Prosecution Insights
Prosecution Insights
84 pending office actions • 32 art units • 69 examiners • 0 of 84 (0%) have an AI response strategy ready • 110 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 26 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 26 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 1 (1%) |
| §101 + other | 6 (7%) |
| §103 only | 39 (46%) |
| §102 only | 8 (10%) |
| §112 only | 1 (1%) |
| Double-patenting + other | 1 (1%) |
| Multi-statute (no §101) | 27 (32%) |
| No statute on record | 1 (1%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| STOCK JR, GORDON J | 4 | 81.4% | +17.6% |
| HANSEN, JONATHAN M | 3 | 79.4% | +11.3% |
| SCHNASE, PAUL DANIEL | 2 | 72.7% | +27.4% |
| TRAN, JUDY DAO | 2 | 76.6% | +24.0% |
| STOFFA, WYATT A | 2 | 79.5% | +23.1% |
| WHITESELL, STEVEN H | 2 | 81.9% | +12.9% |
| KUNEMUND, ROBERT M | 2 | 82.0% | +13.8% |
| QUIGLEY, KYLE ROBERT | 2 | 53.7% | +33.1% |
| NGUYEN, KIET TUAN | 2 | 88.8% | -0.2% |
| KIM, PETER B | 2 | 82.9% | +9.3% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18588822 | SYSTEM AND METHOD FOR GROWTH OF QUASI-PHASE MATCHED STRONTIUM TETRABORATE AND LITHIUM TRIBORATE CRYSTALS FOR FREQUENCY CONVERSION | KUNEMUND, ROBERT M | 6d |
| 18752650 | GROWTH OF STRONTIUM TETRABORATE CRYSTALS | KUNEMUND, ROBERT M | — |
| 18738393 | SYSTEMS AND METHODS OF SEM INSPECTION USING SELECTIVE SCAN APPROACH | NGUYEN, KIET TUAN | — |
| 18668123 | ABERRATION CORRECTOR FOR SCANNING ELECTRON MICROSCOPE WITH MULTIPLE ELECTRON BEAMS | NGUYEN, KIET TUAN | — |
| 18372531 | SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVERLAY METROLOGY | STOCK JR, GORDON J | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | SCHNASE, PAUL DANIEL | 154d overdue |
| 17944009 | METHOD AND SYSTEM FOR CLEANING OPTICAL ELEMENTS IN EUV OPTICAL SYSTEMS | COCCHI, MICHAEL EDWARD | 91d overdue |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | STOCK JR, GORDON J | 72d overdue |
| 16935432 | Systems and Methods for MOKE Metrology with Consistent MRAM Die Orientation | SCHINDLER, DAVID M | 24d overdue |
| 17834767 | SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR | BENITEZ ROSARIO, JOSHUA | 5d overdue |
| 18642417 | SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS | YAZBACK, MAHER | 3d overdue |
| 18353098 | METROLOGY SAMPLING PLANS FOR ONLY OUT OF SPECIFICATION DETECTION | STEAR, RYAN JAMES | 1d overdue |
| 18642348 | HIGH-PRECISION ALIGNABLE OPTICAL MOUNTING | DUONG, HENRY ABRAHAM | 20d |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | SCHNASE, PAUL DANIEL | 154d overdue |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | STOCK JR, GORDON J | 72d overdue |
| 18588822 | SYSTEM AND METHOD FOR GROWTH OF QUASI-PHASE MATCHED STRONTIUM TETRABORATE AND LITHIUM TRIBORATE CRYSTALS FOR FREQUENCY CONVERSION | KUNEMUND, ROBERT M | 6d |
| 18618280 | SINGLE GRAB PUPIL LANDSCAPE VIA OUTSIDE THE OBJECTIVE LENS BROADBAND ILLUMINATION | WHITESELL, STEVEN H | 29d |
