Prosecution Insights
Last updated: October 01, 2026

Examiner: BULLARD-CONNOR, GENEVIEVE GRACE

Tech Center 2800 • Art Units: 2899

This examiner grants 46% of resolved cases

Analysis

Genevieve Grace Bullard-Connor works in Tech Center 2800 and Art Unit 2899. Her profile includes 24 resolved cases, with an allowance rate pct of 45.8. This shows that less than half of the applications she examines result in a patent grant. The median days to allowance for these successful cases is 1419, which outlines the timeframe for prosecution in her unit from filing to grant.

The interview lift pct of 41.4 is a significant metric for practitioners. It indicates that interviews are effective at increasing the probability of an allowance. In Art Unit 2899, the 41.4 interview lift pct suggests that oral advocacy is a key strategy for overcoming rejections and moving toward the 45.8 allowance rate pct from the 24 resolved cases. This lift is a strong indicator of examiner receptivity.

With 24 resolved cases, the examiner's data provides a picture of her examination style. The 1419 median days to allowance reflects a long prosecution cycle, but the 41.4 interview lift pct offers a way to improve outcomes. Applicants should consider the 45.8 allowance rate pct as a baseline and use interviews to maximize their chances of success in Tech Center 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

45.8%
Allow Rate
-22.2% vs TC avg
75
Total Applications
+41.4%
Interview Lift
1419
Avg Prosecution Days
Based on 24 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
28.6%
§102 Novelty
53.7%
§103 Obviousness
17.7%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18739548 SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18648097 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME Non-Final OA Samsung Electronics Co., Ltd.
17820151 SEMICONDUCTOR MOUNTING STRUCTURE Final Rejection FUJIFILM Corporation
17698430 MICROELECTRONIC ASSEMBLIES INCLUDING STIFFENERS Final Rejection Intel Corporation
17550236 MICROELECTRONIC ASSEMBLIES WITH GLASS SUBSTRATES AND PLANAR INDUCTORS Non-Final OA Intel Corporation
17481257 MOAT PROTECTION TO PREVENT CRACK PROPAGATION IN GLASS CORE SUBSTRATES OR GLASS INTERPOSERS Non-Final OA Intel Corporation
18043605 SEMICONDUCTOR MODULE, METHOD FOR MANUFACTURING THE SAME, AND POWER CONVERSION DEVICE Non-Final OA Mitsubishi Electric Corporation
17892297 SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE USING SAME Final Rejection Mitsubishi Electric Corporation
18289002 DISPLAY DEVICE AND MANUFACTURING METHOD OF DISPLAY DEVICE Non-Final OA SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
18513736 OPTIMIZED INNER SPACER WITH BACKSIDE CONTACT Final Rejection INTERNATIONAL BUSINESS MACHINES CORPORATION
18223838 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES AND CORRESPONDING SEMICONDUCTOR DEVICE Final Rejection STMicroelectronics S.r.l.
18635310 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18404467 REDUCTION OF SIZE OF EDGE CELL REGION IN MEMORY DEVICES Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18507100 MEMORY DEVICE AND METHOD OF FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18099951 SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME Final Rejection TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
17873060 3D SEMICONDUCTOR PACKAGE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
17891634 INTEGRATED CIRCUIT PACKAGES AND METHODS OF FORMING THE SAME Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.
17833208 Semiconductor Device and Method Forming Same Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.
18321129 PACKAGE STRUCTURE INCLUDING A PACKAGE LID HAVING A PATTERNED BOTTOM SURFACE AND METHODS OF FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company Limited
18110009 THERMAL INTERFACE MATERIAL LAYER PROTECTION STRUCTURES AND METHODS OF FORMING THE SAME Final Rejection Taiwan Semiconductor Manufacturing Company Limited
18612241 SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME Non-Final OA NANYA TECHNOLOGY CORPORATION
18509410 HYBRID BONDED INVERTED MEMORY-LOGIC STACK Non-Final OA Advanced Micro Devices, Inc.
18329387 METHODS FOR MOUNTING AN ELECTRONIC PACKAGE TO A CIRCUIT BOARD Non-Final OA Skyworks Solutions, Inc.
18297971 DUAL-SIDED MOLDED PACKAGE WITH EXPOSED BACKSIDE DIE FOR THERMAL DISSIPATION Final Rejection Skyworks Solutions, Inc.
18376450 ELECTROSTATIC DISCHARGE PROTECTION DEVICE Non-Final OA UNITED MICROELECTRONICS CORP.
17814566 HETEROGENEOUS EMBEDDED POWER DEVICE PACKAGE USING DAM AND FILL Final Rejection SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

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