Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2813 2818 2897
This examiner grants 97% of resolved cases
Ashley Nicole Blackwell is an examiner in Tech Center 2800 and Art Unit 2813. The examiner has 70 resolved cases and an allowance rate pct of 98.6. This indicates that almost all resolved cases result in an allowance. The data suggests a very high probability of success for any application assigned to this examiner.
The median days to allowance is 1233. The interview lift pct is 2.3, showing a very small statistical increase in allowance probability following an interview. Given the 98.6 allowance rate pct, the 2.3 lift pct is a minor factor in overall strategy. The 1233 day timeline is the primary consideration for applicants, as the path to grant is nearly certain but takes over three years on average. The high allowance rate pct of 98.6 makes this one of the most favorable dockets for obtaining a patent.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18535089 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18028346 | DISPLAY APPARATUSES AND DISPLAY PANELS | Final Rejection | BOE Technology Group Co., Ltd. |
| 18023382 | Display Substrate and Display Device | Final Rejection | BOE Technology Group Co., Ltd. |
| 18040775 | DISPLAY PANEL AND DISPLAY APPARATUS | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18740271 | DISPLAY APPARATUS | Non-Final OA | Samsung Display Co., Ltd. |
| 18659702 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Samsung Display Co., LTD. |
| 18279228 | DISPLAY PANEL AND DISPLAY DEVICE | Non-Final OA | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18455629 | DISPLAY DEVICE | Non-Final OA | Magnolia White Corporation |
| 18276453 | DISPLAY DEVICE | Non-Final OA | SHARP KABUSHIKI KAISHA |
| 18015186 | DISPLAY DEVICE | Non-Final OA | SHARP KABUSHIKI KAISHA |
| 17818933 | 2D-MATERIAL GATE-ALL-AROUND COMPLEMENTARY FET INTEGRATION | Final Rejection | QUALCOMM Incorporated |
| 18319164 | SURFACE FINISHES FOR CONTACTS AND FIDUCIAL MARKERS ON INTEGRATED CIRCUIT PACKAGE SUBSTRATES AND ASSOCIATED METHODS | Non-Final OA | Intel Corporation |
| 18088552 | INTEGRATED CIRCUIT STRUCTURES HAVING BACKSIDE CAPACITORS | Non-Final OA | Intel Corporation |
| 17561518 | INTEGRATED CIRCUITS WITH GATE PLUGS TO INDUCE COMPRESSIVE CHANNEL STRAIN | Final Rejection | Intel Corporation |
| 17346964 | STENT AND WRAP CONTACT | Non-Final OA | Intel Corporation |
| 18083385 | DIELECTRIC SEPARATION FOR BACKSIDE POWER RAIL LINES | Non-Final OA | International Business Machines Corporation |
| 18723325 | POWER MODULE AND METHOD FOR MANUFACTURING A POWER MODULE | Non-Final OA | Hitachi Energy Ltd |
| 18627594 | MEMORY DEVICE AND METHOD OF MANUFACTURING THE MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18625485 | MRAM DEVICE HAVING TWO-TERMINAL SELECTORS | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18517577 | Gradually Changed Dummy Pattern Distribution Around TSVs | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18440435 | DIE SHAPE CONTROL FOR DIE TO WAFER BOND ENHANCEMENT | Final Rejection | Tokyo Electron Limited |
| 18440470 | SEMICONDUCTOR DEVICE | Non-Final OA | ROHM CO., LTD. |
| 18814870 | SEMICONDUCTOR DEVICE WITH SELF-ALIGNING CONTACT AND METHOD FOR FABRICATING THE SAME | Non-Final OA | NANYA TECHNOLOGY CORPORATION |
| 18648641 | SEMICONDUCTOR DEVICE WITH FILLING LAYER AND METHOD FOR FABRICATING THE SAME | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18457954 | ORGANIC LIGHT-EMITTING DISPLAY PANELS AND DISPLAY DEVICES | Final Rejection | SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD. |
| 18899692 | SEMICONDUCTOR MODULE | Non-Final OA | FUJI ELECTRIC CO., LTD. |
| 18623065 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | United Microelectronics Corp. |
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