| 19040176 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | SCHNASE, PAUL DANIEL | — |
| 19018943 | SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY | STOCK JR, GORDON J | — |
| 18986066 | MULTI-AZIMUTH ILLUMINATION AND IMAGING INSPECTION SYSTEM AND METHOD | HANSEN, JONATHAN M | — |
| 18977795 | Methods And Systems For Reflectometry Based Measurements Of Deep, Large Pitch Semiconductor Structures | TRAN, JUDY DAO | — |
| Art Unit | Apps |
|---|---|
| 2877 | 21 |
| 2881 | 5 |
| 2857 | 4 |
| 2878 | 2 |
| 2669 | 2 |
| 1759 | 2 |
| 2884 | 2 |
| 2882 | 2 |
| 2116 | 2 |
| 2665 | 2 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19040176 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | SCHNASE, PAUL DANIEL | — | §103 | Non-Final OA | — | Pending | Jan 29, 2025 |
| 19018943 | SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY | STOCK JR, GORDON J | — | §101§112Other | Non-Final OA | — | Pending | Jan 13, 2025 |
| 18990783 | DIFFRACTIVE EUV SPECTRAL PURITY FILTERS FOR OPTICAL SYSTEMS | AHMED, JAMIL | 2877 | §103 | Non-Final OA | — | Pending | Dec 20, 2024 |
| 18986066 | MULTI-AZIMUTH ILLUMINATION AND IMAGING INSPECTION SYSTEM AND METHOD | HANSEN, JONATHAN M | — | §102§103 | Non-Final OA | — | Pending | Dec 18, 2024 |
| 18977795 | Methods And Systems For Reflectometry Based Measurements Of Deep, Large Pitch Semiconductor Structures | TRAN, JUDY DAO | 2877 | §103§112 | Non-Final OA | — | Pending | Dec 11, 2024 |
| 18972428 | Measurements Of Complex Semiconductor Structures Based On Component Measurement Signals | HANSEN, JONATHAN M | 2877 | §102 | Non-Final OA | — | Pending | Dec 06, 2024 |
| 18970542 | REDUCED FLUCTUATIONS AND INCREASED BRIGHTNESS UNIFORMITY OF LASER SUSTAINED PLASMA SOURCES | LUU, THANH X | 2878 | §103 | Non-Final OA | — | Pending | Dec 05, 2024 |
| 18959278 | ENCODING DESIGN INFORMATION FOR A SPECIMEN FOR RUNTIME USE IN INSPECTION AND OTHER PROCESSES | ISLAM, PROMOTTO TAJRIAN | 2669 | §102 | Non-Final OA | — | Pending | Nov 25, 2024 |
| 18941459 | POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS | TRAN, JUDY DAO | 2877 | §102§103§112 | Non-Final OA | — | Pending | Nov 08, 2024 |
| 18930438 | FIELD CURVATURE CORRECTOR FOR USE IN MULTI-ELECTRON-BEAM OPTICAL SYSTEM | STOFFA, WYATT A | 2881 | §103 | Non-Final OA | — | Pending | Oct 29, 2024 |
| 18925931 | THREE-AXIS TUNED MASS DAMPER FOR TURBO MOLECULAR PUMP | HAGHIGHIAN, BEHNOUSH | 3745 | §103 | Non-Final OA | — | Pending | Oct 24, 2024 |
| 18907563 | SEGMENTATION-BASED CARE AREA SETUP FOR INSPECTION OF A SPECIMEN USING EDGE DETECTION | SILVA-AVINA, EMMANUEL | — | §103§112 | Non-Final OA | — | Pending | Oct 06, 2024 |
| 18902197 | IMAGING OVERLAY TARGETS USING MOIRÉ ELEMENTS AND ROTATIONAL SYMMETRY ARRANGEMENTS | WHITESELL, STEVEN H | 1759 | §101§103§112 | Non-Final OA | — | Pending | Sep 30, 2024 |
