Prosecution Insights
Last updated: August 17, 2026

Examiner: MERANT, GUERRIER

Tech Center 2100 • Art Units: 2111 2117

This examiner grants 89% of resolved cases

Performance Statistics

88.7%
Allow Rate
+33.7% vs TC avg
1,267
Total Applications
-2.5%
Interview Lift
763
Avg Prosecution Days
Based on 1234 resolved cases, 2023–2026

Rejection Statute Breakdown

9.1%
§101 Eligibility
15.3%
§102 Novelty
44.5%
§103 Obviousness
17.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
19070100 MEMORY CONTROLLER, MEMORY MODULE AND MEMORY SYSTEM Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18977481 TEST DEVICE PERFORMING TEST OPERATION ON LATCH CIRCUIT, OPERATING METHOD OF TEST DEVICE, AND STORAGE DEVICE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18949110 NON-VOLATILE MEMORY DEVICE, CONTROLLER, AND MEMORY SYSTEM Final Rejection SAMSUNG ELECTRONICS CO., LTD.
19048142 Error Code Block Processing Method and Apparatus Non-Final OA Huawei Technologies Co., Ltd.
19027570 MEMORY SYSTEM, OPERATION METHOD THEREOF, MEMORY CONTROLLER AND STORAGE MEDIUM Non-Final OA Yangtze Memory Technologies Co., Ltd.
18397160 METHOD AND APPARATUS FOR INTEGRATED MANAGEMENT OF ENERGY BLOCKCHAIN TRANSACTIONS OF PLUS ENERGY Non-Final OA ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
18964590 ASYMMETRIC HARD READ CHANNEL ESTIMATION IN MEMORY DEVICES Final Rejection SK hynix Inc.
19203401 REDUCING READ OPERATIONS DURING READ ERROR HANDLING IN A MEMORY DEVICE Non-Final OA Micron Technology, Inc.
19021490 APPARATUS FOR REDUNDANT ARRAY OF INDEPENDENT DISKS Final Rejection Micron Technology, Inc.
18987930 METADATA STORAGE AT A MEMORY DEVICE Non-Final OA Micron Technology, Inc.
18977022 ADAPTIVE ERROR HANDLING FOR A WIDE RANGE OF HIGH-RELIABILITY ERROR RATES Final Rejection Micron Technology, Inc.
18616977 SAFETY DATA INTEGRITY CHECKING AT A PARALLEL PROCESSOR OF A DISPLAY SYSTEM Final Rejection ADVANCED MICRO DEVICES, INC.
18621472 Periodic In-Field Testing of System on Chip Functional Units Non-Final OA ATI Technologies ULC
19045445 TESTING METHOD FOR MEMORY DEVICE Non-Final OA Powerchip Semiconductor Manufacturing Corporation

Facing This Examiner?

IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.

Build Your Strategy

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month