Tech Center 2800 • Art Units: 2141 2812 2823 2826 2896
This examiner grants 72% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18390713 | IMAGE SENSOR | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18531187 | THERMAL IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18494156 | IMAGE SENSOR | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18381800 | IMAGE SENSOR AND METHOD OF FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18575361 | DISPLAY DEVICE COMPRISING SEMICONDUCTOR LIGHT-EMITTING ELEMENT | Non-Final OA | LG DISPLAY CO., LTD. |
| 18517823 | DISPLAY APPARATUS | Non-Final OA | LG Display Co., Ltd. |
| 18500534 | PHOTOELECTRIC CONVERSION ELEMENT, IMAGING APPARATUS, AND METHOD FOR DRIVING PHOTOELECTRIC CONVERSION ELEMENT | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 17808894 | SEMICONDUCTOR DEVICE | Non-Final OA | Mitsubishi Electric Corporation |
| 18116425 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., LTD. |
| 18490757 | PHOTODETECTION DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18475965 | STACKED MULTI-GATE DEVICE WITH AN INSULATING LAYER BETWEEN TOP AND BOTTOM SOURCE/DRAIN FEATURES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18232306 | SEMICONDUCTOR DEVICE INCLUDING BACK SIDE POWER SUPPLY CIRCUIT | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18150410 | BACK END FLOATING GATE STRUCTURE IN A SEMICONDUCTOR DEVICE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18391722 | DISPLAY DEVICE | Non-Final OA | Magnolia White Corporation |
| 18090879 | MICROELECTRONIC PACKAGE STRUCTURES WITH SOLDER JOINT ASSEMBLIES HAVING ROUGHENED BUMP STRUCTURES | Non-Final OA | Intel Corporation |
| 18381185 | ARRAY SUBSTRATES AND DISPLAY PANELS | Final Rejection | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18468556 | Reduction of Edge Transistor Leakage on N-Type EDMOS and LDMOS Devices | Non-Final OA | Murata Manufacturing Co., Ltd. |
| 18492819 | STRUCTURAL ELEMENT WITH IMPROVED FERROELECTRIC POLARISATION SWITCHING AND RELIABILITY AND METHOD FOR PRODUCING SAID STRUCTRAL ELEMENT | Non-Final OA | Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung E.V. |
| 17515337 | µ-Led, µ-Led Device, Display And Method For The Same | Final Rejection | OSRAM Opto Semiconductors GmbH |
| 17708348 | SUBSTRATE TRENCH FOR CONTROLLING UNDERFILL FILLET AREA AND METHODS OF FORMING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company Limited |
| 18315587 | IMAGE SENSOR AND METHOD OF MANUFACTURING SAME | Final Rejection | DB HiTek Co., Ltd. |
| 17595225 | PHOTODETECTOR WITH IMPROVED DETECTION RESULT | Final Rejection | SENORICS GMBH |
| 18509159 | VERTICAL-TYPE LIGHT-EMITTING DIODE AND LIGHT-EMITTING DEVICE | Non-Final OA | Quanzhou sanan semiconductor technology Co., Ltd. |
| 18465017 | SUBSTRATE FEATURES IN THERMALLY CONDUCTIVE MATERIALS | Non-Final OA | Akash Systems, Inc. |
| 18259017 | PARTICLE DETECTOR COMPRISING A POROUS REGION MADE OF A SEMICONDUCTOR MATERIAL, AND ASSOCIATED MANUFACTURING METHOD | Final Rejection | INSA CENTRE VAL DE LOIRE |
| 18027795 | LOW-PENETRATING PARTICLES LOW-GAIN AVALANCHE DETECTOR | Final Rejection | OSTERREICHISCHE AKADEMIE DER WISSENSCHAFTEN |
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