| 18827828 | CONCENTRICITY OFFSET MEASUREMENT FOR HYBRID BONDING | LEE, BENEDICT E | — | §103 | Non-Final OA | — | Pending | Sep 08, 2024 |
| 18812890 | Angle Of Incidence And Azimuth Angle Resolved Spectroscopic Ellipsometry For Semiconductor Metrology | AYUB, HINA F | 2877 | §102§103 | Non-Final OA | — | Pending | Aug 22, 2024 |
| 18793162 | HEAT EXCHANGER FOR UVO CLEANING SYSTEM | WEILAND, HANS R. | 3763 | §102§103 | Final Rejection | — | Pending | Aug 02, 2024 |
| 18787272 | METHOD OF FABRICATION AND IMPLEMENTATION OF PROCESS CONDITION MEASUREMENT DEVICE | KASENGE, CHARLES R | — | §102§103 | Non-Final OA | — | Pending | Jul 29, 2024 |
| 18756439 | METROLOGY METHOD OF CALIBRATING AND MONITORING RADIATION IN EUV LITHOGRAPHIC SYSTEMS | MALEVIC, DJURA | 2884 | §103 | Non-Final OA | — | Pending | Jun 27, 2024 |
| 18756416 | ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMICONDUCTOR INSPECTION | BUTLER, KEVIN C | — | §102 | Non-Final OA | — | Pending | Jun 27, 2024 |
| 18752650 | GROWTH OF STRONTIUM TETRABORATE CRYSTALS | KUNEMUND, ROBERT M | — | §103 | Non-Final OA | — | Pending | Jun 24, 2024 |
| 18743048 | Measurements Of Semiconductor Structures Based On Data Collected At Prior Process Steps | QUIGLEY, KYLE ROBERT | — | §103 | Non-Final OA | — | Pending | Jun 13, 2024 |
| 18738393 | SYSTEMS AND METHODS OF SEM INSPECTION USING SELECTIVE SCAN APPROACH | NGUYEN, KIET TUAN | — | §102 | Non-Final OA | — | Pending | Jun 10, 2024 |
| 18736137 | MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM | BOLOGNA, DOMINIC JOSEPH | 2877 | §103§112 | Non-Final OA | — | Pending | Jun 06, 2024 |
| 18735144 | COMBINING DEEP LEARNING MODEL HIDDEN LAYER OUTPUT WITH SPECIMEN-SPECIFIC INPUT FOR DEFECT CLASSIFICATION OR ANOTHER SEMICONDUCTOR APPLICATION | BOYAR, NOAH WILLIAM | 2669 | §103 | Final Rejection | — | Pending | Jun 05, 2024 |
| 18732473 | DEFECT SYNTHESIS AND DETECTION VIA DEFECT GENERATIVE PRE-TRAINED TRANSFORMER FOR SEMICONDUCTOR APPLICATIONS | COLEMAN, STEPHEN P | 2675 | §103 | Non-Final OA | — | Pending | Jun 03, 2024 |
| 18677487 | DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER | HANEY, NOAH JAMES | 2877 | §103§112 | Non-Final OA | — | Pending | May 29, 2024 |
| 18671172 | Back-Illuminated Sensor With Boron Layer Deposited Using Plasma Atomic Layer Deposition | AMER, MOUNIR S | — | §102Other | Non-Final OA | — | Pending | May 22, 2024 |
| 18668112 | ELECTRON BEAM METROLOGY HAVING A SOURCE ENERGY SPREAD WITH FILTERED TAILS | SMITH, DAVID E | — | §103 | Non-Final OA | — | Pending | May 17, 2024 |
| 18668123 | ABERRATION CORRECTOR FOR SCANNING ELECTRON MICROSCOPE WITH MULTIPLE ELECTRON BEAMS | NGUYEN, KIET TUAN | — | §102 | Non-Final OA | — | Pending | May 17, 2024 |
| 18652438 | DYNAMIC FREEFORM OPTICS FOR LITHOGRAPHY ILLUMINATION BEAM SHAPING | KIM, PETER B | 2882 | §103§112 | Final Rejection | — | Pending | May 01, 2024 |
| 18646553 | Spectroscopic Ellipsometry With Detector Resolved Numerical Aperture For Deep Structure Metrology | FABIAN JR, ROBERTO | 2877 | §103 | Final Rejection | 68d | Pending | Apr 25, 2024 |
