Prosecution Insights
Last updated: April 19, 2026

Examiner: SLUTSKER, JULIA

Tech Center 2800 • Art Units: 2891

This examiner grants 77% of resolved cases

Performance Statistics

76.9%
Allow Rate
+8.9% vs TC avg
1105
Total Applications
+12.6%
Interview Lift
901
Avg Prosecution Days
Based on 1051 resolved cases, 2023–2026

Rejection Statute Breakdown

0.2%
§101 Eligibility
24.8%
§102 Novelty
47.4%
§103 Obviousness
20.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18137339 LAYER DEPOSITION METHOD AND LAYER DEPOSITION APPARATUS Non-Final OA Samsung Electronics Co., Ltd.
17989435 SEMICONDUCTOR DEVICES Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18090766 GROUP III-V SEMICONDUCTOR DEVICE AND METHOD OF FABRICATION OF SAME INCLUDING IN-SITU SURFACE PASSIVATION Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18264202 NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE, METHOD FOR PRODUCING SAME, AND NITRIDE SEMICONDUCTOR DEVICE Non-Final OA Panasonic Intellectual Property Management Co., Ltd.
18480544 APPARATUS AND METHOD FOR MANUFACTURING DISPLAY DEVICE, AND MASK ASSEMBLY Non-Final OA Samsung Display Co., Ltd.
18595951 SUBTRACTIVE METALS AND SUBTRACTIVE METAL SEMICONDUCTOR STRUCTURES Final Rejection Applied Materials, Inc.
18197528 FORMATION OF SILICON-AND-METAL-CONTAINING MATERIALS FOR HARDMASK APPLICATIONS Final Rejection Applied Materials, Inc.
18309669 LOW-ENERGY UNDERLAYER FOR ROOM TEMPERATURE PHYSICAL VAPOR DEPOSITION OF ELECTRICALLY CONDUCTIVE FEATURES Non-Final OA Applied Materials, Inc.
18128389 GRADIENT OXIDATION AND ETCH OF PVD MOLYBDENUM FOR BOTTOM UP GAP FILL Non-Final OA Applied Materials, Inc.
17896716 ADHESION IMPROVEMENT BETWEEN LOW-K MATERIALS AND CAP LAYERS Non-Final OA Applied Materials, Inc.
18041251 MANUFACTURING METHOD OF METAL OXIDE Final Rejection SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
18270080 SEMICONDUCTOR SUBSTRATE, METHOD FOR PRODUCING SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR SUBSTRATE PRODUCTION DEVICE, ELECTRONIC COMPONENT, AND ELECTRONIC DEVICE Non-Final OA KYOCERA Corporation
18480551 IMAGE SENSOR DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18303131 SEMICONDUCTOR DEVICES AND METHODS OF FORMATION Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18224940 FORKSHEET SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME Non-Final OA Tokyo Electron Limited
18280621 METHOD AND APPARATUS FOR PRODUCING GROUP III NITRIDE SEMICONDUCTOR Non-Final OA National University Corporation Tokai National Higher Education and Research System
18552220 SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR DEVICE, INTEGRATED CIRCUIT ELEMENT, AND INTEGRATED CIRCUIT ELEMENT MANUFACTURING METHOD Non-Final OA Resonac Corporation
18162419 SHIELDED WAFER LEVEL CHIP SCALE PACKAGE WITH SHIELD CONNECTED TO GROUND VIA REDISTRIBUTION LAYERS Final Rejection Skyworks Solutions, Inc.
18552219 DEVICE MODULE, MANUFACTURING METHOD THEREFOR, AND INDUCTOR-CAPACITOR ARRAY Non-Final OA SG MICRO CORP
18090875 P-GAN HIGH-ELECTRON-MOBILITY TRANSISTOR Final Rejection NATIONAL SUN YAT-SEN UNIVERSITY
18137128 INHERENT AREA SELECTIVE DEPOSITION OF MIXED OXIDE DIELECTRIC FILM Final Rejection Gelest, Inc.
18353995 ISOLATION STRUCTURE HAVING DIFFERENT LINERS ON UPPER AND LOWER PORTIONS Non-Final OA GlobalFoundries U.S. Inc.
18112707 METHOD FOR FORMING A SHALLOW TRENCH ISOLATION STRUCTURE WITH REDUCED ENCROACHMENT OF ACTIVE REGIONS AND A SEMICONDUCTOR STRUCTURE THEREFROM Non-Final OA Nanya Technology Corporation
18392467 SEMICONDUCTOR DEVICE WITH INTEGRATED SOFT-MAGNETIC COMPONENT, AND METHOD OF PRODUCING SAME Non-Final OA Melexis Technologies SA
18552143 TRANSFER METHOD AND TRANSFER DEVICE OF LIGHT-EMITTING ELEMENT FOR DISPLAY Non-Final OA SEOUL VIOSYS CO., LTD.
18227991 ISOLATION STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Final Rejection UNITED MICROELECTRONICS CORP.
18137331 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA DB HITEK CO., LTD.
18523509 CONTACT STRUCTURE OF SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR Non-Final OA SILICON-MAGIC SEMICONDUCTOR TECHNOLOGY (HANGZHOU) CO., LTD.
18483535 MOTHER SUBSTRATE FOR DISPLAY DEVICE AND MANUFACTURING METHOD OF DISPLAY DEVICE Non-Final OA Mognolia White Corporation
18480516 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA PICO SEMICONDUCTOR INC.

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