Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2823 2828 2897
This examiner grants 92% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18380951 | SEMICONDUCTOR DEVICE INCLUDING BACKSIDE SOURCE/DRAIN CONTACT STRUCTURE WITH CONTACT SPACER AND BACKSIDE GATE CONTACT STRUCTURE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18486884 | SOURCE/DRAIN ISOLATION OF TOP AND BOTTOM TIERS OF 3D FIELD-EFFECT TRANSISTORS | Final Rejection | Samsung Electronics Co., Ltd. |
| 18362635 | IC PACKAGE WITH IMMERSION TIN ON FLANK | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18321192 | ELECTRONIC DEVICE WITH A REINFORCING LAYER | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18059473 | SHAPE MEMORY POLYMER FOR USE IN SEMICONDUCTOR DEVICE FABRICATION | Non-Final OA | Texas Instruments Incorporated |
| 18398732 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18528513 | LIGHT-EMITTING DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 18531038 | LATERAL PASSIVE DIODES CO-INTEGRATED WITH NANOSHEET TECHNOLOGY | Non-Final OA | International Business Machines Corporation |
| 18394352 | ISOLATION FORMATION METHOD IN HIGH-ASPECT RATIO CMOS STACKED DEVICES | Non-Final OA | Applied Materials, Inc. |
| 18121720 | FABRICATION OF GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING TUNED UPPER NANOWIRES | Non-Final OA | Intel Corporation |
| 17957349 | SINGULATION OF INTEGRATED CIRCUIT PACKAGE SUBSTRATES WITH GLASS CORES | Final Rejection | Intel Corporation |
| 18542228 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18399742 | MEMS Microphone | Non-Final OA | AAC ACOUSTIC TECHNOLOGIES (SHENZHEN) CO., LTD. |
| 18518184 | INTEGRATED CIRCUIT DIE STACK WITH A BRIDGE DIE | Final Rejection | Advanced Micro Devices, Inc. |
| 18037081 | MICRO DEVICE, MICRO DEVICE ALIGNMENT APPARATUS, AND ALIGNMENT METHOD USING SAME | Non-Final OA | POINT ENGINEERING CO., LTD. |
| 18500504 | BARIUM TITANATE FILMS HAVING REDUCED INTERFACIAL STRAIN | Non-Final OA | Psiquantum, Corp. |
| 18565453 | OPTOELECTRONIC LIGHTING DEVICE | Non-Final OA | ams-OSRAM International GmbH |
| 18392429 | NANOPORE SENSING DEVICE WITH MULTIPLE SENSING LAYERS | Non-Final OA | IMEC VZW |
| 18504593 | METHOD FOR DETERMINING CROSSTALK OF QUANTUM BITS, QUANTUM CONTROL SYSTEM, AND QUANTUM COMPUTER | Non-Final OA | ORIGIN QUANTUM COMPUTING TECHNOLOGY (HEFEI) CO., LTD |
| 18542211 | TRENCH SEMICONDUCTOR POWER DEVICE AND LAYOUT THEREOF | Non-Final OA | Silicon-Magic Semiconductor Technology ( Hangzhou ) Co., Ltd |
| 18498251 | SEMICONDUCTOR DEVICE | Non-Final OA | WIN SEMICONDUCTORS CORP. |
| 18380972 | Display Module and Method for Manufacturing Display Module | Non-Final OA | Hudei Xinying Optoelectronics Co., Ltd. |
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