| 18642417 | SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS | YAZBACK, MAHER | 2877 | §102§103 | Non-Final OA | 3d overdue | Pending | Apr 22, 2024 |
| 18642348 | HIGH-PRECISION ALIGNABLE OPTICAL MOUNTING | DUONG, HENRY ABRAHAM | 2872 | §102§103 | Non-Final OA | 20d | Pending | Apr 22, 2024 |
| 18641360 | ELECTRON BEAM POSITION DETECTION AND REPOSITIONING | OSENBAUGH-STEWART, ELIZA W | 2881 | §102§103 | Non-Final OA | — | Pending | Apr 20, 2024 |
| 18633983 | Laser-Beam Homogenization or Shaping | CHIEN, LUCY P | 2871 | §103 | Non-Final OA | — | Pending | Apr 12, 2024 |
| 18624444 | PARALLEL SCANNING OVERLAY METROLOGY WITH OPTICAL META-SURFACES | PEREZ-GUZMAN, CARLOS GABRIEL | 2877 | §103 | Non-Final OA | 22d | Pending | Apr 02, 2024 |
| 18618159 | SYSTEMS AND METHODS FOR ALIGNMENT AND PLACEMENT OF ELECTRONIC DEVICES ON CARRIER TAPE | PATEL, JIGNESHKUMAR C | 2116 | §103 | Non-Final OA | — | Pending | Mar 27, 2024 |
| 18618280 | SINGLE GRAB PUPIL LANDSCAPE VIA OUTSIDE THE OBJECTIVE LENS BROADBAND ILLUMINATION | WHITESELL, STEVEN H | 1759 | §102§103 | Final Rejection | 29d | Pending | Mar 27, 2024 |
| 18613874 | SPECTRA DELTA METROLOGY | DAVIS, CYNTHIA L | — | §101§103 | Non-Final OA | — | Pending | Mar 22, 2024 |
| 18612383 | SYSTEM AND METHOD FOR DEVICE-LIKE OVERLAY TARGETS MEASUREMENT | STOCK JR, GORDON J | 2877 | §103§112 | Non-Final OA | — | Pending | Mar 21, 2024 |
| 18603002 | DEEP LEARNING MODEL DIAGNOSTICS TOOLS USING STACKED IMAGES | DHOOGE, DEVIN J | 2677 | §103 | Final Rejection | — | Pending | Mar 12, 2024 |
| 18594707 | SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BASED METROLOGY | HANSEN, JONATHAN M | 2877 | §103 | Final Rejection | — | Pending | Mar 04, 2024 |
| 18590930 | USE OF MULTIPLE ELECTRON BEAMS FOR HIGH THROUGHPUT INSPECTION | STOFFA, WYATT A | 2881 | §102 | Non-Final OA | — | Pending | Feb 28, 2024 |
| 18590876 | INTERFEROMETRIC PHASE ERROR CORRECTION USING A NEURAL NETWORK | DULANEY, KATHLEEN YUAN | 2666 | §103 | Non-Final OA | — | Pending | Feb 28, 2024 |
| 18588822 | SYSTEM AND METHOD FOR GROWTH OF QUASI-PHASE MATCHED STRONTIUM TETRABORATE AND LITHIUM TRIBORATE CRYSTALS FOR FREQUENCY CONVERSION | KUNEMUND, ROBERT M | 1714 | §103 | Non-Final OA | 6d | Pending | Feb 27, 2024 |
| 18587311 | LIGHT WEIGHT HIGH STIFFNESS CHUCK WITH INTERCHANGEABLE TOP | ADDISU, SARA | 3722 | §102§103§112 | Non-Final OA | — | Pending | Feb 26, 2024 |
| 18437429 | METROLOGY SYSTEM WITH TWIN PLANAR MOTOR STAGE | TIGHE, BRENDAN P | 3652 | §103 | Non-Final OA | — | Pending | Feb 09, 2024 |
| 18438165 | VUV LASER-SUSTAINED PLASMA LIGHT SOURCE WITH LONG-PASS FILTERING | EINHORN, MICA JILLIAN | 2881 | §102§103§112DP | Non-Final OA | — | Pending | Feb 09, 2024 |
| 18434747 | OBLIQUE UNIFORM ILLUMINATION FOR IMAGING SYSTEMS | BRYANT, REBECCA CAROLE | 2877 | §103§112 | Non-Final OA | — | Pending | Feb 06, 2024 |
