Tech Center 2100 • Art Units: 2111 2117
This examiner grants 88% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18949110 | NON-VOLATILE MEMORY DEVICE, CONTROLLER, AND MEMORY SYSTEM | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18937494 | MEMORY DEVICE, PROCESSOR, AND OPERATING METHOD OF THE MEMORY DEVICE TO RESTORE DATA DURING POWER CUT-OFF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18935130 | LOGIC DIE, SEMICONDUCTOR DEVICE INCLUDING THE SAME, AND METHOD OF FEEDBACK TESTING OF THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18668224 | MEMORY DEVICE, TEST METHOD OF THE MEMORY DEVICE, AND METHOD OF MANUFACTURING MEMORY DEVICE INCLUDING THE TEST METHOD | Final Rejection | Samsung Electronics Co., Ltd. |
| 18604021 | INTEGRATED CIRCUIT, MEMORY DEVICE INCLUDING THE INTEGRATED CIRCUIT, AND METHOD OF OPERATING THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 18482649 | SEMICONDUCTOR MEMORY DEVICE WITH DYNAMICALLY VARYING SELF-REFRESH PERIOD | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18900395 | TECHNIQUES FOR PRE AND POST FORWARD ERROR CORRECTION AND PACKET PADDING IN RADIO TRANSMISSION | Non-Final OA | HUAWEI TECHNOLOGIES CO., LTD. |
| 18801285 | COMMON CONTROL AND/OR OBSERVATION FOR INTERNAL STATE TRACKING | Non-Final OA | Arm Limited |
| 18835451 | MEMORY DEVICE, OPERATION METHOD OF THE MEMORY DEVICE, AND PROGRAM | Final Rejection | SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
| 18397160 | METHOD AND APPARATUS FOR INTEGRATED MANAGEMENT OF ENERGY BLOCKCHAIN TRANSACTIONS OF PLUS ENERGY | Non-Final OA | ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
| 18930772 | IMPLICIT STORAGE OF METADATA AT A MEMORY DEVICE | Non-Final OA | Micron Technology, Inc. |
| 18923244 | TESTING CIRCUIT FOR A MEMORY DEVICE | Non-Final OA | Micron Technology, Inc. |
| 18776538 | ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES | Final Rejection | Micron Technology, Inc. |
| 18602819 | VOLTAGE DOMAIN BASED ERROR MANAGEMENT | Non-Final OA | Micron Technology, Inc. |
| 18941613 | OPTIMIZED CODE-SPLIT SYMBOL CONSTELLATIONS | Non-Final OA | Hughes Network Systems, LLC |
| 18934251 | MEMORY CONTROLLER COMPRESSING AND STORING DATA, METHOD OF OPERATING THE SAME, AND STORAGE DEVICE INCLUDING THE SAME | Non-Final OA | SK hynix Inc. |
| 18621472 | Periodic In-Field Testing of System on Chip Functional Units | Final Rejection | ATI Technologies ULC |
| 18892590 | DECODER SCHEME FOR REDUCING POWER CONSUMPTION OF READING AND WRITING | Non-Final OA | Silicon Motion, Inc. |
| 18924864 | SCRUB RATE CONTROL FOR A MEMORY DEVICE | Non-Final OA | Lodestar Licensing Group, LLC |
| 18800645 | SYSTEMS AND METHODS FOR RELATIVE POSITIONING OF MEMORY STRUCTURES IN SYSTEM MEMORY MAP | Non-Final OA | Dell Products L.P. |
| 18934743 | Error Alert Encoding for Improved Error Mitigation | Non-Final OA | Advanced Micro Devices, Inc. |
| 18616977 | SAFETY DATA INTEGRITY CHECKING AT A PARALLEL PROCESSOR OF A DISPLAY SYSTEM | Non-Final OA | ADVANCED MICRO DEVICES, INC. |
| 18646654 | EVALUATION APPARATUS, EVALUATION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM | Final Rejection | ADVANTEST CORPORATION |
| 18808104 | MEMORY, MEMORY SYSTEM, OPERATION METHOD OF THE MEMORY, AND OPERATION OF THE MEMORY SYSTEM | Final Rejection | MimirIP LLC |
| 18621011 | TESTING CIRCUIT FOR TESTING ELECTRICAL DEVICES AND DEVICE UNDER TEST | Final Rejection | Winbond Electronics Corp. |
| 18608175 | DETERMINISTIC BUILT-IN SELF-TEST | Final Rejection | XILINX, INC. |
| 18754911 | XOR DATA RECOVERY SCHEMES NONVOLATILE MEMORY DEVICES | Final Rejection | SanDisk Technologies LLC |
| 18441924 | FAULT TOLERANT QUANTUM COMPUTATION IN SPIN SYSTEMS USING CAT CODES | Final Rejection | Alphabet Inc. |
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