Prosecution Insights
Last updated: October 02, 2026

Examiner: LEE, DA WEI

Tech Center 2800 • Art Units: 2817

This examiner grants 80% of resolved cases

Analysis

Examiner DA WEI LEE is assigned to Tech Center 2800 and Art Unit 2817. The examiner has reached a final resolution on 46 cases. The data shows an allowance rate of 80.4 percent, which represents the proportion of applications that result in a patent grant rather than an abandonment. This rate provides a primary indicator of the likelihood of success for an application assigned to this examiner.

The median days to allowance for this examiner is 1292. This figure represents the middle point of the time distribution for applications that successfully result in a patent grant. A median of 1292 days offers a specific timeline for practitioners to consider when managing client expectations and filing strategies. Understanding this duration is essential for navigating the procedural requirements of Art Unit 2817.

The interview lift is 15.4 percent. This figure quantifies the change in the probability of allowance when an interview is conducted during the prosecution process. A lift of 15.4 percent suggests that verbal communication with the examiner may influence the final outcome of a case. For the 46 resolved cases analyzed, this statistic serves as a tool for determining whether to request a formal interview in Tech Center 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

80.4%
Allow Rate
+12.4% vs TC avg
82
Total Applications
+15.4%
Interview Lift
1292
Avg Prosecution Days
Based on 46 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
31.6%
§102 Novelty
59.9%
§103 Obviousness
7.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18188311 THREE DIMENSIONAL NON-VOLATILE MEMORY DEVICE Non-Final OA Samsung Electronics Co., Ltd.
17834240 THREE-DIMENSIONAL SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Non-Final OA Samsung Electronics Co., Ltd.
17830488 SEMICONDUCTOR PACKAGE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18558302 DISPLAY SUBSTRATE AND DISPLAY APPARATUS Non-Final OA BOE TECHNOLOGY GROUP CO., LTD.
18258380 METHOD FOR PRODUCING A III-N MATERIAL-BASED LAYER Non-Final OA COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
18757034 STACKED DIE NETWORK INTERFACE CONTROLLER CIRCUITRY Non-Final OA Altera Corporation
18115807 3D MEMORY DEVICE WITH A DRAM CHIP Non-Final OA Yangtze Memory Technologies Co., Ltd.
18735435 SEMICONDUCTOR MANUFACTURING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR APPARATUS, AND SEMICONDUCTOR APPARATUS Non-Final OA Mitsubishi Electric Corporation
18550281 SEMICONDUCTOR DEVICE AND IMAGING DEVICE Final Rejection SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18347404 SEMICONDUCTOR DEVICE INCLUDING METAL INTERCONNECT STRUCTURES THAT CONTAIN SELECTIVELY-GROWN DIELECTRIC SPACERS AND METHODS FOR FORMING THE SAME Final Rejection WESTERN DIGITAL TECHNOLOGIES, INC.,
18620887 SEMICONDUCTOR DEVICES WITH ALTERNATING INSULATING LAYERS AND METHODS OF FABRICATION THEREOF Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18308026 DIELECTRIC GAS SPACER FORMATION FOR REDUCING PARASITIC CAPACITANCE IN A TRANSISTOR INCLUDING NANOSHEET STRUCTURES Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18050753 THIN-FILM TRANSISTOR HAVING VERTICAL STRUCTURE AND ELECTRONIC DEVICE Non-Final OA WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

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