| 18434139 | SUBSTRATE POSITION MONITORING DEVICES | CZEKAJ, DAVID J | 2487 | §102§103 | Non-Final OA | — | Pending | Feb 06, 2024 |
| 18421580 | OVERLAY MARK DESIGN ENABLING LARGE OVERLAY MEASUREMENT | SOHRABY, PARDIS | 2664 | §103 | Non-Final OA | 27d | Pending | Jan 24, 2024 |
| 18416113 | X-Ray Scatterometry Based Measurements Of Memory Array Structures Stacked With Complex Logic Structures | LU, ZHIYU | 2665 | §103 | Non-Final OA | — | Pending | Jan 18, 2024 |
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | SCHNASE, PAUL DANIEL | 2877 | §101§102§103 | Final Rejection | 154d overdue | Pending | Dec 31, 2023 |
| 18529854 | SYSTEM AND METHOD FOR DURATION-BASED SAMPLE PATH ADJUSTMENT | NIMOX, RAYMOND LONDALE | 2857 | §101§102 | Non-Final OA | 22d | Pending | Dec 05, 2023 |
| 18388405 | STAGE MOTION PROFILE SYSTEM AND METHOD | KIM, PETER B | 2882 | §103§112 | Non-Final OA | — | Pending | Nov 09, 2023 |
| 18383612 | MASSIVE MEASUREMENT SAMPLING USING MULTIPLE CHUCKS AND OPTICAL COLUMNS | SULLIVAN, CALEEN O | — | §103 | Non-Final OA | — | Pending | Oct 25, 2023 |
| 18375512 | IMAGING THOUSANDS OF ELECTRON BEAMS DURING WORKPIECE INSPECTION | KALISZEWSKI, ALINA ROSE | 2881 | §103 | Final Rejection | 70d overdue | Pending | Sep 30, 2023 |
| 18374106 | INSPECTION OF ADAPTIVE PATTERNED WORKPIECES WITH DYNAMIC DESIGN AND DEEP LEARNING-BASED RENDERING | MORSE, GREGORY ALLAN | 2663 | §103 | Final Rejection | — | Pending | Sep 28, 2023 |
| 18372531 | SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVERLAY METROLOGY | STOCK JR, GORDON J | 2877 | §103 | Non-Final OA | — | Pending | Sep 25, 2023 |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | STOCK JR, GORDON J | 2877 | §102§103 | Non-Final OA | 72d overdue | Pending | Sep 14, 2023 |
| 18368242 | FRICTIONLESS DESIGN OF HIGH-PRESSURE RECIRCULATION THERMO-PUMP | BRANDT, DAVID NELSON | 3783 | §112 | Non-Final OA | — | Pending | Sep 14, 2023 |
| 18234773 | MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY | XING, CHRISTINA ILONA | 2877 | §103 | Final Rejection | 10d overdue | Pending | Aug 16, 2023 |
| 18232337 | COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY TO MEASURE A FILM STACK | KIDWELL, KAITLYN ELIZABETH | 2877 | §103§112 | Final Rejection | — | Pending | Aug 09, 2023 |
| 18229606 | Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model | GAVIA, NYLA EMANI ANN | 2857 | §101 | Non-Final OA | 35d | Pending | Aug 02, 2023 |
| 18228643 | PUPIL FILTER WITH SPATIALLY-VARYING TRANSMISSION | ARTMAN, THOMAS R | 2884 | §102§103 | Final Rejection | 34d | Pending | Jul 31, 2023 |
| 18353098 | METROLOGY SAMPLING PLANS FOR ONLY OUT OF SPECIFICATION DETECTION | STEAR, RYAN JAMES | 2857 | §103§112 | Final Rejection | 1d overdue | Pending | Jul 16, 2023 |
| 18217262 | Metrology in the Presence of CMOS Under Array (CUA) Structures Utilizing Model-Less Machine Learning | DINH, PAUL | 2851 | Other | Non-Final OA | — | Pending | Jun 30, 2023 |
