Tech Center 2800 • Art Units: 2811
This examiner grants 58% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18396258 | ELECTRONIC DEVICE INCLUDING FERROELECTRIC MATERIAL AND ELECTRONIC APPARATUS INCLUDING THE ELECTRONIC DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 17827751 | WIRING SUBSTRATE, METHOD OF FABRICATING THE SAME, AND METHOD OF FABRICATING SEMICONDUCTOR PACKAGE INCLUDING THE SAME | Final Rejection | Samsung Electronics Co., Ltd. |
| 17914946 | ARRAY SUBSTRATES AND METHODS FOR MANUFACTURING THE SAME, DISPLAY PANELS AND DISPLAY DEVICES | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18225793 | ORGANIC LIGHT EMITTING DIODE DISPLAY | Non-Final OA | Samsung Display Co., Ltd. |
| 17883716 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | Non-Final OA | Infineon Technologies AG |
| 18625430 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME | Non-Final OA | FUJI ELECTRIC CO., LTD. |
| 18193750 | SILICON CARBIDE SEMICONDUCTOR DEVICE | Final Rejection | FUJI ELECTRIC CO., LTD. |
| 18528465 | RESISTANCE REDUCTION BY FORMING CONDUCTIVE VIA ON BACK SIDE OF SOURCE/DRAIN CONTACTS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18491486 | VARACTORS HAVING INCREASED TUNING RATIO | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17746434 | INTEGRATED CIRCUIT DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18072564 | FABRICATION OF INTEGRATED CIRCUIT STRUCTURES HAVING UNIFORMITY AMONG VARYING GATE TRENCH WIDTHS | Non-Final OA | Intel Corporation |
| 17742638 | DOPING CONTACTS OF THIN FILM TRANSISTORS | Final Rejection | Intel Corporation |
| 17755871 | ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND DISPLAY PANEL | Non-Final OA | SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD. |
| 17819538 | ELECTRONIC DEVICES INCLUDING STACKS INCLUDING CONDUCTIVE STRUCTURES ISOLATED BY SLOT STRUCTURES, AND RELATED SYSTEMS AND METHODS | Final Rejection | Micron Technology, Inc. |
| 18503839 | COMPLEMENTARY FIELD EFFECT TRANSISTOR (CFET) CIRCUITS WITH DIRECT VERTICAL CONNECTORS AND METHODS FOR MAKING THE SAME | Non-Final OA | QUALCOMM Incorporated |
| 18353908 | RESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | Kioxia Corporation |
| 18883121 | SEMICONDUCTOR DEVICE | Final Rejection | ROHM CO., LTD. |
| 18362835 | MAGNETIC TUNNEL JUNCTION STRUCTURES AND RELATED METHODS | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17476418 | FIELD EFFECT TRANSISTOR AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17870260 | TRANSISTOR DEVICE | Non-Final OA | Infineon Technologies Austria AG |
| 18509629 | SEMICONDUCTOR DIE STUCTURE WITH AIR GAPS AND METHOD FOR PREPARING THE SAME | Non-Final OA | NANYA TECHNOLOGY CORPORATION |
| 18016813 | SEMICONDUCTOR DEVICE | Non-Final OA | SUZHOU ORIENTAL SEMICONDUCTOR CO., LTD. |
| 17977346 | SEMICONDUCTOR DEVICE | Non-Final OA | Infineon Technologies Dresden GmbH & Co. KG |
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