Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 1731 2817 2892
This examiner grants 73% of resolved cases
Within Tech Center 2800 and Art Unit 1731, Examiner Kimberly Newman Frey has handled 30 resolved cases. The allowance rate for these cases is 73.3 percent. This figure serves as a reference for the likelihood of success. A median days to allowance of 1251 defines the prosecution timeline. This duration is a consideration for applicants when managing their portfolios.
Data shows an interview lift of 22.2 percent. With 30 resolved cases, this lift indicates the impact of communication on results. The 1251 days to allowance provides a standard for pendency. The 73.3 percent allowance rate and the Art Unit 1731 designation help determine a prosecution approach for the case. These data points from Tech Center 2800 support planning for the patent process.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18399173 | SEMICONDUCTOR DEVICE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18513863 | SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18388295 | SEMICONDUCTOR DEVICE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18492327 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18368635 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18558248 | DISPLAY SUBSTRATE AND DISPLAY DEVICE | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 18024076 | DISPLAY SUBSTRATE AND DISPLAY DEVICE | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 18499100 | SEMICONDUCTOR DEVICE WITH MULTI-STEP GATE AND RECESSED MULTI-STEP FIELD PLATE WITH FIELD PLATE SPACERS AND METHOD OF FABRICATION | Final Rejection | NXP USA, Inc. |
| 18418486 | DISPLAY DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18196971 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., LTD. |
| 18108627 | METHOD FOR MANUFACTURING LIGHT EMITTING DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 18071150 | DISPLAY PANEL AND DISPLAY APPARATUS | Final Rejection | Samsung Display Co., LTD. |
| 18396563 | DISPLAY DEVICE | Non-Final OA | LG Display Co., Ltd. |
| 18523954 | OLED DISPLAY PANELS AND TERMINAL DEVICES | Non-Final OA | WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD. |
| 18360570 | PACKAGE COMPRISING A SUBSTRATE WITH INDUCTORS AND A MAGNETIC LAYER | Non-Final OA | QUALCOMM Incorporated |
| 18147503 | SUBSTRATE PACKAGE-INTEGRATED OXIDE CAPACITORS AND RELATED METHODS | Non-Final OA | Intel Corporation |
| 18226360 | LIGHT-EMITTING DEVICE | Final Rejection | Semiconductor Energy Laboratory Co., Ltd. |
| 17936553 | SEMICONDUCTOR DEVICE, METHOD OF FORMING THE SAME AND LAYOUT DESIGN MODIFICATION METHOD OF THE SAME | Final Rejection | MEDIATEK INC. |
| 18527532 | IMAGE SENSOR WITH METAL-INSULATOR-METAL STORAGE ELEMENTS | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18385945 | HOLE-TYPE SADP FOR 2D DRAM CAPACITOR | Final Rejection | Applied Materials, Inc. |
| 18319869 | EPITAXIAL SILICON CHANNEL GROWTH | Final Rejection | Applied Materials, Inc. |
| 18974866 | SEMICONDUCTOR DEVICE INCLUDING DIELECTRIC LAYER WITH UNEVEN THICKNESS | Non-Final OA | NANYA TECHNOLOGY CORPORATION |
| 18395797 | SEMICONDUCTOR DEVICE INCLUDING DIELECTRIC LAYER WITH UNEVEN THICKNESS | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18369148 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Non-Final OA | NANYA TECHNOLOGY CORPORATION |
| 18181054 | MEMORY BIT CELLS WITH THREE-DIMENSIONAL CROSS FIELD EFFECT TRANSISTORS | Non-Final OA | Advanced Micro Devices, Inc. |
| 18524126 | Underfill for Large Area Attaches for Semiconductor Packages | Non-Final OA | Wolfspeed, Inc. |
| 18489440 | OUTPUT CIRCUIT | Final Rejection | Socionext Inc. |
| 18525871 | DISPLAY PANELS AND METHODS FOR PREPARING THE SAME | Final Rejection | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18592974 | SEMICONDUCTOR DEVICE | Non-Final OA | FUJI ELECTRIC CO., LTD. |
| 17965759 | TRANSISTOR TYPE SENSOR | Final Rejection | JNC CORPORATION |
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