| 18343390 | EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test Photomasks | FABIAN JR, ROBERTO | 2877 | §102§103 | Final Rejection | 57d | Pending | Jun 28, 2023 |
| 18207553 | SYSTEM AND METHOD FOR ALIGNING A WAFER TO A CHUCK | NGUYEN, VINH P | 2858 | §102 | Non-Final OA | — | Pending | Jun 08, 2023 |
| 18195115 | SYSTEM AND METHOD FOR IMPROVING MEASUREMENT PERFORMANCE OF CHARACTERIZATION SYSTEMS | TSAI, JAMES T | 2147 | §103 | Non-Final OA | — | Pending | May 09, 2023 |
| 18136772 | Combined Spectroscopic Reflectometry And Pattern Recognition Based Measurements Of Semiconductor Structures | UNDERWOOD, JARREAS C | 2877 | §103 | Non-Final OA | 34d | Pending | Apr 19, 2023 |
| 18178528 | DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS | LU, ZHIYU | 2665 | §103 | Non-Final OA | 20d | Pending | Mar 05, 2023 |
| 18116187 | INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION | GARBER, ERIN R | 2878 | §103 | Final Rejection | 140d overdue | Pending | Mar 01, 2023 |
| 17982472 | PLASMA HYPERMODEL INTEGRATED WITH FEATURE-SCALE PROFILE MODEL FOR ACCELERATED ETCH PROCESS DEVELOPMENT | KIM, EUNHEE | 2188 | §103 | Final Rejection | 37d overdue | Pending | Nov 07, 2022 |
| 17978844 | Methods And Systems For Monitoring Metrology Fleet Productivity | ERDMAN, CHAD G | 2116 | §103§112 | Non-Final OA | — | Pending | Nov 01, 2022 |
| 17944009 | METHOD AND SYSTEM FOR CLEANING OPTICAL ELEMENTS IN EUV OPTICAL SYSTEMS | COCCHI, MICHAEL EDWARD | 2188 | §101§103 | Final Rejection | 91d overdue | Pending | Sep 13, 2022 |
| 17834767 | SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR | BENITEZ ROSARIO, JOSHUA | 2815 | §102§103 | Non-Final OA | 5d overdue | Pending | Jun 07, 2022 |
| 17713017 | METHOD AND SYSTEM FOR MIXED MODE WAFER INSPECTION | BALI, VIKKRAM | 2663 | §103 | Non-Final OA | 19d | Pending | Apr 04, 2022 |
| 17696636 | SYSTEM AND METHOD FOR ION-ASSISTED DEPOSITION OF OPTICAL COATINGS | OTT, PATRICK S | 1794 | §103 | Final Rejection | 44d overdue | Pending | Mar 16, 2022 |
| 17590116 | Methods And Systems For Accurate Measurement Of Deep Structures Having Distorted Geometry | JEFFERSON, QUOVAUNDA | 2899 | §103 | Final Rejection | — | Pending | Feb 01, 2022 |
| 17576528 | STRONTIUM TETRABORATE AS OPTICAL GLASS MATERIAL | CHOWDHURY, TARIFUR RASHID | 2877 | §103 | Final Rejection | — | Pending | Jan 14, 2022 |
| 17446161 | SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS | QUIGLEY, KYLE ROBERT | 2857 | §103 | Final Rejection | — | Pending | Aug 26, 2021 |
| 16935432 | Systems and Methods for MOKE Metrology with Consistent MRAM Die Orientation | SCHINDLER, DAVID M | 2858 | §102§103§112 | Non-Final OA | 24d overdue | Pending | Jul 22, 2020 |
| 17554454 | Machine Learning in Metrology Measurements | STANDKE, ADAM C | 2129 | §103 | Final Rejection | 141d overdue | Pending | Dec 17, 2021 |
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