Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2813
This examiner grants 88% of resolved cases
Alvin Lynghi Lee serves in Tech Center 2800 and Art Unit 2813. The examiner has overseen 83 resolved cases, resulting in an allowance rate of 88.0 percent. This high rate suggests that a vast majority of applications reaching a final resolution under this examiner are successfully patented. The 88.0 percent allowance rate indicates a very high probability of success for applicants.
The interview lift is recorded at 11.1 percent. This metric shows that conducting an interview provides a measurable increase in the probability of allowance. Given the already high base allowance rate, interviews may serve to expedite the process or overcome specific prior art rejections. The 11.1 percent lift is a useful strategic data point for practitioners in Art Unit 2813.
The median days to allowance for this examiner is 1177. This figure offers a clear expectation for the timeline of prosecution. With 83 resolved cases, the data provides a focused view of the examiner's tendencies within the specific technological scope of Tech Center 2800. The 1177-day median pendency is a key factor for planning patent strategy.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18708679 | DISPLAY SUBSTRATE, MANUFACTURING METHOD THEREOF AND DISPLAY APPARATUS | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18264814 | LIGHT-EMITTING SUBSTRATE, DISPLAY PANEL AND DISPLAY DEVICE | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 18021250 | LIGHT EMITTING DEVICE, LIGHT EMITTING BASE PLATE AND LIGHT EMITTING APPARATUS | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 18740331 | DISPLAY APPARATUS | Non-Final OA | Samsung Display Co., Ltd. |
| 18517315 | LIGHT EMITTING ELEMENT AND METHOD OF MANUFACTURING LIGHT EMITTING ELEMENT | Final Rejection | Samsung Display Co., LTD. |
| 18142208 | DISPLAY APPARATUS | Non-Final OA | SAMSUNG DISPLAY CO., LTD. |
| 18735833 | LED DISPLAY DEVICE | Non-Final OA | FUJIFILM Corporation |
| 18073331 | DISPLAY DEVICE | Non-Final OA | LG Display Co., Ltd. |
| 18015453 | LIGHT-EMITTING ELEMENT, AND LIGHT-EMITTING DEVICE | Final Rejection | SHARP KABUSHIKI KAISHA |
| 18467163 | PACKAGE COMPRISING A SUBSTRATE WITH A PASSIVE COMPONENT BLOCK | Final Rejection | QUALCOMM Incorporated |
| 18050533 | INTERPOSER POWER CORRIDOR | Final Rejection | Intel Corporation |
| 17930801 | FULL WAFER DEVICE WITH BACK SIDE PASSIVE ELECTRONIC COMPONENTS | Final Rejection | Intel Corporation |
| 18047094 | STRUCTURE AND METHOD OF INCREASING SUBTRACTIVE BITLINE AIR GAP HEIGHT | Final Rejection | Intel NDTM US LLC |
| 18374524 | SEMICONDUCTOR DEVICES AND FABRICATING METHODS THEREOF | Final Rejection | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18251546 | DISPLAY DEVICE | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 17546682 | BARRIER LINER FREE INTERFACE FOR METAL VIA | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18369443 | INTERCONNECT CLIP FOR VERTICALLY STACKED DIE ARRANGEMENT | Final Rejection | Infineon Technologies AG |
| 19019178 | MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | Micron Technology, Inc. |
| 18783224 | VERTICALLY-ARRANGED GATE ALL AROUND TRANSISTORS HAVING UNIFORM CELL CONTACT LIGHTLY-DOPED DRAIN REGIONS | Non-Final OA | Micron Technology, Inc. |
| 17701509 | MICROELECTRONIC DEVICES INCLUDING STAIRCASE STRUCTURES, AND RELATED METHODS, MEMORY DEVICES, AND ELECTRONIC SYSTEMS | Non-Final OA | Micron Technology, Inc. |
| 18779221 | METHOD AND STRUCTURE FOR IMPROVED MEMORY INTEGRITY AT ARRAY BOUNDARIES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18656348 | LOW-RESISTANCE SOURCE/DRAIN FEATURES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17814317 | SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18623490 | THRESHOLD VOLTAGE TUNING FOR CFETS HAVING COMMON GATES | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18717511 | Test Apparatus For Flip-Chip Micro-Light Emitting Diode (LED) Devices | Non-Final OA | Lumileds LLC |
| 17764671 | DISPLAY PANEL AND REPAIRING METHOD THEREOF | Non-Final OA | Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18587700 | APPARATUS AND METHODS FOR REDUCING NUMBER OF LAYOUT TRACKS FOR SENSE AMPLIFIERS | Non-Final OA | Sandisk Technologies, Inc. |
| 18498049 | CAPACITOR DEVICE AND MANUFACTURING METHOD THEREOF | Final Rejection | United Microelectronics Corp. |
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