Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2141 2812 2823 2826 2896
This examiner grants 73% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18390713 | IMAGE SENSOR | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18531187 | THERMAL IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18473665 | SEMICONDUCTOR DEVICE | Final Rejection | Samsung Electronics Co., Ltd. |
| 18517823 | DISPLAY APPARATUS | Non-Final OA | LG Display Co., Ltd. |
| 17847513 | FLEXIBLE DISPLAY APPARATUS AND FABRICATION METHOD THEREOF | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 17808894 | SEMICONDUCTOR DEVICE | Non-Final OA | Mitsubishi Electric Corporation |
| 18452399 | DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., LTD. |
| 18500534 | PHOTOELECTRIC CONVERSION ELEMENT, IMAGING APPARATUS, AND METHOD FOR DRIVING PHOTOELECTRIC CONVERSION ELEMENT | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 18558614 | IMAGE DISPLAY DEVICE AND ELECTRONIC DEVICE | Final Rejection | Sony Semiconductor Solutions Corporation |
| 18391722 | DISPLAY DEVICE | Non-Final OA | Magnolia White Corporation |
| 18381185 | ARRAY SUBSTRATES AND DISPLAY PANELS | Final Rejection | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. |
| 18468556 | Reduction of Edge Transistor Leakage on N-Type EDMOS and LDMOS Devices | Final Rejection | Murata Manufacturing Co., Ltd. |
| 18428230 | METHOD FOR FORMING FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18232306 | SEMICONDUCTOR DEVICE INCLUDING BACK SIDE POWER SUPPLY CIRCUIT | Final Rejection | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18150410 | BACK END FLOATING GATE STRUCTURE IN A SEMICONDUCTOR DEVICE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17708348 | SUBSTRATE TRENCH FOR CONTROLLING UNDERFILL FILLET AREA AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18347565 | SEMICONDUCTOR LIGHT RECEIVING DEVICE | Non-Final OA | Dexerials Corporation |
| 18498359 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME | Final Rejection | Semiconductor Manufacturing International (Shanghai) Corporation |
| 18465017 | SUBSTRATE FEATURES IN THERMALLY CONDUCTIVE MATERIALS | Non-Final OA | Akash Systems, Inc. |
| 18259017 | PARTICLE DETECTOR COMPRISING A POROUS REGION MADE OF A SEMICONDUCTOR MATERIAL, AND ASSOCIATED MANUFACTURING METHOD | Final Rejection | INSA CENTRE VAL DE LOIRE |
| 18027795 | LOW-PENETRATING PARTICLES LOW-GAIN AVALANCHE DETECTOR | Final Rejection | OSTERREICHISCHE AKADEMIE DER WISSENSCHAFTEN |
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