Prosecution Insights
Last updated: October 01, 2026

Examiner: RAHMAN, MOIN M

Tech Center 2800 • Art Units: 2699 2800 2898

This examiner grants 87% of resolved cases

Analysis

Moin M. Rahman is an examiner in Art Unit 2699, located within Tech Center 2800. With 756 resolved cases, the examiner has a well-documented history that allows for a detailed analysis of performance metrics. The data shows an allowance rate of 87.0 percent, which suggests a favorable environment for patent applicants. This 87.0 percent rate implies that the majority of applications assigned to this examiner will eventually reach a grant, provided they meet the necessary legal requirements in Art Unit 2699.

The median time to allowance is 880 days, offering a predictable timeline for the prosecution process. This 880-day figure is a helpful benchmark for practitioners when advising clients on the expected duration of their patent applications. Furthermore, the interview lift is 14.2 percent. Although the base allowance rate is already high, the 14.2 percent lift indicates that interviews still provide a measurable benefit in resolving issues and potentially accelerating the path to grant. Practitioners should leverage the 756 resolved cases to inform their strategy, noting that the combination of a high allowance rate and a reasonable pendency makes for an efficient prosecution experience.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

87.0%
Allow Rate
+19.0% vs TC avg
812
Total Applications
+14.2%
Interview Lift
880
Avg Prosecution Days
Based on 756 resolved cases, 2023–2026

Rejection Statute Breakdown

0.2%
§101 Eligibility
27.0%
§102 Novelty
56.1%
§103 Obviousness
16.0%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18613324 MULTI-STACK SEMICONDUCTOR DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18514715 SUBSTRATE AND SEMICONDUCTOR DEVICE INCLUDING THE SAME Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18508833 SEMICONDUCTOR MEMORY DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18382166 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Samsung Electronics Co., Ltd.
18560169 DISPLAY SUBSTRATE AND DISPLAY DEVICE Non-Final OA BOE TECHNOLOGY GROUP CO., LTD.
18406150 DISPLAY DEVICE Final Rejection Samsung Display Co., LTD.
18522409 DISPLAY DEVICE Final Rejection LG Display Co., Ltd.
18055934 LUMIPHORIC MATERIAL ARRANGEMENTS FOR COVER STRUCTURES OF LIGHT-EMITTING DIODE PACKAGES Non-Final OA CreeLED, Inc.
18387772 THREE-DIMENSIONAL MEMORY DEVICES AND FABRICATING METHODS THEREOF Non-Final OA YANGTZE MEMORY TECHNOLOGIES CO., LTD.
17990794 ORGANIC SEMICONDUCTOR ELEMENT, ORGANIC EL ELEMENT, AND PHOTODIODE Final Rejection SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
18536918 PITCH CONFIGURATION FOR BACK-END-OF-LINE WIRING Non-Final OA International Business Machines Corporation
15429403 ENHANCED LATERAL CAVITY ETCH Final Rejection Texas Instruments Incorporated
18632033 IMAGE SENSING DEVICE Non-Final OA SK hynix Inc.
18424871 SEMICONDUCTOR CHIP INCLUDING CHIP GUARD STRUCTURE AND UPPER GUARD LINE DISPOSED SPACED APART FROM EACH OTHER Non-Final OA SK hynix Inc.
18514991 SEMICONDUCTOR MEMORY DEVICE Non-Final OA SK hynix Inc.
18346219 SEMICONDUCTOR DEVICE AND FORMATION METHOD THEREOF Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18099482 SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING OXIDE FILM AND METHOD FOR SUPPRESSING GENERATION OF LEAKAGE CURRENT Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18366297 Nanowire Stack GAA Device with Inner Spacer and Methods for Producing the Same Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.
18424960 SEMICONDUCTOR-ON-INSULATOR (SOI) STRUCTURE WITH VARIABLE RESISTIVITY EPITAXIAL SEMICONDUCTOR LAYERS AND METHODS OF MAKING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company Limited
17828064 PACKAGING SUBSTRATE INCLUDING A STRESS-ABSORPTION TRENCH AND METHODS OF FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company Limited
18335310 Bit Cell for Static Random Access Memory Final Rejection Katholieke Universiteit Leuven
18704093 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD Non-Final OA Tokyo Electron Limited
18214662 SEMICONDUCTOR DEVICE WITH SEMICONDUCTOR CARBON NANOTUBE AND MANUFACTURING METHOD THEREOF Non-Final OA NANYA TECHNOLOGY CORPORATION
18489028 SEMICONDUCTOR MODULE Final Rejection FUJI ELECTRIC CO., LTD.
18221501 METHOD FOR DIVIDING A TRANSPARENT WORKPIECE Final Rejection Trumpf Laser- und Systemtechnik Gmbh
18616758 LIGHT EMITTING APPARATUS AND DISPLAY APPARATUS INCLUDING THE SAME Non-Final OA SEOUL VIOSYS CO., LTD.
18478452 SILICON CARBIDE CHANNEL WITH CAPPING SEMICONDUCTOR HAVING HIGHER CHARGE CARRIER MOBILITY Non-Final OA GlobalFoundries U.S. Inc.

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