Prosecution Insights
Last updated: August 18, 2026

Examiner: LIU, BENJAMIN T

Tech Center 2800 • Art Units: 2812 2893

This examiner grants 75% of resolved cases

Performance Statistics

74.9%
Allow Rate
+6.9% vs TC avg
746
Total Applications
+12.2%
Interview Lift
1080
Avg Prosecution Days
Based on 714 resolved cases, 2023–2026

Rejection Statute Breakdown

0.4%
§101 Eligibility
30.8%
§102 Novelty
59.3%
§103 Obviousness
9.3%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18743372 INTEGRATED CIRCUIT DEVICES Non-Final OA Samsung Electronics Co., Ltd.
18604875 SEMICONDUCTOR PACKAGE INCLUDING THERMAL INTERFACIAL MATERIAL PATTERNS Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18557952 DISPLAY PANEL AND DISPLAY DEVICE Non-Final OA WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
18610113 ORGANIC LIGHT-EMITTING DEVICE Non-Final OA Samsung Display Co., LTD.
18418675 DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME Non-Final OA Samsung Display Co., LTD.
18310277 PACKAGE SUBSTRATE HAVING EMBEDDED ELECTRONIC COMPONENT MOUNTED ON CORE OF THE PACKAGE SUBSTRATE Final Rejection QUALCOMM Incorporated
18126833 FOR MEMORY ON PACKAGE WITH REDUCED THICKNESS Non-Final OA Intel Corporation
18091264 STACKED MULTICHIP IC DEVICE PACKAGES INCLUDING A GLASS SUBSTRATE Non-Final OA Intel Corporation
18089865 INTEGRATED CIRCUIT STRUCTURES HAVING TWO-LEVEL MEMORY Non-Final OA Intel Corporation
17823602 THREE-DIMENSIONAL PACKAGE ARCHITECTURE WITH FACE DOWN BRIDGE DIES Final Rejection Intel Corporation
17856185 ALIGNMENT VIA-PAD AND VIA-PLANE STRUCTURES Final Rejection Intel Corporation
17852039 SINX ADHESION PROMOTER WITH ADHESION HOLE FEATURES IN PACKAGING SUBSTRATE FOR RELIABILITY PERFORMANCE ENHANCEMENT Non-Final OA Intel Corporation
18234335 ENHANCED INTERCONNECTION BALL GRID ARRAY DESIGN, SEMICONDUCTOR STRUCTURE, AND FABRICATING METHOD THEREOF Non-Final OA YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18275930 SEMICONDUCTOR PACKAGE Final Rejection LG INNOTEK CO., LTD.
18509052 GAN-BASED, LATERAL-CONDUCTION, ELECTRONIC DEVICE WITH IMPROVED METALLIC LAYERS LAYOUT Final Rejection STMICROELECTRONICS S.R.L.
18512140 SECOND-LEVEL METALLIZATION TESTABLE FULLY INTEGRATED AND MULTI-FUNCTIONAL STATIC RANDOM ACCESS MEMORY AND SCANNABLE LATCHES Non-Final OA International Business Machines Corporation
18519254 LEADFRAME-BASED INTEGRATED TRANSFORMER PACKAGES Non-Final OA Allegro MicroSystems, LLC

Facing This Examiner?

IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.

Build Your Strategy

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month