Prosecution Insights
Last updated: May 29, 2026

Examiner: KIELIN, ERIK J

Tech Center 2800 • Art Units: 2814 2815 2893

This examiner grants 67% of resolved cases

Performance Statistics

66.7%
Allow Rate
-1.3% vs TC avg
660
Total Applications
+4.8%
Interview Lift
855
Avg Prosecution Days
Based on 621 resolved cases, 2023–2026

Rejection Statute Breakdown

0.1%
§101 Eligibility
6.9%
§102 Novelty
72.1%
§103 Obviousness
16.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18397231 ORGANIC LIGHT-EMITTING DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME Non-Final OA Samsung Electronics Co., Ltd.
18066206 Integrated circuit FLUID sensor Non-Final OA Texas Instruments Incorporated
18270891 OHMIC-CONTACT-GATED CARBON NANOTUBE TRANSISTORS, FABRICATING METHODS AND APPLICATIONS OF SAME Final Rejection NORTHWESTERN UNIVERSITY
18551643 LIGHT-RECEIVING ELEMENT AND ELECTRONIC APPARATUS Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18551264 SOLID-STATE IMAGING ELEMENT AND ELECTRONIC DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18465376 CIRCULAR-SHAPED RESISTOR Non-Final OA International Business Machines Corporation
18062031 POWER GATING TRANSISTOR FOR BSPDN Non-Final OA INTERNATIONAL BUSINESS MACHINES CORPORATION
18367136 METHODS OF FORMING SILICON NITRIDE FILMS Final Rejection Applied Materials, Inc.
18459524 SELECTIVE CAPPING FOR GATE-ALL-AROUND FIELD EFFECT TRANSISTORS Non-Final OA Applied Materials, Inc.
18107326 LOW STRESS TUNGSTEN LAYER DEPOSITION Non-Final OA Applied Materials, Inc.
18244175 SEMICONDUCTOR POWER MODULE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR POWER MODULE FOR A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Final Rejection Hitachi Energy Ltd
18177144 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18295656 Silicidation Process for Semiconductor Devices Non-Final OA Tokyo Electron Limited
18062449 Methods for Etching Molybdenum Final Rejection Tokyo Electron Limited
18364651 Wafer Edge Protection Film Forming Method, Patterning Process, And Composition For Forming Wafer Edge Protection Film Final Rejection SHIN-ETSU CHEMICAL CO., LTD.
18301991 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Non-Final OA SK hynix Inc.
18327220 3D Stacking Structure and Method of Fabricating the Same Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
17806329 Packages Including Interconnect Die Embedded in Package Substrates Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18159457 GAS SUPPLIER, PROCESSING APPARATUS, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Final Rejection Kokusai Electric Corporation
18006552 LOW CEILING TEMPERATURE HOMOPOLYMERS AS SACRIFICIAL PROTECTION LAYERS FOR ENVIRONMENTALLY SENSITIVE SUBSTRATES Non-Final OA Lam Research Corporation
18105340 SEMICONDUCTOR DEVICE STRUCTURE WITH DIELECTRIC LINER PORTIONS AND METHOD FOR PREPARING THE SAME Final Rejection NANYA TECHNOLOGY CORPORATION
18274010 Thread-Based Transistors Non-Final OA Trustees of Tufts College
18501295 CAPACITORS WITH FLOATING METAL LAYERS Non-Final OA GlobalFoundries Singapore Pte. Ltd.
18149200 BACK GATE ION-SENSITIVE FIELD EFFECT TRANSISTOR SENSING WITH STACKED HIGH-K NANOSHEETS Non-Final OA GlobalFoundries Singapore Pte. Ltd.
18387927 THIN FILM TRANSISTOR AND MANUFACTURING METHOD FOR THE SAME Non-Final OA ADRC. CO. KR
18224971 Graphene nanoribbon with nanopore-based signal detection and genetic sequencing technology Final Rejection Acorn Genetics Inc.

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