Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2800 2823 2892 2897
This examiner grants 62% of resolved cases
Sheng-Bai Zhu works in Tech Center 2800 and Art Unit 2800, having handled 719 resolved cases. The examiner's allowance rate is 62.3 percent. This figure indicates that while a majority of applications are granted, there is a significant portion that do not reach allowance, suggesting a thorough examination process for this docket.
The interview lift is 6.0 percent. This value shows a modest increase in the probability of allowance when an interview is conducted, compared to the 62.3 percent baseline. While not as high as in other dockets, the 6.0 percent lift still suggests that verbal communication can be a useful tool for resolving specific examiner concerns during prosecution.
The median days to allowance is 1027. This metric provides an expectation for the total time required to secure a patent grant from this examiner. With 719 resolved cases as the foundation, the 1027-day median pendency and the previously noted allowance rate define the prosecution environment in Art Unit 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18059010 | Semiconductor Memory Device | Non-Final OA | Samsung Electronics Co., Ltd. |
| 17266697 | DISPLAY APPARATUS HAVING FRAME WITH REGIONS TO DISCHARGE HEAT GENERATED BY PRINTED CIRCUIT BOARD | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18529851 | LIGHT EMITTING ELEMENT | Non-Final OA | TOYODA GOSEI CO., LTD. |
| 17915755 | OLED DISPLAY SUBSTRATE, METHOD FOR MANUFACTURING THE SAME, AND DISPLAY DEVICE | Non-Final OA | BOE Technology Group Co., Ltd. |
| 18750963 | LIGHT EMITTING ELEMENT, INK COMPOSITION AND DISPLAY DEVICE INCLUDING THE LIGHT EMITTING ELEMENT | Non-Final OA | Samsung Display Co., LTD. |
| 18750878 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 18590202 | METHOD OF MANUFACTURING DISPLAY APPARATUS | Non-Final OA | Samsung Display Co., Ltd. |
| 18368710 | DISPLAY DEVICE AND METHOD OF FABRICATING THE SAME | Final Rejection | Samsung Display Co., LTD. |
| 17871169 | DISPLAY DEVICE CAPABLE OF PREVENTING DEFECTS ON A SIGNAL LINE AND METHOD OF FABRICATING THE SAME | Non-Final OA | Samsung Display Co., Ltd. |
| 17423453 | DISPLAY DEVICE AND MANUFACTURING METHOD THEREFOR | Non-Final OA | SAMSUNG DISPLAY CO., LTD. |
| 17947303 | ORGANIC LIGHT-EMITTING DISPLAY DEVICE | Non-Final OA | LG DISPLAY CO., LTD. |
| 18693621 | DISPLAY PANEL AND DISPLAY DEVICE | Non-Final OA | WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD. |
| 18680740 | PACKAGE COMPRISING AN INTEGRATED DEVICE, A SUBSTRATE AND A HEAT SINK | Non-Final OA | QUALCOMM Incorporated |
| 17940911 | DECOUPLING CAPACITOR ARCHITECTURE | Non-Final OA | QUALCOMM Incorporated |
| 17561670 | POWER DELIVERY USING BACKSIDE POWER FOR STITCHED DIES | Non-Final OA | Intel Corporation |
| 18751033 | INLET AND OUTLET LOCATIONS AND STANDARDIZATION | Non-Final OA | Adeia Semiconductor Bonding Technologies Inc. |
| 18750916 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18880361 | POWER SEMICONDUCTOR DEVICE INCLUDING HEAT DISSIPATING STRUCTURE AND METHOD OF MANUFACTURING POWER SEMICONDUCTOR DEVICE | Final Rejection | Mitsubishi Electric Corporation |
| 18751130 | SEMICONDUCTOR DEVICE WITH EMBEDDED COOLING | Non-Final OA | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18598668 | FORK SHEET TRANSISTOR WITH VIA-TO-BACKSIDE POWER RAIL STRUCTURE | Final Rejection | International Business Machines Corporation |
| 17940623 | FERROELECTRIC MEMORY DEVICE ERASURE | Non-Final OA | International Business Machines Corporation |
| 18588565 | SEMICONDUCTOR MEMORY DEVICE | Final Rejection | Kioxia Corporation |
| 18611660 | METHODS AND APPARATUSES FOR CONNECTING AN INTEGRATED CIRCUIT AND A HEAT SINK | Non-Final OA | HL MANDO CORPORATION |
| 18346977 | METHOD OF REDUCING VOIDS AND SEAMS IN TRENCH STRUCTURES BY FORMING SEMI-AMORPHOUS POLYSILICON | Final Rejection | Texas Instruments Incorporated |
| 18149099 | DIELECTRIC FILMS OVER ELECTRODE FOR HIGH VOLTAGE PERFORMANCE | Final Rejection | Texas Instruments Incorporated |
| 17223792 | QUALITY FACTOR OF A PARASITIC CAPACITANCE | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18751247 | HETEROJUNCTION STRUCTURE DEVICE, METHOD FOR MANUFACTURING THE SAME, FIELD EFFECT TRANSISTOR USING THE SAME, ARTIFICIAL VISUAL SYSTEM USING THE SAME, SOLAR CELL USING THE SAME, GAS SENSOR USING THE SAME, AND PIEZOELECTRIC DEVICE USING THE SAME | Non-Final OA | Research & Business Foundation Sungkyunkwan University |
| 18629346 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | Non-Final OA | SK hynix Inc. |
| 17896193 | SEMICONDUCTOR DEVICE WITH DUMMY STACK INCLUDING STAIRCASE STRUCTURE AND PROTRUSION | Non-Final OA | SK hynix Inc. |
| 18619425 | MICROELECTRONIC DEVICES AND MEMORY DEVICES INCLUDING VERTICALLY SPACED TRANSISTORS AND STORAGE DEVICES, AND RELATED ELECTRONIC SYSTEMS | Final Rejection | Micron Technology, Inc. |
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