | 1 | 71.7% | +20.6% |
| LINDSEY, COLE LEON | 1 | 89.3% | +12.3% |
| LAOBAK, ANDREW KEELAN | 1 | 78.4% | +31.3% |
| BERMAN, JASON | 1 | 63.3% | +21.9% |
| DUREN, TIMOTHY EDWARD | 1 | 82.1% | +12.7% |
| JUNGE, BRYAN R. | 1 | 57.7% | +9.0% |
| PRIDEMORE, NATHAN ANDREW | 1 | 73.8% | +20.3% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 4 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18129330 | STRUCTURE AND METHOD FOR IMPROVING NEAR-INFRARED QUANTUM EFFICIENCY OF BACKSIDE ILLUMINATED IMAGE SENSOR | LINDSEY, COLE LEON | 112d overdue |
| 18164523 | METHOD FOR FORMING DIFFUSION BREAK STRUCTURE IN FIN FIELD EFFECT TRANSISTOR | KOO, LAMONT B | 60d overdue |
| 18175878 | Method for Manufacturing Metal Zero Layer | DUREN, TIMOTHY EDWARD | 10d overdue |
| 17952916 | Self-Aligned Gate Contact Fin Field Effect Transistor and Method for Manufacturing the Same | KOO, LAMONT B | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 7 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18129330 | STRUCTURE AND METHOD FOR IMPROVING NEAR-INFRARED QUANTUM EFFICIENCY OF BACKSIDE ILLUMINATED IMAGE SENSOR | LINDSEY, COLE LEON | 112d overdue |
| 18125877 | Reaction Device for Improving Epitaxial Growth Uniformity | BERMAN, JASON | 60d overdue |
| 18129433 | METHOD FOR IMPROVING HEIGHT DIFFERENCE BETWEEN GATES | LAOBAK, ANDREW KEELAN | 26d overdue |
| 18175878 | Method for Manufacturing Metal Zero Layer | DUREN, TIMOTHY EDWARD | 10d overdue |
| 17877324 | Method for Manufacturing Integrated Metal Resistance Layer | PRIDEMORE, NATHAN ANDREW | 1d overdue |
| 18141952 | METHOD FOR ADJUSTING LOCAL THICKNESS OF PHOTORESIST | CHACKO DAVIS, DABORAH | 13d |
| 18406465 | Wafer Polishing Locating Ring and Chemical Mechanical Polishing Device | DION, MARCEL T | 36d |
| Art Unit | Apps |
|---|---|
| 2897 | 2 |
| 2813 | 2 |
| 3723 | 1 |
| 1737 | 1 |
| 2812 | 1 |
| 1713 | 1 |
| 1794 | 1 |
| 2817 | 1 |
| 2898 | 1 |
| 2899 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18406465 | Wafer Polishing Locating Ring and Chemical Mechanical Polishing Device | DION, MARCEL T | 3723 | §103 | Non-Final OA | 36d | Pending | Jan 08, 2024 |
| 18465011 | METHOD FOR MEASURING THICKNESS OF SILICON EPITAXIAL LAYER | WEGNER, AARON MICHAEL | 2897 | §103 | Non-Final OA | — | Pending | Sep 11, 2023 |
| 18141952 | METHOD FOR ADJUSTING LOCAL THICKNESS OF PHOTORESIST | CHACKO DAVIS, DABORAH | 1737 | §103 | Non-Final OA | 13d | Pending | May 01, 2023 |
| 18129330 | STRUCTURE AND METHOD FOR IMPROVING NEAR-INFRARED QUANTUM EFFICIENCY OF BACKSIDE ILLUMINATED IMAGE SENSOR | LINDSEY, COLE LEON | 2812 | §103 | Non-Final OA | 112d overdue | Pending | Mar 31, 2023 |
| 18129433 | METHOD FOR IMPROVING HEIGHT DIFFERENCE BETWEEN GATES | LAOBAK, ANDREW KEELAN | 1713 | §103 | Non-Final OA | 26d overdue | Pending | Mar 31, 2023 |
| 18125877 | Reaction Device for Improving Epitaxial Growth Uniformity | BERMAN, JASON | 1794 | §103 | Non-Final OA | 60d overdue | Pending | Mar 24, 2023 |
| 18175878 | Method for Manufacturing Metal Zero Layer | DUREN, TIMOTHY EDWARD | 2817 | §103 | Final Rejection | 10d overdue | Pending | Feb 28, 2023 |
| 18175092 | METHOD FOR MANUFACTURING SIGMA-SHAPED GROOVE | JUNGE, BRYAN R. | 2897 | §103 | Non-Final OA | 29d overdue | Pending | Feb 27, 2023 |
| 18164523 | METHOD FOR FORMING DIFFUSION BREAK STRUCTURE IN FIN FIELD EFFECT TRANSISTOR | KOO, LAMONT B | 2813 | §103 | Non-Final OA | 60d overdue | Pending | Feb 03, 2023 |
| 17952916 | Self-Aligned Gate Contact Fin Field Effect Transistor and Method for Manufacturing the Same | KOO, LAMONT B | 2813 | §103 | Non-Final OA | — | Pending | Sep 26, 2022 |
| 17877324 | Method for Manufacturing Integrated Metal Resistance Layer | PRIDEMORE, NATHAN ANDREW | 2898 | §103 | Non-Final OA | 1d overdue | Pending | Jul 29, 2022 |
| 17839313 | METHOD FOR MANUFACTURING METAL GATE MOS TRANSISTOR | NIELSEN, DEREK LANG | 2899 | §103 | Final Rejection | — | Pending | Jun 13, 2022 |
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