Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2818 2872 2892
This examiner grants 88% of resolved cases
NGUYEN, CUONG B operates within Tech Center 2800 and Art Unit 2818, where they have managed 980 resolved cases. This volume of cases indicates the examiner's level of experience in handling patent applications within this technology sector. The examiner maintains an allowance rate of 88.3 percent, which provides a baseline for the probability of securing a patent grant. This percentage suggests the likelihood that an application reaching a final disposition will be allowed. Practitioners can use this figure to gauge the general receptivity of the examiner to patentable subject matter.
The data shows an interview lift of 15.4 percent, indicating how direct communication correlates with the probability of success. The interview lift of 15.4 percent is lower than the 88.3 percent allowance rate, which helps determine the relative impact of verbal engagement. The median days to allowance stands at 852, providing a timeline expectation for the prosecution process from filing to grant. This duration reflects the typical pendency for successful applications. Understanding these metrics allows for a more informed strategy when navigating the examination process with this examiner.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18643087 | SEMICONDUCTOR DEVICE INCLUDING VERTICAL CHANNEL HAVING TUBE SHAPE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18621413 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18416608 | SEMICONDUCTOR PACKAGE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18600773 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Samsung Display Co., LTD. |
| 18520166 | ORGANIC LIGHT EMITTING DIODE DISPLAY DEVICE INCLUDING MEASUREMENT HOLE AND METHOD OF FABRICATING THE SAME | Non-Final OA | LG Display Co., Ltd. |
| 18175360 | LIGHT SENSOR MANUFACTURING METHOD | Final Rejection | COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
| 18531368 | DETECTION DEVICE AND METHOD FOR MANUFACTURING SAME | Non-Final OA | Magnolia White Corporation |
| 17561681 | HIGH BANDWIDTH AND CAPACITY APPROACHES FOR STITCHED DIES | Non-Final OA | Intel Corporation |
| 19228512 | MICROELECTRONIC ASSEMBLIES | Non-Final OA | ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC. |
| 18555754 | SEMICONDUCTOR DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18624453 | TRANSIENT VOLTAGE ABSORPTION ELEMENT | Non-Final OA | Murata Manufacturing Co., Ltd. |
| 18425468 | STACKED TRANSISTOR FRONTSIDE CONTACT FORMATION | Non-Final OA | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18531855 | ANGLED EPITAXY CUT | Non-Final OA | International Business Machines Corporation |
| 18537555 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc. |
| 18535500 | MEMORY DEVICE AND MANUFACTURING METHOD OF THE MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18508570 | IMAGE SENSING DEVICE | Final Rejection | SK hynix Inc. |
| 18438263 | SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18406068 | HYBRID BONDING FOR SEMICONDUCTOR DEVICE ASSEMBLIES | Non-Final OA | Micron Technology, Inc. |
| 18434559 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18431140 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18425264 | THERMAL CONDUCTIVE BARRIER LAYER IN INTERCONNECT STRUCTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18409827 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18780081 | MULTIPLE-MASK MULTIPLE-EXPOSURE LITHOGRAPHY AND MASKS | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17735536 | MULTI-INTERPOSER STRUCTURES AND METHODS OF MAKING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company Limited |
| 18631384 | METHODS FOR BOW COMPENSATION USING TENSILE NITRIDE | Non-Final OA | Applied Materials, Inc. |
| 18412658 | DISPLAY PANEL AND DISPLAY DEVICE | Non-Final OA | Wuhan China Star Optoelectronics Technology Co., Ltd. |
| 18652315 | SEMICONDUCTOR DEVICE | Non-Final OA | Rohm Co., Ltd. |
| 18506359 | SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD OF MANUFACTURING THE SAME | Final Rejection | ROHM CO., LTD. |
| 18345233 | REMOVING CONDUCTIVE MATERIAL FROM A PEDESTAL OF A SEMICONDUCTOR LID OUTSIDE OF AN AREA CONTACTING A DIE | Final Rejection | ADVANCED MICRO DEVICES, INC. |
| 18590048 | MULTI-TIER MEMORY ARRAY INCLUDING LATERALLY-STAGGERED STAIRCASES AND METHOD OF MAKING THE SAME | Non-Final OA | SANDISK TECHNOLOGIES LLC |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy