Prosecution Insights
Prosecution Insights
58 pending office actions • 26 art units • 51 examiners • 0 of 58 (0%) have an AI response strategy ready • 97 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 58 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 58 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 1 (2%) |
| §103 only | 49 (84%) |
| §102 only | 8 (14%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| FABIAN JR, ROBERTO | 3 | 71.5% | +26.2% |
| WHITESELL, STEVEN H | 3 | 81.8% | +13.3% |
| UNDERWOOD, JARREAS C | 2 | 78.9% | +22.9% |
| YAZBACK, MAHER | 2 | 74.5% | +24.3% |
| SCHNASE, PAUL DANIEL | 2 | 81.3% | +33.3% |
| DINH, LYNDA | 1 | 74.0% | +28.8% |
| LE, MINH Q | 1 | 80.3% | +16.4% |
| KIM, PETER B | 1 | 82.8% | +9.1% |
| DUONG, HENRY ABRAHAM | 1 | 79.0% | +6.7% |
| PEREZ-GUZMAN, CARLOS GABRIEL | 1 | 81.3% | +24.7% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18812757 | METHOD TO PERFORM IN-SITU VACUUM CONTAMINATION MEASUREMENT AND IDENTIFICATION IN ARBITRARILY LARGE CHAMBERS | LE, MINH Q | 154d overdue |
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | SCHNASE, PAUL DANIEL | 154d overdue |
| 17762030 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | SCHNASE, PAUL DANIEL | 97d overdue |
| 17948151 | HIGH-RESOLUTION EVALUATION OF OPTICAL METROLOGY TARGETS FOR PROCESS CONTROL | WHITESELL, STEVEN H | 50d overdue |
| 18743118 | Multiple Pass Optical Measurements Of Semiconductor Structures | KIM, PETER B | 8d overdue |
| 18421454 | OVERLAY METROLOGY TARGET FOR DIE-TO-WAFER OVERLAY METROLOGY | WHITESELL, STEVEN H | 13d |
| 18624444 | PARALLEL SCANNING OVERLAY METROLOGY WITH OPTICAL META-SURFACES | PEREZ-GUZMAN, CARLOS GABRIEL | 22d |
| 18618280 | SINGLE GRAB PUPIL LANDSCAPE VIA OUTSIDE THE OBJECTIVE LENS BROADBAND ILLUMINATION | WHITESELL, STEVEN H | 29d |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18229606 | Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model | GAVIA, NYLA EMANI ANN | 35d |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18812757 | METHOD TO PERFORM IN-SITU VACUUM CONTAMINATION MEASUREMENT AND IDENTIFICATION IN ARBITRARILY LARGE CHAMBERS | LE, MINH Q | 154d overdue |
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | SCHNASE, PAUL DANIEL | 154d overdue |
| 17762030 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | SCHNASE, PAUL DANIEL | 97d overdue |
| 18968732 | METROLOGY USING REFERENCE-BASED SYNTHETIC SPECTRA | DINH, LYNDA | 66d overdue |
| 18755644 | WAVEPLATE COMPENSATOR DESIGN | UNDERWOOD, JARREAS C | 60d overdue |
| 17948151 | HIGH-RESOLUTION EVALUATION OF OPTICAL METROLOGY TARGETS FOR PROCESS CONTROL | WHITESELL, STEVEN H | 50d overdue |
| 17956643 | Spectroscopic Reflectometry And Ellipsometry Measurements With Electroreflectance Modulation | YAZBACK, MAHER | 42d overdue |
| 18642417 | SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS | YAZBACK, MAHER | 3d overdue |
| Art Unit | Apps |
|---|---|
| 2877 | 17 |
| 2857 | 6 |
| 2881 | 5 |
| 1759 | 3 |
| 2872 | 2 |
| 2884 | 2 |
| 2663 | 2 |
| 2188 | 2 |
| 2858 | 2 |
| 3753 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18968732 | METROLOGY USING REFERENCE-BASED SYNTHETIC SPECTRA | DINH, LYNDA | 2857 | §103 | Final Rejection | 66d overdue | Pending | Dec 04, 2024 |
| 18812757 | METHOD TO PERFORM IN-SITU VACUUM CONTAMINATION MEASUREMENT AND IDENTIFICATION IN ARBITRARILY LARGE CHAMBERS | LE, MINH Q | 3753 | §103 | Non-Final OA | 154d overdue | Pending | Aug 22, 2024 |
| 18755644 | WAVEPLATE COMPENSATOR DESIGN | UNDERWOOD, JARREAS C | 2877 | §103 | Non-Final OA | 60d overdue | Pending | Jun 26, 2024 |
| 18743118 | Multiple Pass Optical Measurements Of Semiconductor Structures | KIM, PETER B | 2882 | §103 | Non-Final OA | 8d overdue | Pending | Jun 14, 2024 |
| 18646553 | Spectroscopic Ellipsometry With Detector Resolved Numerical Aperture For Deep Structure Metrology | FABIAN JR, ROBERTO | 2877 | §103 | Final Rejection | 68d | Pending | Apr 25, 2024 |
| 18642348 | HIGH-PRECISION ALIGNABLE OPTICAL MOUNTING | DUONG, HENRY ABRAHAM | 2872 | §102 | Non-Final OA | 20d | Pending | Apr 22, 2024 |
| 18642417 | SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS | YAZBACK, MAHER | 2877 | §103 | Non-Final OA | 3d overdue | Pending | Apr 22, 2024 |
| 18624444 | PARALLEL SCANNING OVERLAY METROLOGY WITH OPTICAL META-SURFACES | PEREZ-GUZMAN, CARLOS GABRIEL | 2877 | §103 | Non-Final OA | 22d | Pending | Apr 02, 2024 |
| 18618280 | SINGLE GRAB PUPIL LANDSCAPE VIA OUTSIDE THE OBJECTIVE LENS BROADBAND ILLUMINATION | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 29d | Pending | Mar 27, 2024 |
| 18611299 | FLUORESCENCE MODE FOR WORKPIECE INSPECTION | COOK, JONATHON | 2877 | §103 | Non-Final OA | 44d overdue | Pending | Mar 20, 2024 |
| 18594991 | METHOD AND SYSTEM FOR BONDING HIGH FLUENCE OPTICS TO OPTOMECHANICAL ASSEMBLIES | STONER, KILEY SHAWN | 1735 | §103 | Non-Final OA | 16d overdue | Pending | Mar 04, 2024 |
| 18590913 | FLATNESS PRECISION IMPROVEMENT WITH SYSTEMATIC ERROR REDUCTION VIA INDUCED WAFER TILT VARIATION | LYONS, MICHAEL A | 2877 | §103 | Non-Final OA | 96d overdue | Pending | Feb 28, 2024 |
| 18588822 | SYSTEM AND METHOD FOR GROWTH OF QUASI-PHASE MATCHED STRONTIUM TETRABORATE AND LITHIUM TRIBORATE CRYSTALS FOR FREQUENCY CONVERSION | KUNEMUND, ROBERT M | 1714 | §103 | Non-Final OA | 6d | Pending | Feb 27, 2024 |
| 18587703 | SIDE-BY-SIDE OFF-CENTER DIE OVERLAY TARGET | LAPAGE, MICHAEL P | 2877 | §103 | Non-Final OA | 58d overdue | Pending | Feb 26, 2024 |
| 18424069 | SYSTEM AND METHOD FOR DYNAMIC ABERRATION CORRECTION | KIM, ROBERT H | 2881 | §102 | Non-Final OA | 17d overdue | Pending | Jan 26, 2024 |
| 18421454 | OVERLAY METROLOGY TARGET FOR DIE-TO-WAFER OVERLAY METROLOGY | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 13d | Pending | Jan 24, 2024 |
| 18421580 | OVERLAY MARK DESIGN ENABLING LARGE OVERLAY MEASUREMENT | SOHRABY, PARDIS | 2664 | §103 | Non-Final OA | 27d | Pending | Jan 24, 2024 |
| 18408395 | OPTICAL BEAM SENSOR WITH CENTER TRANSMISSIVE CUT-OUT | FAYE, MAMADOU | 2884 | §103 | Non-Final OA | 29d | Pending | Jan 09, 2024 |
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | SCHNASE, PAUL DANIEL | 2877 | §103 | Final Rejection | 154d overdue | Pending | Dec 31, 2023 |
| 18542072 | Optics for In-Situ Scanning Electron Microscope Repair | MCCORMACK, JASON L | 2881 | §103 | Non-Final OA | 34d | Pending | Dec 15, 2023 |
| 18535159 | SYSTEM AND METHOD OF FINDING PIXEL-TO-DESIGN TARGET FOR DRAM INSPECTION | CONNER, SEAN M | 2663 | §103 | Non-Final OA | 49d overdue | Pending | Dec 11, 2023 |
| 18529854 | SYSTEM AND METHOD FOR DURATION-BASED SAMPLE PATH ADJUSTMENT | NIMOX, RAYMOND LONDALE | 2857 | §102 | Non-Final OA | 22d | Pending | Dec 05, 2023 |
| 18387015 | Methods And Systems For Measurement Of Semiconductor Structures With Active Tilt Correction | FABIAN JR, ROBERTO | 2877 | §102 | Non-Final OA | 1d overdue | Pending | Nov 04, 2023 |
| 18375920 | Magnetically Opposed, Iron Core Linear Motor Based Motion Stages For Semiconductor Wafer Positioning | DESAI, NAISHADH N | 2834 | §103 | Non-Final OA | 21d | Pending | Oct 02, 2023 |
| 18375512 | IMAGING THOUSANDS OF ELECTRON BEAMS DURING WORKPIECE INSPECTION | KALISZEWSKI, ALINA ROSE | 2881 | §103 | Non-Final OA | 70d overdue | Pending | Sep 30, 2023 |
| 18369609 | SYSTEMS AND METHODS FOR GENERATING A FLAT-TOP ILLUMINATION BEAM BASED ON INTERLACING, INCOHERENTLY OVERLAPPING SPOTS | CHANG, AUDREY Y | 2872 | §103 | Non-Final OA | 56d overdue | Pending | Sep 18, 2023 |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | STOCK JR, GORDON J | 2877 | §103 | Final Rejection | 72d overdue | Pending | Sep 14, 2023 |
| 18234773 | MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY | XING, CHRISTINA ILONA | 2877 | §103 | Final Rejection | 10d overdue | Pending | Aug 16, 2023 |
| 18229606 | Methods And Systems For Systematic Error Compensation Across A Fleet Of Metrology Systems Based On A Trained Error Evaluation Model | GAVIA, NYLA EMANI ANN | 2857 | §101 | Non-Final OA | 35d | Pending | Aug 02, 2023 |
| 18228643 | PUPIL FILTER WITH SPATIALLY-VARYING TRANSMISSION | ARTMAN, THOMAS R | 2884 | §103 | Final Rejection | 34d | Pending | Jul 31, 2023 |
| 18353098 | METROLOGY SAMPLING PLANS FOR ONLY OUT OF SPECIFICATION DETECTION | STEAR, RYAN JAMES | 2857 | §103 | Non-Final OA | 1d overdue | Pending | Jul 16, 2023 |
| 18343390 | EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test Photomasks | FABIAN JR, ROBERTO | 2877 | §103 | Final Rejection | 57d | Pending | Jun 28, 2023 |
| 18138709 | HEIGHT SENSING SYSTEM FOR ELECTRON BEAM METROLOGY TOOL | TSAI, HSIEN C | 2881 | §103 | Non-Final OA | 58d overdue | Pending | Apr 24, 2023 |
| 18136747 | Full Wafer Measurement Based On A Trained Full Wafer Measurement Model | HENSON, MISCHITA L | 2857 | §102 | Non-Final OA | 35d overdue | Pending | Apr 19, 2023 |
| 18136772 | Combined Spectroscopic Reflectometry And Pattern Recognition Based Measurements Of Semiconductor Structures | UNDERWOOD, JARREAS C | 2877 | §103 | Non-Final OA | 34d | Pending | Apr 19, 2023 |
| 18131163 | MOSAIC OVERLAY TARGETS | TON, TRI T | 2877 | §102 | Non-Final OA | 107d overdue | Pending | Apr 05, 2023 |
| 18128125 | MULTI-MODE OPTICAL INSPECTION | DULANEY, KATHLEEN YUAN | 2666 | §103 | Non-Final OA | 10d overdue | Pending | Mar 29, 2023 |
| 18178528 | DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS | LU, ZHIYU | 2665 | §103 | Non-Final OA | 20d | Pending | Mar 05, 2023 |
| 18116187 | INTERFACE-BASED THIN FILM METROLOGY USING SECOND HARMONIC GENERATION | GARBER, ERIN R | 2878 | §103 | Non-Final OA | 140d overdue | Pending | Mar 01, 2023 |
| 17993565 | Methods And Systems For Data Driven Parameterization And Measurement Of Semiconductor Structures | DINH, PAUL | 2851 | §102 | Non-Final OA | 58d overdue | Pending | Nov 23, 2022 |
| 17982472 | PLASMA HYPERMODEL INTEGRATED WITH FEATURE-SCALE PROFILE MODEL FOR ACCELERATED ETCH PROCESS DEVELOPMENT | KIM, EUNHEE | 2188 | §102 | Non-Final OA | 37d overdue | Pending | Nov 07, 2022 |
| 18049863 | METHOD AND APPARATUS FOR DYNAMIC SEALING BETWEEN ZONES OF ULTRA-CLEAN VACUUM SYSTEM | JOERGER, KAITLIN S | 3652 | §103 | Final Rejection | 46d overdue | Pending | Oct 26, 2022 |
| 17956643 | Spectroscopic Reflectometry And Ellipsometry Measurements With Electroreflectance Modulation | YAZBACK, MAHER | 2877 | §103 | Non-Final OA | 42d overdue | Pending | Sep 29, 2022 |
| 17948151 | HIGH-RESOLUTION EVALUATION OF OPTICAL METROLOGY TARGETS FOR PROCESS CONTROL | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 50d overdue | Pending | Sep 19, 2022 |
| 17944009 | METHOD AND SYSTEM FOR CLEANING OPTICAL ELEMENTS IN EUV OPTICAL SYSTEMS | COCCHI, MICHAEL EDWARD | 2188 | §103 | Non-Final OA | 91d overdue | Pending | Sep 13, 2022 |
| 17887078 | SYSTEM AND METHOD FOR FEATURE SIGNAL ENHANCEMENT USING A SELECTIVELY BONDED PHOTOLUMINESCENT MATERIAL | PHILLIPS, RUFUS L | 2877 | §103 | Non-Final OA | 4d overdue | Pending | Aug 12, 2022 |
| 17850888 | Method and System for Providing a Quality Metric for Improved Process Control | KAY, DOUGLAS | 2857 | §103 | Non-Final OA | 28d | Pending | Jun 27, 2022 |
| 17834767 | SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR | SWANSON, WALTER H | 2815 | §103 | Non-Final OA | 5d overdue | Pending | Jun 07, 2022 |
| 17713017 | METHOD AND SYSTEM FOR MIXED MODE WAFER INSPECTION | BALI, VIKKRAM | 2663 | §103 | Non-Final OA | 19d | Pending | Apr 04, 2022 |
| 17762030 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | SCHNASE, PAUL DANIEL | 2877 | §103 | Non-Final OA | 97d overdue | Pending | Mar 18, 2022 |
| 17696636 | SYSTEM AND METHOD FOR ION-ASSISTED DEPOSITION OF OPTICAL COATINGS | OTT, PATRICK S | 1794 | §103 | Non-Final OA | 44d overdue | Pending | Mar 16, 2022 |
| 17591569 | COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE IMAGING | TANDY, LAURA ELOISE | 2881 | §103 | Non-Final OA | 85d overdue | Pending | Feb 02, 2022 |
| 17466703 | WAFER ALIGNMENT IMPROVEMENT THROUGH IMAGE PROJECTION-BASED PATCH-TO-DESIGN ALIGNMENT | DHOOGE, DEVIN J | 2677 | §103 | Non-Final OA | 107d overdue | Pending | Sep 03, 2021 |
| 17408106 | Coolant Microleak Sensor for a Vacuum System | VILLALUNA, ERIKA J | 2852 | §103 | Final Rejection | 3d overdue | Pending | Aug 20, 2021 |
| 17321263 | SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES | SULTANA, DILARA | 2858 | §103 | Non-Final OA | 23d | Pending | May 14, 2021 |
| 17228543 | Plasma Cell for Providing VUV Filtering in a Laser-Sustained Plasma Light Source | HORIKOSHI, STEVEN Y | 2875 | §103 | Non-Final OA | 20d | Pending | Apr 12, 2021 |
| 16935432 | Systems and Methods for MOKE Metrology with Consistent MRAM Die Orientation | SCHINDLER, DAVID M | 2858 | §103 | Final Rejection | 24d overdue | Pending | Jul 22, 2020 |
| 16864972 | Wave-Front Aberration Metrology of Extreme Ultraviolet Mask Inspection Systems | ANGEBRANNDT, MARTIN J | 1737 | §103 | Final Rejection | 46d overdue | Pending | May 01, 2020 |
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