Prosecution Insights
Prosecution Insights
Tech Center 4100 • Art Units: 2176 2824 2827 4100
This examiner grants 88% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18925340 | ADVANCED CLOCK SIGNAL DRIVERS AND MEMORY SYSTEMS INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 17843211 | SPLIT FOOTER TOPOLOGY TO IMPROVE VMIN AND LEAKAGE POWER FOR REGISTER FILE AND READ ONLY MEMORY DESIGNS | Final Rejection | Intel Corporation |
| 18614163 | PAGE BUFFERS AND OPERATION METHODS THEREOF, AND MEMORY DEVICES AND MEMORY SYSTEMS | Final Rejection | Yangtze Memory Technologies Co., Ltd. |
| 18485084 | MEMORY AND OPERATION METHOD THEREOF, MEMORY SYSTEM AND ELECTRONIC DEVICE | Final Rejection | Yangtze Memory Technologies Co., Ltd. |
| 18937271 | REUSING PARTIALLY FILLED SUPERBLOCKS FOR PROGRAMMING | Non-Final OA | Micron Technology, Inc. |
| 18785479 | CORRECTIVE PROGRAM CONVERGENCE ASSOCIATED WITH MEMORY CELLS OF A MEMORY SUB-SYSTEM | Final Rejection | MICRON TECHNOLOGY, INC. |
| 18771448 | DATA ALIGNMENT FOR MEMORY | Final Rejection | Micron Technology, Inc. |
| 18624570 | ALTERNATING BITLINE PAGE MAPPING WITH LINEAR WORDLINE RAMPING DURING A READ OPERATION | Non-Final OA | Micron Technology, Inc. |
| 18417899 | COMPLEX PAGE ACCESS IN MEMORY DEVICES | Non-Final OA | Micron Technology, Inc. |
| 18528337 | DEBIASING SCHEME FOR PARTIAL BLOCK ERASE BASED ON WORD LINE GROUPS | Non-Final OA | Micron Technology, Inc. |
| 19011147 | SRAM POWER-UP RANDOM NUMBER GENERATOR | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18790547 | MEMORY CIRCUITS WITH REGISTER CIRCUTIS AND METHODS FOR OPERATING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18437664 | MEMORY DEVICE | Non-Final OA | Kioxia Corporation |
| 18510978 | ACHIEVING DIFFERENT HIGH VOLTAGES ON INDIVIDUAL BITLINES OF A MEMORY DEVICE | Non-Final OA | Sandisk Technologies, Inc. |
| 18231629 | ERASE TECHNIQUES USING ANALOG BITSCAN IN A MEMORY DEVICE | Final Rejection | Sandisk Technologies, Inc. |
| 18779378 | MEMORY BUILT-IN-SELF-TEST (MBIST) WITH ENHANCED FAULT COUNTER | Final Rejection | NXP USA, Inc. |
| 18299332 | SEMICONDUCTOR DEVICE | Final Rejection | RENESAS ELECTRONICS CORPORATION |
| 18762131 | Data Storage System Using a Light Valve System | Final Rejection | Seurat Technologies, Inc. |
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